
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 10845341
[patent_doc_number] => 08872524
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-10-28
[patent_title] => 'Switching apparatus, switching apparatus manufacturing method, transmission line switching apparatus, and test apparatus'
[patent_app_type] => utility
[patent_app_number] => 13/279323
[patent_app_country] => US
[patent_app_date] => 2011-10-23
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13279323
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/279323 | Switching apparatus, switching apparatus manufacturing method, transmission line switching apparatus, and test apparatus | Oct 22, 2011 | Issued |
Array
(
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[patent_doc_number] => 20120092026
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-04-19
[patent_title] => 'Electrical System, Method, and Apparatus of Fingerprint Sensor Using Acoustic Impediography'
[patent_app_type] => utility
[patent_app_number] => 13/277021
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Array
(
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[patent_doc_number] => 08717060
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[patent_title] => 'Method of monitoring a semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/275721 | Method of monitoring a semiconductor device | Oct 17, 2011 | Issued |
Array
(
[id] => 8134889
[patent_doc_number] => 20120091995
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-04-19
[patent_title] => 'CURRENT DETECTION DEVICE'
[patent_app_type] => utility
[patent_app_number] => 13/274581
[patent_app_country] => US
[patent_app_date] => 2011-10-17
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/274581 | Current detection device | Oct 16, 2011 | Issued |
Array
(
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[patent_doc_number] => 08957665
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[patent_kind] => B2
[patent_issue_date] => 2015-02-17
[patent_title] => 'Voltage measurement apparatus including switch circuit'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/274648 | Voltage measurement apparatus including switch circuit | Oct 16, 2011 | Issued |
Array
(
[id] => 8765374
[patent_doc_number] => 20130093411
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-04-18
[patent_title] => 'CIRCUIT ARRANGEMENT'
[patent_app_type] => utility
[patent_app_number] => 13/273251
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/273251 | Circuit arrangement | Oct 13, 2011 | Issued |
Array
(
[id] => 8765414
[patent_doc_number] => 20130093451
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-04-18
[patent_title] => 'METHOD AND APPARATUS FOR DE-EMBEDDING'
[patent_app_type] => utility
[patent_app_number] => 13/273334
[patent_app_country] => US
[patent_app_date] => 2011-10-14
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/273334 | METHOD AND APPARATUS FOR DE-EMBEDDING | Oct 13, 2011 | Abandoned |
Array
(
[id] => 8753949
[patent_doc_number] => 20130088253
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-04-11
[patent_title] => 'Methods for Testing Manufactured Products'
[patent_app_type] => utility
[patent_app_number] => 13/269831
[patent_app_country] => US
[patent_app_date] => 2011-10-10
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/269831 | Methods for testing manufactured products | Oct 9, 2011 | Issued |
Array
(
[id] => 10145693
[patent_doc_number] => 09178512
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-11-03
[patent_title] => 'Capacitive coupling based sensor'
[patent_app_type] => utility
[patent_app_number] => 13/267853
[patent_app_country] => US
[patent_app_date] => 2011-10-06
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/267853 | Capacitive coupling based sensor | Oct 5, 2011 | Issued |
Array
(
[id] => 8742970
[patent_doc_number] => 20130082687
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-04-04
[patent_title] => 'TRANSMITTER CALIBRATION SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 13/248730
[patent_app_country] => US
[patent_app_date] => 2011-09-29
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13248730
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/248730 | Transmitter calibration system | Sep 28, 2011 | Issued |
Array
(
[id] => 10893471
[patent_doc_number] => 08917087
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-12-23
[patent_title] => 'Moving magnetic field generating apparatus'
[patent_app_type] => utility
[patent_app_number] => 13/248170
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/248170 | Moving magnetic field generating apparatus | Sep 28, 2011 | Issued |
Array
(
[id] => 9883463
[patent_doc_number] => 08970235
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2015-03-03
[patent_title] => 'Semiconductor test device, semiconductor test circuit connection device, and semiconductor test method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/244548 | Semiconductor test device, semiconductor test circuit connection device, and semiconductor test method | Sep 24, 2011 | Issued |
Array
(
[id] => 8310947
[patent_doc_number] => 20120187972
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-07-26
[patent_title] => 'WAFER LEVEL TESTING STRUCTURE'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/244528 | WAFER LEVEL TESTING STRUCTURE | Sep 24, 2011 | Abandoned |
Array
(
[id] => 8686740
[patent_doc_number] => 20130055024
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-02-28
[patent_title] => 'CENTRAL PROCESSING UNIT TEST SYSTEM'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/239417 | Central processing unit test system | Sep 21, 2011 | Issued |
Array
(
[id] => 9778864
[patent_doc_number] => 08854073
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-10-07
[patent_title] => 'Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns'
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Array
(
[id] => 8718410
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[patent_title] => 'SYSTEM AND METHOD FOR WIRELESS REMOTE DISPLAY FOR HIGH VOLTAGE LINE METER'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/235693 | System and method for wireless remote display for high voltage line meter | Sep 18, 2011 | Issued |
Array
(
[id] => 9356172
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Array
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[patent_title] => 'SENSOR ARRANGEMENT FOR CAPTURUING A TORQUE'
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Array
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Array
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