
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 10492902
[patent_doc_number] => 20150377923
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-12-31
[patent_title] => 'TEST SOCKET WITH HIGH DENSITY CONDUCTION SECTION'
[patent_app_type] => utility
[patent_app_number] => 14/766002
[patent_app_country] => US
[patent_app_date] => 2014-02-18
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Array
(
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[patent_doc_number] => 20140159767
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-06-12
[patent_title] => 'PROCESS SENSOR'
[patent_app_type] => utility
[patent_app_number] => 14/179632
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/179632 | System and method for characterizing a process by which a semiconductor device is formed | Feb 12, 2014 | Issued |
Array
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[patent_issue_date] => 2014-07-10
[patent_title] => 'REDOX METHOD OF FORMING A COAXIAL PROBE STRUCTURE OF ELONGATED ELECTRICAL CONDUCTORS PROJECTING FROM A SUPPORT STRUCTURE'
[patent_app_type] => utility
[patent_app_number] => 14/175116
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/175116 | Coaxial probe structure of elongated electrical conductors projecting from a support structure | Feb 6, 2014 | Issued |
Array
(
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[patent_kind] => A1
[patent_issue_date] => 2015-08-06
[patent_title] => 'REMOTELY ALIGNED WAFER PROBE STATION FOR SEMICONDUCTOR OPTICAL ANALYSIS SYSTEMS'
[patent_app_type] => utility
[patent_app_number] => 14/173722
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/173722 | REMOTELY ALIGNED WAFER PROBE STATION FOR SEMICONDUCTOR OPTICAL ANALYSIS SYSTEMS | Feb 4, 2014 | Abandoned |
Array
(
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[patent_title] => 'Magnetic sensor device'
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Array
(
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[patent_doc_number] => 20160012920
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[patent_kind] => A1
[patent_issue_date] => 2016-01-14
[patent_title] => 'PROBER CHUCK FOR MAGNETIC MEMORY, AND PROBER FOR MAGNETIC MEMORY PROVIDED WITH SAID CHUCK'
[patent_app_type] => utility
[patent_app_number] => 14/765956
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/765956 | Prober chuck for magnetic memory, and prober for magnetic memory provided with said chuck | Feb 3, 2014 | Issued |
Array
(
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[patent_title] => 'TWO-AXIS MAGNETIC FIELD SENSOR HAVING REDUCED COMPENSATION ANGLE FOR ZERO OFFSET'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/168095 | Magnetic field sensor | Jan 29, 2014 | Issued |
Array
(
[id] => 11562955
[patent_doc_number] => 09625536
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[patent_issue_date] => 2017-04-18
[patent_title] => 'Magnetic sensor and method for manufacturing the same'
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[patent_app_number] => 14/167639
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Array
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Array
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[id] => 10313463
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[patent_issue_date] => 2015-07-16
[patent_title] => 'VARIABLE RELUCTANCE SENSOR INTERFACES WITH CLEARING AND METHODS OF THEIR OPERATION'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/156034 | Variable reluctance sensor interfaces with clearing and methods of their operation | Jan 14, 2014 | Issued |
Array
(
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[patent_title] => 'System and method for a directional coupler with a combining circuit'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/102675 | Current sensing assembly employing magnetic sensors | Dec 10, 2013 | Issued |
Array
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Array
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