
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 9558445
[patent_doc_number] => 20140176157
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-06-26
[patent_title] => 'APPARATUS FOR MONITORING REVERSE OSMOSIS MEMBRANE CONDITION'
[patent_app_type] => utility
[patent_app_number] => 14/040503
[patent_app_country] => US
[patent_app_date] => 2013-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14040503
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/040503 | Apparatus for monitoring reverse osmosis membrane condition | Sep 26, 2013 | Issued |
Array
(
[id] => 11723513
[patent_doc_number] => 09696363
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-07-04
[patent_title] => 'System and method for an arc fault detector'
[patent_app_type] => utility
[patent_app_number] => 14/037074
[patent_app_country] => US
[patent_app_date] => 2013-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/037074 | System and method for an arc fault detector | Sep 24, 2013 | Issued |
Array
(
[id] => 9394408
[patent_doc_number] => 20140091814
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-04-03
[patent_title] => 'FET RF POWER DETECTOR'
[patent_app_type] => utility
[patent_app_number] => 14/030079
[patent_app_country] => US
[patent_app_date] => 2013-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/030079 | FET RF power detector | Sep 17, 2013 | Issued |
Array
(
[id] => 9649508
[patent_doc_number] => 08803529
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-08-12
[patent_title] => 'Method for determining capacitance'
[patent_app_type] => utility
[patent_app_number] => 14/028774
[patent_app_country] => US
[patent_app_date] => 2013-09-17
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/028774 | Method for determining capacitance | Sep 16, 2013 | Issued |
Array
(
[id] => 9883457
[patent_doc_number] => 08970229
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-03-03
[patent_title] => 'Capacitive sensor with reduced noise'
[patent_app_type] => utility
[patent_app_number] => 14/027838
[patent_app_country] => US
[patent_app_date] => 2013-09-16
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/027838 | Capacitive sensor with reduced noise | Sep 15, 2013 | Issued |
Array
(
[id] => 11763817
[patent_doc_number] => 09372234
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-06-21
[patent_title] => 'Detection method of current sensor faults in the e-drive system by using the voltage command error'
[patent_app_type] => utility
[patent_app_number] => 14/011720
[patent_app_country] => US
[patent_app_date] => 2013-08-27
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/011720 | Detection method of current sensor faults in the e-drive system by using the voltage command error | Aug 26, 2013 | Issued |
Array
(
[id] => 9394421
[patent_doc_number] => 20140091827
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2014-04-03
[patent_title] => 'PROBE CARD FOR CIRCUIT-TESTING'
[patent_app_type] => utility
[patent_app_number] => 14/010083
[patent_app_country] => US
[patent_app_date] => 2013-08-26
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14010083
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/010083 | Probe card for testing wafers | Aug 25, 2013 | Issued |
Array
(
[id] => 9899337
[patent_doc_number] => 20150054536
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-02-26
[patent_title] => 'Pin Verification Device And Method'
[patent_app_type] => utility
[patent_app_number] => 14/010315
[patent_app_country] => US
[patent_app_date] => 2013-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14010315
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/010315 | Pin verification device and method | Aug 25, 2013 | Issued |
Array
(
[id] => 9862354
[patent_doc_number] => 20150042371
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-02-12
[patent_title] => 'SEMICONDUCTOR DEVICE DEFECT MONITORING'
[patent_app_type] => utility
[patent_app_number] => 13/960029
[patent_app_country] => US
[patent_app_date] => 2013-08-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/960029 | Semiconductor device defect monitoring using a plurality of temperature sensing devices in an adjacent semiconductor device | Aug 5, 2013 | Issued |
Array
(
[id] => 9836820
[patent_doc_number] => 20150028901
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-01-29
[patent_title] => 'SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES'
[patent_app_type] => utility
[patent_app_number] => 13/960600
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/960600 | SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES | Aug 5, 2013 | Abandoned |
Array
(
[id] => 9836822
[patent_doc_number] => 20150028903
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-01-29
[patent_title] => 'SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES'
[patent_app_type] => utility
[patent_app_number] => 13/960628
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/960628 | Systems and methods mitigating temperature dependence of circuitry electronic devices | Aug 5, 2013 | Issued |
Array
(
[id] => 9862353
[patent_doc_number] => 20150042370
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[patent_issue_date] => 2015-02-12
[patent_title] => 'APPARATUS FOR DETECTING A FAILED TRANSISTOR'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/959821 | APPARATUS FOR DETECTING A FAILED TRANSISTOR | Aug 5, 2013 | Abandoned |
Array
(
[id] => 9862352
[patent_doc_number] => 20150042369
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[patent_issue_date] => 2015-02-12
[patent_title] => 'METHOD AND AN APPARATUS OF DETERMINING PERFORMANCE OF AN INTEGRATED CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 13/959764
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/959764 | Method of determining performance of a chip of an integrated-circuit design and an apparatus and an integrated circuit using the same | Aug 5, 2013 | Issued |
Array
(
[id] => 9836824
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Array
(
[id] => 9855533
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[patent_title] => 'HIGH ACCURACY MEASUREMENT OF ON-CHIP COMPONENT PARAMETERS'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/959166 | Method and system for performing testing of photonic devices | Aug 4, 2013 | Issued |
Array
(
[id] => 9105149
[patent_doc_number] => 20130278280
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[patent_issue_date] => 2013-10-24
[patent_title] => 'APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION OF ELECTROSTATIC DISCHARGE OF A SUBSTRATE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/922320 | APPARATUS AND METHOD FOR ACTIVE VOLTAGE COMPENSATION OF ELECTROSTATIC DISCHARGE OF A SUBSTRATE | Jun 19, 2013 | Abandoned |
Array
(
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/871030 | Semiconductor device, measurement device, and correction method | Apr 25, 2013 | Issued |