Search

Timothy D. Collins

Supervisory Patent Examiner (ID: 7548, Phone: (571)272-6886 , Office: P/3644 )

Most Active Art Unit
3643
Art Unit(s)
3643, 3644
Total Applications
840
Issued Applications
540
Pending Applications
147
Abandoned Applications
156

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19850604 [patent_doc_number] => 20250095955 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-20 [patent_title] => METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES [patent_app_type] => utility [patent_app_number] => 18/370303 [patent_app_country] => US [patent_app_date] => 2023-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4510 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18370303 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/370303
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES Sep 18, 2023 Pending
Array ( [id] => 19833470 [patent_doc_number] => 20250085256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-13 [patent_title] => METHODS AND SYSTEMS FOR ION MOBILITY SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 18/463570 [patent_app_country] => US [patent_app_date] => 2023-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11848 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18463570 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/463570
METHODS AND SYSTEMS FOR ION MOBILITY SPECTROMETRY Sep 7, 2023 Pending
Array ( [id] => 19130795 [patent_doc_number] => 20240136148 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => BEAM DETECTOR, MULTI-CHARGED-PARTICLE-BEAM IRRADIATION APPARATUS, AND ADJUSTMENT METHOD FOR BEAM DETECTOR [patent_app_type] => utility [patent_app_number] => 18/461180 [patent_app_country] => US [patent_app_date] => 2023-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5366 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18461180 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/461180
BEAM DETECTOR, MULTI-CHARGED-PARTICLE-BEAM IRRADIATION APPARATUS, AND ADJUSTMENT METHOD FOR BEAM DETECTOR Sep 4, 2023 Pending
Array ( [id] => 19130795 [patent_doc_number] => 20240136148 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => BEAM DETECTOR, MULTI-CHARGED-PARTICLE-BEAM IRRADIATION APPARATUS, AND ADJUSTMENT METHOD FOR BEAM DETECTOR [patent_app_type] => utility [patent_app_number] => 18/461180 [patent_app_country] => US [patent_app_date] => 2023-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5366 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18461180 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/461180
BEAM DETECTOR, MULTI-CHARGED-PARTICLE-BEAM IRRADIATION APPARATUS, AND ADJUSTMENT METHOD FOR BEAM DETECTOR Sep 3, 2023 Pending
Array ( [id] => 19646396 [patent_doc_number] => 20240420916 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-19 [patent_title] => WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM [patent_app_type] => utility [patent_app_number] => 18/706592 [patent_app_country] => US [patent_app_date] => 2022-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11149 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18706592 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/706592
WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM Oct 4, 2022 Pending
Array ( [id] => 19500293 [patent_doc_number] => 20240339311 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS [patent_app_type] => utility [patent_app_number] => 18/294386 [patent_app_country] => US [patent_app_date] => 2022-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7560 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18294386 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/294386
STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS Aug 4, 2022 Pending
Array ( [id] => 19723191 [patent_doc_number] => 20250025942 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-23 [patent_title] => ADDITIVE MANUFACTURING METHOD AND ADDITIVE MANUFACTURING DEVICE [patent_app_type] => utility [patent_app_number] => 18/574985 [patent_app_country] => US [patent_app_date] => 2022-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11654 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18574985 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/574985
ADDITIVE MANUFACTURING METHOD AND ADDITIVE MANUFACTURING DEVICE Jun 29, 2022 Pending
Array ( [id] => 19384556 [patent_doc_number] => 20240274426 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => Automated Mass Spectrometry Sampling of Material Surfaces [patent_app_type] => utility [patent_app_number] => 18/567841 [patent_app_country] => US [patent_app_date] => 2022-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7259 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -28 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567841 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567841
Automated Mass Spectrometry Sampling of Material Surfaces Jun 9, 2022 Pending
Array ( [id] => 19382327 [patent_doc_number] => 20240272197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE POSITIONING OF A SAMPLE SUPPORT [patent_app_type] => utility [patent_app_number] => 18/567274 [patent_app_country] => US [patent_app_date] => 2022-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4857 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567274 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567274
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE POSITIONING OF A SAMPLE SUPPORT Jun 6, 2022 Pending
Array ( [id] => 19361889 [patent_doc_number] => 20240263923 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-08 [patent_title] => A THERMAL TRACE ENHANCER SYSTEM [patent_app_type] => utility [patent_app_number] => 18/565713 [patent_app_country] => US [patent_app_date] => 2022-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4178 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18565713 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/565713
A THERMAL TRACE ENHANCER SYSTEM Jun 5, 2022 Pending
Array ( [id] => 19333639 [patent_doc_number] => 20240248069 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-25 [patent_title] => AN ANALYZER SYSTEM [patent_app_type] => utility [patent_app_number] => 18/566548 [patent_app_country] => US [patent_app_date] => 2022-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14928 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18566548 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/566548
AN ANALYZER SYSTEM May 30, 2022 Pending
Array ( [id] => 19335499 [patent_doc_number] => 20240249929 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-25 [patent_title] => Gain Calibration for Quantitation Using On-Demand/Dynamic Implementation of MS Sensitivity Improvement Techniques [patent_app_type] => utility [patent_app_number] => 18/559758 [patent_app_country] => US [patent_app_date] => 2022-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11965 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 488 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18559758 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/559758
Gain Calibration for Quantitation Using On-Demand/Dynamic Implementation of MS Sensitivity Improvement Techniques May 2, 2022 Pending
Array ( [id] => 19515642 [patent_doc_number] => 20240347328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => Mass Spectrometer and Mass Spectrometry Method [patent_app_type] => utility [patent_app_number] => 18/294930 [patent_app_country] => US [patent_app_date] => 2022-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9983 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18294930 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/294930
Mass Spectrometer and Mass Spectrometry Method Mar 24, 2022 Pending
Array ( [id] => 19390736 [patent_doc_number] => 20240280606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-22 [patent_title] => DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD [patent_app_type] => utility [patent_app_number] => 18/567158 [patent_app_country] => US [patent_app_date] => 2022-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5188 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567158 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567158
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD Feb 2, 2022 Pending
Array ( [id] => 19619102 [patent_doc_number] => 20240404782 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-05 [patent_title] => CHARGED PARTICLE BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 18/700781 [patent_app_country] => US [patent_app_date] => 2021-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5777 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 269 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18700781 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/700781
CHARGED PARTICLE BEAM DEVICE Dec 27, 2021 Pending
Array ( [id] => 20103008 [patent_doc_number] => 20250232944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-17 [patent_title] => MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 18/699609 [patent_app_country] => US [patent_app_date] => 2021-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3791 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18699609 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/699609
MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE Dec 6, 2021 Pending
Array ( [id] => 19589601 [patent_doc_number] => 20240387158 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-21 [patent_title] => Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer [patent_app_type] => utility [patent_app_number] => 18/691405 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18691405 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/691405
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer Oct 7, 2021 Pending
Array ( [id] => 19575031 [patent_doc_number] => 20240379323 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM [patent_app_type] => utility [patent_app_number] => 18/692789 [patent_app_country] => US [patent_app_date] => 2021-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18692789 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/692789
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM Sep 27, 2021 Pending
Array ( [id] => 19189139 [patent_doc_number] => 20240168052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device [patent_app_type] => utility [patent_app_number] => 18/283932 [patent_app_country] => US [patent_app_date] => 2021-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8060 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18283932 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/283932
Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device Mar 25, 2021 Pending
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