Tim Miles

Array ( [id] => 8399172 [patent_doc_number] => 08269520 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-18 [patent_title] => 'Using pattern generators to control flow of data to and from a semiconductor device under test' [patent_app_type] => utility [patent_app_number] => 12/575800 [patent_app_country] => US [patent_app_date] => 2009-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5898 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12575800 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4610833 [patent_doc_number] => 07994803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-08-09 [patent_title] => 'Calibration substrate' [patent_app_type] => utility [patent_app_number] => 12/569584 [patent_app_country] => US [patent_app_date] => 2009-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 15 [patent_no_of_words] => 8844 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/994/07994803.pdf [firstpage_image] =>[orig_patent_app_number] => 12569584 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5930551 [patent_doc_number] => 20110209540 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-01 [patent_title] => 'METHOD OF TESTING A PIPELINE CUT' [patent_app_type] => utility [patent_app_number] => 13/119212 [patent_app_country] => US [patent_app_date] => 2009-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5784 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0209/20110209540.pdf [firstpage_image] =>[orig_patent_app_number] => 13119212 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6346211 [patent_doc_number] => 20100071441 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-25 [patent_title] => 'PARTICULATE MATTER DETECTION DEVICE AND METHOD FOR MANUFACTURING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/559762 [patent_app_country] => US [patent_app_date] => 2009-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 12668 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0071/20100071441.pdf [firstpage_image] =>[orig_patent_app_number] => 12559762 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8153475 [patent_doc_number] => 08169227 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-05-01 [patent_title] => 'Probing apparatus with multiaxial stages for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/552102 [patent_app_country] => US [patent_app_date] => 2009-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1790 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/169/08169227.pdf [firstpage_image] =>[orig_patent_app_number] => 12552102 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6217035 [patent_doc_number] => 20100052715 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-04 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 12/548537 [patent_app_country] => US [patent_app_date] => 2009-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20100052715.pdf [firstpage_image] =>[orig_patent_app_number] => 12548537 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6551584 [patent_doc_number] => 20100045320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 12/548567 [patent_app_country] => US [patent_app_date] => 2009-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045320.pdf [firstpage_image] =>[orig_patent_app_number] => 12548567 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6551650 [patent_doc_number] => 20100045324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 12/548575 [patent_app_country] => US [patent_app_date] => 2009-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045324.pdf [firstpage_image] =>[orig_patent_app_number] => 12548575 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6551799 [patent_doc_number] => 20100045334 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-25 [patent_title] => 'DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYS' [patent_app_type] => utility [patent_app_number] => 12/547251 [patent_app_country] => US [patent_app_date] => 2009-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6732 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20100045334.pdf [firstpage_image] =>[orig_patent_app_number] => 12547251 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6068379 [patent_doc_number] => 20110043228 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-02-24 [patent_title] => 'METHOD AND APPARATUS FOR MEASURING WAFER BIAS POTENTIAL' [patent_app_type] => utility [patent_app_number] => 12/545293 [patent_app_country] => US [patent_app_date] => 2009-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4725 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20110043228.pdf [firstpage_image] =>[orig_patent_app_number] => 12545293 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4528191 [patent_doc_number] => 07952369 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-31 [patent_title] => 'Device and method for sensing a position of a probe' [patent_app_type] => utility [patent_app_number] => 12/544246 [patent_app_country] => US [patent_app_date] => 2009-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 15 [patent_no_of_words] => 8224 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952369.pdf [firstpage_image] =>[orig_patent_app_number] => 12544246 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5300773 [patent_doc_number] => 20090295425 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-12-03 [patent_title] => 'DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYS' [patent_app_type] => utility [patent_app_number] => 12/540256 [patent_app_country] => US [patent_app_date] => 2009-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6730 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20090295425.pdf [firstpage_image] =>[orig_patent_app_number] => 12540256 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5553376 [patent_doc_number] => 20090287362 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-11-19 [patent_title] => 'MONITORED BURN-IN TEST APPARATUS AND MONITORED BURN-IN TEST METHOD' [patent_app_type] => utility [patent_app_number] => 12/533504 [patent_app_country] => US [patent_app_date] => 2009-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8524 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0287/20090287362.pdf [firstpage_image] =>[orig_patent_app_number] => 12533504 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 10838820 [patent_doc_number] => 08866500 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-10-21 [patent_title] => 'Multi-functional capacitance sensing circuit with a current conveyor' [patent_app_type] => utility [patent_app_number] => 12/507614 [patent_app_country] => US [patent_app_date] => 2009-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8865 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12507614 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4572146 [patent_doc_number] => 07847537 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-07 [patent_title] => 'Electricity meter with resilient connectors' [patent_app_type] => utility [patent_app_number] => 12/507157 [patent_app_country] => US [patent_app_date] => 2009-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 11643 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/847/07847537.pdf [firstpage_image] =>[orig_patent_app_number] => 12507157 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9483953 [patent_doc_number] => 08729906 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-05-20 [patent_title] => 'Monitoring partial discharge in high voltage systems' [patent_app_type] => utility [patent_app_number] => 13/060044 [patent_app_country] => US [patent_app_date] => 2009-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 6137 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13060044 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8555974 [patent_doc_number] => 08330449 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-11 [patent_title] => 'Clamp-on multimeters including a Rogowski coil for measuring alternating current in a conductor' [patent_app_type] => utility [patent_app_number] => 12/506118 [patent_app_country] => US [patent_app_date] => 2009-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2489 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12506118 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8295118 [patent_doc_number] => 08222910 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-07-17 [patent_title] => 'Method and apparatus for sub-assembly error detection in high voltage analog circuits and pins' [patent_app_type] => utility [patent_app_number] => 12/504308 [patent_app_country] => US [patent_app_date] => 2009-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3923 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12504308 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6100175 [patent_doc_number] => 20110164013 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-07 [patent_title] => 'DISPLAY PANEL AND DISPLAY PANEL INSPECTION METHOD' [patent_app_type] => utility [patent_app_number] => 13/061995 [patent_app_country] => US [patent_app_date] => 2009-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8847 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20110164013.pdf [firstpage_image] =>[orig_patent_app_number] => 13061995 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 9553126 [patent_doc_number] => 08760182 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-06-24 [patent_title] => 'Test head docking system and method with sliding linkage' [patent_app_type] => utility [patent_app_number] => 13/003660 [patent_app_country] => US [patent_app_date] => 2009-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 23 [patent_no_of_words] => 10063 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13003660 [rel_patent_id] =>[rel_patent_doc_number] =>)