Search

Tim Miles

Examiner (ID: 12270)

Most Active Art Unit
1305
Art Unit(s)
1101, 2899, 1724, 3402, 1801, 1305
Total Applications
1774
Issued Applications
1552
Pending Applications
28
Abandoned Applications
194

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19092097 [patent_doc_number] => 11953544 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-04-09 [patent_title] => Systems and methods for testing functionality and performance of a sensor and hub [patent_app_type] => utility [patent_app_number] => 18/337973 [patent_app_country] => US [patent_app_date] => 2023-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8753 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18337973 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/337973
Systems and methods for testing functionality and performance of a sensor and hub Jun 19, 2023 Issued
Array ( [id] => 20330870 [patent_doc_number] => 12461142 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-04 [patent_title] => Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus [patent_app_type] => utility [patent_app_number] => 18/333209 [patent_app_country] => US [patent_app_date] => 2023-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1134 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18333209 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/333209
Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus Jun 11, 2023 Issued
Array ( [id] => 19632490 [patent_doc_number] => 20240410939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => Improved Thermal and Electrical Conductivity Between Metal Contacts [patent_app_type] => utility [patent_app_number] => 18/332344 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10657 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18332344 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/332344
Thermal and electrical conductivity between metal contacts utilizing spring pin connectors Jun 8, 2023 Issued
Array ( [id] => 18880300 [patent_doc_number] => 20240003669 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-04 [patent_title] => THICKNESS MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 18/207916 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4257 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207916 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207916
System for measuring a thickness of a layer coated on a body Jun 8, 2023 Issued
Array ( [id] => 19068643 [patent_doc_number] => 20240103069 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-28 [patent_title] => METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/331472 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9546 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331472 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331472
Electrical testing method for semiconductor device Jun 7, 2023 Issued
Array ( [id] => 19021359 [patent_doc_number] => 20240077530 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING DIAGNOSTIC PROGRAM OF THE TEST BOARD [patent_app_type] => utility [patent_app_number] => 18/331596 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7919 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331596 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331596
Test board including test executable integrated circuit for testing a device under test, and diagnostic system, diagnostic method, and non-transitory computer-readable storage medium storing diagnostic program of the test board Jun 7, 2023 Issued
Array ( [id] => 18676879 [patent_doc_number] => 20230314512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 18/330222 [patent_app_country] => US [patent_app_date] => 2023-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8930 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18330222 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/330222
Passive carrier-based device delivery for slot-based high-volume semiconductor test system Jun 5, 2023 Issued
Array ( [id] => 20159326 [patent_doc_number] => 12385947 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same [patent_app_type] => utility [patent_app_number] => 18/327148 [patent_app_country] => US [patent_app_date] => 2023-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18327148 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/327148
Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same May 31, 2023 Issued
Array ( [id] => 19204015 [patent_doc_number] => 20240175914 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => ELECTRONIC DEVICE [patent_app_type] => utility [patent_app_number] => 18/326030 [patent_app_country] => US [patent_app_date] => 2023-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18326030 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/326030
Electronic device May 30, 2023 Issued
Array ( [id] => 19433930 [patent_doc_number] => 20240302428 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => TESTING DEVICE AND TESTING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/317100 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2991 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18317100 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/317100
Testing device and testing method thereof May 14, 2023 Issued
Array ( [id] => 19587495 [patent_doc_number] => 20240385052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-21 [patent_title] => TEST SYSTEMS CONFIGURED TO TEST DEVICES AT DIFFERENT TEMPERATURES [patent_app_type] => utility [patent_app_number] => 18/197445 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5574 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -25 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18197445 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/197445
TEST SYSTEMS CONFIGURED TO TEST DEVICES AT DIFFERENT TEMPERATURES May 14, 2023 Pending
Array ( [id] => 20358385 [patent_doc_number] => 12474376 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing [patent_app_type] => utility [patent_app_number] => 18/140448 [patent_app_country] => US [patent_app_date] => 2023-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18140448 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/140448
Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing Apr 26, 2023 Issued
Array ( [id] => 18568363 [patent_doc_number] => 20230258699 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => POWER DETECTOR [patent_app_type] => utility [patent_app_number] => 18/306616 [patent_app_country] => US [patent_app_date] => 2023-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15025 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18306616 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/306616
Power detector Apr 24, 2023 Issued
Array ( [id] => 20109440 [patent_doc_number] => 12360152 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-15 [patent_title] => Integrated current monitor using variable drain-to-source voltages [patent_app_type] => utility [patent_app_number] => 18/303852 [patent_app_country] => US [patent_app_date] => 2023-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3887 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18303852 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/303852
Integrated current monitor using variable drain-to-source voltages Apr 19, 2023 Issued
Array ( [id] => 20078734 [patent_doc_number] => 12352794 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => Capacitance measurement circuit [patent_app_type] => utility [patent_app_number] => 18/299088 [patent_app_country] => US [patent_app_date] => 2023-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 1174 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 383 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18299088 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/299088
Capacitance measurement circuit Apr 11, 2023 Issued
Array ( [id] => 18727177 [patent_doc_number] => 20230341461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => LIMITING CIRCUITRY WITH CONTROLLED PARALLEL DIRECT CURRENT-DIRECT CURRENT-CONVERTERS [patent_app_type] => utility [patent_app_number] => 18/130714 [patent_app_country] => US [patent_app_date] => 2023-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8241 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18130714 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/130714
Limiting circuitry with controlled parallel direct current-direct current-converters Apr 3, 2023 Issued
Array ( [id] => 19856625 [patent_doc_number] => 12259455 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-03-25 [patent_title] => Calibrating a battery of an information handling system [patent_app_type] => utility [patent_app_number] => 18/193114 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9740 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 241 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18193114 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/193114
Calibrating a battery of an information handling system Mar 29, 2023 Issued
Array ( [id] => 19872245 [patent_doc_number] => 12265102 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-01 [patent_title] => Capacitive non-contact voltage sensing method and apparatus [patent_app_type] => utility [patent_app_number] => 18/191601 [patent_app_country] => US [patent_app_date] => 2023-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 16658 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18191601 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/191601
Capacitive non-contact voltage sensing method and apparatus Mar 27, 2023 Issued
Array ( [id] => 19718442 [patent_doc_number] => 12203973 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-21 [patent_title] => Monitoring semiconductor reliability and predicting device failure during device life [patent_app_type] => utility [patent_app_number] => 18/125537 [patent_app_country] => US [patent_app_date] => 2023-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5014 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18125537 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/125537
Monitoring semiconductor reliability and predicting device failure during device life Mar 22, 2023 Issued
Array ( [id] => 18659038 [patent_doc_number] => 20230305040 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-28 [patent_title] => CURRENT SENSOR SYSTEM [patent_app_type] => utility [patent_app_number] => 18/186520 [patent_app_country] => US [patent_app_date] => 2023-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11232 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18186520 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/186520
Current sensor system Mar 19, 2023 Issued
Menu