
Tu T Nguyen
Examiner (ID: 9678, Phone: (571)272-2424 , Office: P/2453 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2453, 3992, 2486, 2886, 2877 |
| Total Applications | 1811 |
| Issued Applications | 1578 |
| Pending Applications | 95 |
| Abandoned Applications | 142 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5354370
[patent_doc_number] => 20090185714
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-23
[patent_title] => 'Method and apparatus for analysis of particles in a liquid sample'
[patent_app_type] => utility
[patent_app_number] => 12/314759
[patent_app_country] => US
[patent_app_date] => 2008-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5782
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0185/20090185714.pdf
[firstpage_image] =>[orig_patent_app_number] => 12314759
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/314759 | Method and apparatus for analysis of particles in a liquid sample | Dec 15, 2008 | Issued |
Array
(
[id] => 7716242
[patent_doc_number] => 08094924
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-10
[patent_title] => 'E-beam defect review system'
[patent_app_type] => utility
[patent_app_number] => 12/335458
[patent_app_country] => US
[patent_app_date] => 2008-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3073
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/094/08094924.pdf
[firstpage_image] =>[orig_patent_app_number] => 12335458
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/335458 | E-beam defect review system | Dec 14, 2008 | Issued |
Array
(
[id] => 4569621
[patent_doc_number] => 07839503
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-11-23
[patent_title] => 'Method and system for a solar simulator'
[patent_app_type] => utility
[patent_app_number] => 12/334971
[patent_app_country] => US
[patent_app_date] => 2008-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 3978
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 253
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/839/07839503.pdf
[firstpage_image] =>[orig_patent_app_number] => 12334971
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/334971 | Method and system for a solar simulator | Dec 14, 2008 | Issued |
Array
(
[id] => 83828
[patent_doc_number] => 07746468
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-29
[patent_title] => 'Analysis system'
[patent_app_type] => utility
[patent_app_number] => 12/331755
[patent_app_country] => US
[patent_app_date] => 2008-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 4753
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 232
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/746/07746468.pdf
[firstpage_image] =>[orig_patent_app_number] => 12331755
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/331755 | Analysis system | Dec 9, 2008 | Issued |
Array
(
[id] => 6335459
[patent_doc_number] => 20100328655
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-12-30
[patent_title] => 'Diffraction Based Overlay Metrology Tool and Method'
[patent_app_type] => utility
[patent_app_number] => 12/747795
[patent_app_country] => US
[patent_app_date] => 2009-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 8379
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0328/20100328655.pdf
[firstpage_image] =>[orig_patent_app_number] => 12747795
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/747795 | Diffraction based overlay metrology tool and method | Dec 8, 2008 | Issued |
Array
(
[id] => 6265354
[patent_doc_number] => 20100297759
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-25
[patent_title] => 'SYSTEM AND PROCESS FOR SORTING BIOLOGICAL PARTICLES IN LIQUID FLOW'
[patent_app_type] => utility
[patent_app_number] => 12/735044
[patent_app_country] => US
[patent_app_date] => 2008-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 8891
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0297/20100297759.pdf
[firstpage_image] =>[orig_patent_app_number] => 12735044
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/735044 | System and process for sorting biological particles in liquid flow | Dec 8, 2008 | Issued |
Array
(
[id] => 8877054
[patent_doc_number] => 08472022
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-06-25
[patent_title] => 'Spectroscopic detection system and method'
[patent_app_type] => utility
[patent_app_number] => 12/746398
[patent_app_country] => US
[patent_app_date] => 2008-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 23
[patent_no_of_words] => 16002
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12746398
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/746398 | Spectroscopic detection system and method | Dec 4, 2008 | Issued |
Array
(
[id] => 5562555
[patent_doc_number] => 20090135407
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-28
[patent_title] => 'Microchip'
[patent_app_type] => utility
[patent_app_number] => 12/276685
[patent_app_country] => US
[patent_app_date] => 2008-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4696
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0135/20090135407.pdf
[firstpage_image] =>[orig_patent_app_number] => 12276685
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/276685 | Microchip | Nov 23, 2008 | Issued |
Array
(
[id] => 8556475
[patent_doc_number] => 08330953
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-11
[patent_title] => 'Detection method and detection apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/739358
[patent_app_country] => US
[patent_app_date] => 2008-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 8126
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12739358
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/739358 | Detection method and detection apparatus | Nov 23, 2008 | Issued |
Array
(
[id] => 8353253
[patent_doc_number] => 08248593
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-08-21
[patent_title] => 'Interference measuring device'
[patent_app_type] => utility
[patent_app_number] => 12/742802
[patent_app_country] => US
[patent_app_date] => 2008-11-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 6580
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 437
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12742802
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/742802 | Interference measuring device | Nov 10, 2008 | Issued |
Array
(
[id] => 8750565
