
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 9711781
[patent_doc_number] => 08836359
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-09-16
[patent_title] => 'Capacitive input test method'
[patent_app_type] => utility
[patent_app_number] => 13/144036
[patent_app_country] => US
[patent_app_date] => 2010-01-12
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13144036
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/144036 | Capacitive input test method | Jan 11, 2010 | Issued |
Array
(
[id] => 6305980
[patent_doc_number] => 20100109700
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-06
[patent_title] => 'ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES'
[patent_app_type] => utility
[patent_app_number] => 12/684142
[patent_app_country] => US
[patent_app_date] => 2010-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => publications/A1/0109/20100109700.pdf
[firstpage_image] =>[orig_patent_app_number] => 12684142
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/684142 | On-chip detection of power supply vulnerabilities | Jan 7, 2010 | Issued |
Array
(
[id] => 4473114
[patent_doc_number] => 07944224
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-17
[patent_title] => 'Low profile probe having improved mechanical scrub and reduced contact inductance'
[patent_app_type] => utility
[patent_app_number] => 12/684272
[patent_app_country] => US
[patent_app_date] => 2010-01-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/684272 | Low profile probe having improved mechanical scrub and reduced contact inductance | Jan 7, 2010 | Issued |
Array
(
[id] => 4434082
[patent_doc_number] => 07969171
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-06-28
[patent_title] => 'Test circuit and system'
[patent_app_type] => utility
[patent_app_number] => 12/683064
[patent_app_country] => US
[patent_app_date] => 2010-01-06
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[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/07/969/07969171.pdf
[firstpage_image] =>[orig_patent_app_number] => 12683064
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/683064 | Test circuit and system | Jan 5, 2010 | Issued |
Array
(
[id] => 6099676
[patent_doc_number] => 20110163755
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-07-07
[patent_title] => 'SELF-ALIGNING TEST FIXTURE FOR PRINTED CIRCUIT BOARD'
[patent_app_type] => utility
[patent_app_number] => 12/652170
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[patent_app_date] => 2010-01-05
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[patent_drawing_sheets_cnt] => 11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/652170 | SELF-ALIGNING TEST FIXTURE FOR PRINTED CIRCUIT BOARD | Jan 4, 2010 | Abandoned |
Array
(
[id] => 6099720
[patent_doc_number] => 20110163775
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-07-07
[patent_title] => 'UNIVERSAL FRONT/BACK POST TERMINAL BLOCK AND TEST LINK'
[patent_app_type] => utility
[patent_app_number] => 12/652001
[patent_app_country] => US
[patent_app_date] => 2010-01-04
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[firstpage_image] =>[orig_patent_app_number] => 12652001
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/652001 | Universal front/back post terminal block and test link | Jan 3, 2010 | Issued |
Array
(
[id] => 7523552
[patent_doc_number] => 08026713
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-09-27
[patent_title] => 'State detection device for detecting operation state of high-frequency heating apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/651249
[patent_app_country] => US
[patent_app_date] => 2009-12-31
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Array
(
[id] => 4554382
[patent_doc_number] => 07960966
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[patent_issue_date] => 2011-06-14
[patent_title] => 'State detection device for detecting operation state of high-frequency heating apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/651229
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[patent_app_date] => 2009-12-31
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Array
(
[id] => 8739027
[patent_doc_number] => 08410802
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-04-02
[patent_title] => 'System including thermal control unit having conduit for dispense and removal of liquid thermal interface material'
[patent_app_type] => utility
[patent_app_number] => 12/647261
[patent_app_country] => US
[patent_app_date] => 2009-12-24
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/647261 | System including thermal control unit having conduit for dispense and removal of liquid thermal interface material | Dec 23, 2009 | Issued |
Array
(
[id] => 4605173
[patent_doc_number] => 07986155
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-07-26
[patent_title] => 'Method of manufacturing a heat sink pedestal device with interface medium chamber'
[patent_app_type] => utility
[patent_app_number] => 12/654420
[patent_app_country] => US
[patent_app_date] => 2009-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[pdf_file] => patents/07/986/07986155.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/654420 | Method of manufacturing a heat sink pedestal device with interface medium chamber | Dec 17, 2009 | Issued |
Array
(
[id] => 8340840
[patent_doc_number] => 08242769
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[patent_issue_date] => 2012-08-14
[patent_title] => 'Method for measuring transconductance'
[patent_app_type] => utility
[patent_app_number] => 12/640409
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/640409 | Method for measuring transconductance | Dec 16, 2009 | Issued |
Array
(
[id] => 10877162
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[patent_issue_date] => 2014-12-02
[patent_title] => 'Circuit testing device and method for implementing same'
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Array
(
[id] => 6138424
[patent_doc_number] => 20110128021
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-06-02
[patent_title] => 'PIN CONNECTOR AND CHIP TEST FIXTURE HAVING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/627501 | Pin connector and chip test fixture having the same | Nov 29, 2009 | Issued |
Array
(
[id] => 8739031
[patent_doc_number] => 08410806
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[patent_issue_date] => 2013-04-02
[patent_title] => 'Replaceable coupon for a probing apparatus'
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12592186
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/592186 | Replaceable coupon for a probing apparatus | Nov 19, 2009 | Issued |
Array
(
[id] => 4619811
[patent_doc_number] => 07999532
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[patent_title] => 'Apparatus for electronically measuring or distributing electrical energy'
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Array
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[pdf_file] => patents/07/948/07948228.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/614641 | Technique for measuring power source noise generated inside integrated circuit | Nov 8, 2009 | Issued |
Array
(
[id] => 6273567
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[patent_issue_date] => 2010-05-13
[patent_title] => 'Method and means for optical detection of internal-node signals in an integrated circuit device'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/121595 | Capacitive measuring circuit for yarn inspection | Oct 11, 2009 | Issued |