
Topaz L. Elliott
Examiner (ID: 19675)
| Most Active Art Unit | 3745 |
| Art Unit(s) | 3745, 3761 |
| Total Applications | 594 |
| Issued Applications | 477 |
| Pending Applications | 57 |
| Abandoned Applications | 79 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19547948
[patent_doc_number] => 20240364984
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-31
[patent_title] => IMAGING DEVICE AND METHOD OF OPERATING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/566484
[patent_app_country] => US
[patent_app_date] => 2022-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8575
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 175
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18566484
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/566484 | IMAGING DEVICE AND METHOD OF OPERATING THE SAME | Feb 7, 2022 | Pending |
Array
(
[id] => 19038055
[patent_doc_number] => 20240087870
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-14
[patent_title] => Pressure Control in Vacuum Chamber of Mass Spectrometer
[patent_app_type] => utility
[patent_app_number] => 18/273914
[patent_app_country] => US
[patent_app_date] => 2022-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10865
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18273914
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/273914 | Pressure Control in Vacuum Chamber of Mass Spectrometer | Jan 20, 2022 | Pending |
Array
(
[id] => 18533137
[patent_doc_number] => 20230238212
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-27
[patent_title] => Electron Microscope
[patent_app_type] => utility
[patent_app_number] => 18/010939
[patent_app_country] => US
[patent_app_date] => 2021-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 17487
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18010939
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/010939 | Electron Microscope | Sep 23, 2021 | Pending |
Array
(
[id] => 18898541
[patent_doc_number] => 20240014026
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-11
[patent_title] => MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER
[patent_app_type] => utility
[patent_app_number] => 18/042811
[patent_app_country] => US
[patent_app_date] => 2021-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8688
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18042811
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/042811 | MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER | Aug 15, 2021 | Pending |
Array
(
[id] => 18958863
[patent_doc_number] => 20240047190
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-02-08
[patent_title] => ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, REFLECTING IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, AND SPIN VECTOR DISTRIBUTION IMAGING DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/015057
[patent_app_country] => US
[patent_app_date] => 2021-07-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 20747
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 318
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18015057
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/015057 | ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, REFLECTING IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, AND SPIN VECTOR DISTRIBUTION IMAGING DEVICE | Jul 8, 2021 | Pending |
Array
(
[id] => 18496224
[patent_doc_number] => 20230218791
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-13
[patent_title] => LAMP AND SYSTEM WITH WALL-TYPE RADIATION FIELDS FOR PREVENTING OR MINIMISING THE SPREAD OF PATHOGENS IN INDOOR AIR
[patent_app_type] => utility
[patent_app_number] => 18/009263
[patent_app_country] => US
[patent_app_date] => 2021-06-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12922
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18009263
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/009263 | LAMP AND SYSTEM WITH WALL-TYPE RADIATION FIELDS FOR PREVENTING OR MINIMISING THE SPREAD OF PATHOGENS IN INDOOR AIR | Jun 10, 2021 | Pending |
Array
(
[id] => 18631700
[patent_doc_number] => 20230290605
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-09-14
[patent_title] => PHOTOELECTRIC SURFACE ELECTRON SOURCE
[patent_app_type] => utility
[patent_app_number] => 18/020989
[patent_app_country] => US
[patent_app_date] => 2021-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6552
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18020989
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/020989 | PHOTOELECTRIC SURFACE ELECTRON SOURCE | Jun 8, 2021 | Abandoned |
Array
(
[id] => 18597093
[patent_doc_number] => 20230271885
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-31
[patent_title] => NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD AND METHOD OF MANUFACTURING NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD
[patent_app_type] => utility
[patent_app_number] => 17/998289
[patent_app_country] => US
[patent_app_date] => 2021-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10238
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17998289
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/998289 | NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD AND METHOD OF MANUFACTURING NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD | May 26, 2021 | Pending |
Array
(
[id] => 18473009
[patent_doc_number] => 20230207297
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-29
[patent_title] => OVERFLOW SENSOR FOR OPEN PORT SAMPLING PROBE
[patent_app_type] => utility
[patent_app_number] => 17/999617
[patent_app_country] => US
[patent_app_date] => 2021-05-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4974
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17999617
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/999617 | Overflow sensor for open port sampling probe | May 21, 2021 | Issued |
Array
(
[id] => 18488369
[patent_doc_number] => 20230215717
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-06
[patent_title] => AN ATMOSPHERIC PRESSURE IONISATION SOURCE
[patent_app_type] => utility
[patent_app_number] => 17/998012
[patent_app_country] => US