[patent_doc_number] => 08416401
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-04-09
[patent_title] => 'Local dosimeter for measuring the ambient equivalent dose of photon radiation, and reading method'
[patent_app_type] => utility
[patent_app_number] => 12/741990
[patent_app_country] => US
[patent_app_date] => 2008-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 11
[patent_no_of_words] => 7634
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 333
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12741990
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/741990 | Local dosimeter for measuring the ambient equivalent dose of photon radiation, and reading method | Nov 6, 2008 | Issued |
Array
(
[id] => 6308638
[patent_doc_number] => 20100110412
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-05-06
[patent_title] => 'SYSTEMS AND METHODS FOR LOCALIZATION AND MAPPING USING LANDMARKS DETECTED BY A MEASUREMENT DEVICE'
[patent_app_type] => utility
[patent_app_number] => 12/262552
[patent_app_country] => US
[patent_app_date] => 2008-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5024
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0110/20100110412.pdf
[firstpage_image] =>[orig_patent_app_number] => 12262552
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/262552 | SYSTEMS AND METHODS FOR LOCALIZATION AND MAPPING USING LANDMARKS DETECTED BY A MEASUREMENT DEVICE | Oct 30, 2008 | Abandoned |
Array
(
[id] => 8572956
[patent_doc_number] => 08339608
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-25
[patent_title] => 'Method for detecting redispersion of beads'
[patent_app_type] => utility
[patent_app_number] => 12/740148
[patent_app_country] => US
[patent_app_date] => 2008-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 7
[patent_no_of_words] => 2873
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12740148
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/740148 | Method for detecting redispersion of beads | Oct 29, 2008 | Issued |
Array
(
[id] => 6492997
[patent_doc_number] => 20100259754
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-10-14
[patent_title] => 'METHOD OF OPTIMISING THE SENSITIVITY OF A SURFACE PLASMON ELLIPSOMETRY APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/740095
[patent_app_country] => US
[patent_app_date] => 2008-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6520
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0259/20100259754.pdf
[firstpage_image] =>[orig_patent_app_number] => 12740095
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/740095 | Method of optimising the sensitivity of a surface plasmon ellipsometry apparatus | Oct 26, 2008 | Issued |
Array
(
[id] => 6585974
[patent_doc_number] => 20100097600
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-22
[patent_title] => 'Fiber Optic Optical Subassembly Configuration'
[patent_app_type] => utility
[patent_app_number] => 12/255227
[patent_app_country] => US
[patent_app_date] => 2008-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1653
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20100097600.pdf
[firstpage_image] =>[orig_patent_app_number] => 12255227
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/255227 | Fiber optic optical subassembly configuration | Oct 20, 2008 | Issued |
Array
(
[id] => 5321241
[patent_doc_number] => 20090059231
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-05
[patent_title] => 'Surface inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/289077
[patent_app_country] => US
[patent_app_date] => 2008-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 8737
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0059/20090059231.pdf
[firstpage_image] =>[orig_patent_app_number] => 12289077
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/289077 | Surface inspection apparatus | Oct 19, 2008 | Issued |
Array
(
[id] => 5560284
[patent_doc_number] => 20090271861
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-29
[patent_title] => 'Data processing apparatus and access control method therefor'
[patent_app_type] => utility
[patent_app_number] => 12/285078
[patent_app_country] => US
[patent_app_date] => 2008-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 8302
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0271/20090271861.pdf
[firstpage_image] =>[orig_patent_app_number] => 12285078
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/285078 | Data processing apparatus and access control method therefor | Sep 28, 2008 | Abandoned |
Array
(
[id] => 4464440
[patent_doc_number] => 07880868
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-02-01
[patent_title] => 'Optical time domain reflectometer'
[patent_app_type] => utility
[patent_app_number] => 12/239324
[patent_app_country] => US
[patent_app_date] => 2008-09-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6150
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/880/07880868.pdf
[firstpage_image] =>[orig_patent_app_number] => 12239324
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/239324 | Optical time domain reflectometer | Sep 25, 2008 | Issued |
Array
(
[id] => 5328961
[patent_doc_number] => 20090109438
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-04-30
[patent_title] => 'SPECTROSCOPIC ELLIPSOMETER AND ELLIPSOMETRY'
[patent_app_type] => utility
[patent_app_number] => 12/236178
[patent_app_country] => US
[patent_app_date] => 2008-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 7436
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0109/20090109438.pdf
[firstpage_image] =>[orig_patent_app_number] => 12236178
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/236178 | Spectroscopic ellipsometer and ellipsometry | Sep 22, 2008 | Issued |
Array
(
[id] => 7744418
[patent_doc_number] => 08107716
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-01-31
[patent_title] => 'Defect detecting apparatus and method'
[patent_app_type] => utility
[patent_app_number] => 12/234667
[patent_app_country] => US
[patent_app_date] => 2008-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 14
[patent_no_of_words] => 5622
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/107/08107716.pdf
[firstpage_image] =>[orig_patent_app_number] => 12234667
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/234667 | Defect detecting apparatus and method | Sep 20, 2008 | Issued |