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Todd Burns

Examiner (ID: 10392)

Most Active Art Unit
1303
Art Unit(s)
1303
Total Applications
246
Issued Applications
204
Pending Applications
0
Abandoned Applications
42

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2651798 [patent_doc_number] => 04961812 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-09 [patent_title] => 'Etch-back apparatus for integrated circuit failure analysis' [patent_app_type] => 1 [patent_app_number] => 7/243787 [patent_app_country] => US [patent_app_date] => 1988-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3808 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/961/04961812.pdf [firstpage_image] =>[orig_patent_app_number] => 243787 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/243787
Etch-back apparatus for integrated circuit failure analysis Sep 12, 1988 Issued
07/237539 KARL FISCHER TITRATION TECHNIQUES Aug 28, 1988 Abandoned
Array ( [id] => 2622399 [patent_doc_number] => 04915779 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-04-10 [patent_title] => 'Residue-free plasma etch of high temperature AlCu' [patent_app_type] => 1 [patent_app_number] => 7/235134 [patent_app_country] => US [patent_app_date] => 1988-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 6 [patent_no_of_words] => 1353 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/915/04915779.pdf [firstpage_image] =>[orig_patent_app_number] => 235134 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/235134
Residue-free plasma etch of high temperature AlCu Aug 22, 1988 Issued
Array ( [id] => 2582262 [patent_doc_number] => 04927485 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-22 [patent_title] => 'Laser interferometer system for monitoring and controlling IC processing' [patent_app_type] => 1 [patent_app_number] => 7/225158 [patent_app_country] => US [patent_app_date] => 1988-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 2256 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 28 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/927/04927485.pdf [firstpage_image] =>[orig_patent_app_number] => 225158 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/225158
Laser interferometer system for monitoring and controlling IC processing Jul 27, 1988 Issued
Array ( [id] => 2835974 [patent_doc_number] => RE034133 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1992-11-24 [patent_title] => 'Microtest plates' [patent_app_type] => 2 [patent_app_number] => 7/213491 [patent_app_country] => US [patent_app_date] => 1988-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 17 [patent_no_of_words] => 2001 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 26 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/034/RE034133.pdf [firstpage_image] =>[orig_patent_app_number] => 213491 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/213491
Microtest plates Jun 29, 1988 Issued
07/209738 PROCESS OF PRODUCING DIFFRACTION GRATING Jun 21, 1988 Abandoned
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