[patent_app_date] => 2021-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3228
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17998012
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/998012 | AN ATMOSPHERIC PRESSURE IONISATION SOURCE | May 4, 2021 | Pending |
Array
(
[id] => 18408849
[patent_doc_number] => 20230170202
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-01
[patent_title] => DETECTING CHEMICAL COMPOUNDS FOR FORENSIC ANALYSIS
[patent_app_type] => utility
[patent_app_number] => 17/921756
[patent_app_country] => US
[patent_app_date] => 2021-04-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12775
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17921756
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/921756 | DETECTING CHEMICAL COMPOUNDS FOR FORENSIC ANALYSIS | Apr 26, 2021 | Pending |
Array
(
[id] => 19176023
[patent_doc_number] => 20240161997
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-16
[patent_title] => ELECTRON BEAM APPLICATION DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/282906
[patent_app_country] => US
[patent_app_date] => 2021-04-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9434
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 313
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18282906
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/282906 | ELECTRON BEAM APPLICATION DEVICE | Apr 15, 2021 | Pending |
Array
(
[id] => 20360064
[patent_doc_number] => 12476069
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-11-18
[patent_title] => Charged particle assessment tool, inspection method
[patent_app_type] => utility
[patent_app_number] => 17/912608
[patent_app_country] => US
[patent_app_date] => 2021-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 16
[patent_no_of_words] => 8013
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17912608
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/912608 | Charged particle assessment tool, inspection method | Apr 3, 2021 | Issued |
Array
(
[id] => 18514537
[patent_doc_number] => 20230230794
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-20
[patent_title] => ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJECTING METHOD
[patent_app_type] => utility
[patent_app_number] => 17/996215
[patent_app_country] => US
[patent_app_date] => 2021-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8010
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 54
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17996215
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/996215 | ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJECTING METHOD | Mar 29, 2021 | Pending |
Array
(
[id] => 18512895
[patent_doc_number] => 20230229115
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-20
[patent_title] => Physical Package for Optical Lattice Clock
[patent_app_type] => utility
[patent_app_number] => 17/915797
[patent_app_country] => US
[patent_app_date] => 2021-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 23684
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 130
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17915797
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/915797 | Physical Package for Optical Lattice Clock | Mar 29, 2021 | Pending |
Array
(
[id] => 18437386
[patent_doc_number] => 20230184681
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-15
[patent_title] => SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
[patent_app_type] => utility
[patent_app_number] => 17/925131
[patent_app_country] => US
[patent_app_date] => 2021-03-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7842
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 228
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17925131
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/925131 | Sample observation device and sample observation method | Mar 16, 2021 | Issued |
Array
(
[id] => 19130796
[patent_doc_number] => 20240136149
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => ELECTRONIC TWEEZERS
[patent_app_type] => utility
[patent_app_number] => 18/548062
[patent_app_country] => US
[patent_app_date] => 2021-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12546
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -34
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18548062
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/548062 | ELECTRONIC TWEEZERS | Feb 27, 2021 | Pending |
Array
(
[id] => 19130796
[patent_doc_number] => 20240136149
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-25
[patent_title] => ELECTRONIC TWEEZERS
[patent_app_type] => utility
[patent_app_number] => 18/548062
[patent_app_country] => US
[patent_app_date] => 2021-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12546
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -34
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18548062
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/548062 | ELECTRONIC TWEEZERS | Feb 27, 2021 | Pending |
Array
(
[id] => 18265742
[patent_doc_number] => 20230086984
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-23
[patent_title] => BEAM ARRAY GEOMETRY OPTIMIZER FOR MULTI-BEAM INSPECTION SYSTEM
[patent_app_type] => utility
[patent_app_number] => 17/909352
[patent_app_country] => US
[patent_app_date] => 2021-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12131
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17909352
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/909352 | BEAM ARRAY GEOMETRY OPTIMIZER FOR MULTI-BEAM INSPECTION SYSTEM | Feb 23, 2021 | Pending |
Array
(
[id] => 18326430
[patent_doc_number] => 20230124558
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-04-20
[patent_title] => BEAM MANIPULATOR IN CHARGED PARTICLE-BEAM EXPOSURE APPARATUS
[patent_app_type] => utility
[patent_app_number] => 17/909751
[patent_app_country] => US
[patent_app_date] => 2021-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 20550
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17909751
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/909751 | Beam manipulator in charged particle-beam exposure apparatus | Feb 23, 2021 | Issued |