
Trong Q Phan
Examiner (ID: 15831, Phone: (571)272-1794 , Office: P/2825 )
| Most Active Art Unit | 2818 |
| Art Unit(s) | 2827, 2511, 2504, 2824, 2825, 2899, 2818 |
| Total Applications | 3077 |
| Issued Applications | 2717 |
| Pending Applications | 50 |
| Abandoned Applications | 311 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1461194
[patent_doc_number] => 06426911
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-30
[patent_title] => 'Area efficient method for programming electrical fuses'
[patent_app_type] => B1
[patent_app_number] => 09/691953
[patent_app_country] => US
[patent_app_date] => 2000-10-19
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/691953 | Area efficient method for programming electrical fuses | Oct 18, 2000 | Issued |
Array
(
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[patent_kind] => NA
[patent_issue_date] => 2001-06-05
[patent_title] => 'Semiconductor memory equipped with row address decoder having reduced signal propagation delay time'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/689676 | Semiconductor memory equipped with row address decoder having reduced signal propagation delay time | Oct 12, 2000 | Issued |
| 09/686957 | Sensor adjusting circuit | Oct 11, 2000 | Abandoned |
Array
(
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[patent_doc_number] => 06504778
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[patent_issue_date] => 2003-01-07
[patent_title] => 'Semiconductor memory device'
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Array
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[patent_issue_date] => 2002-08-27
[patent_title] => 'Semiconductor nonvolatile memory apparatus and computer system using the same'
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Array
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Array
(
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[patent_issue_date] => 2001-12-04
[patent_title] => 'Variable latency buffer circuits, latency determination circuits and methods of operation thereof'
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Array
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[patent_title] => 'Method of calibrating analog and digital converters'
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Array
(
[id] => 1565169
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[patent_kind] => B1
[patent_issue_date] => 2002-03-26
[patent_title] => 'Storage device'
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Array
(
[id] => 1511403
[patent_doc_number] => 06442085
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[patent_issue_date] => 2002-08-27
[patent_title] => 'Self-Test pattern to detect stuck open faults'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/677681 | Self-Test pattern to detect stuck open faults | Oct 1, 2000 | Issued |
Array
(
[id] => 1427734
[patent_doc_number] => 06519176
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-02-11
[patent_title] => 'Dual threshold SRAM cell for single-ended sensing'
[patent_app_type] => B1
[patent_app_number] => 09/675579
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Array
(
[id] => 4425580
[patent_doc_number] => 06225933
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[patent_title] => 'Digital to analog converter using magnetoresistive memory technology'
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Array
(
[id] => 4313015
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[patent_title] => 'Programmable oscillator using magnetoresistive memory technology'
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Array
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Array
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Array
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Array
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Array
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Array
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