Search

Tung X. Nguyen

Examiner (ID: 13649, Phone: (571)272-1967 , Office: P/2868 )

Most Active Art Unit
2858
Art Unit(s)
2868, 2829, 2858
Total Applications
1825
Issued Applications
1584
Pending Applications
102
Abandoned Applications
152

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19941546 [patent_doc_number] => 12313672 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2025-05-27 [patent_title] => System and method of testing for RF-induced electromigration in semiconductor integrated circuits [patent_app_type] => utility [patent_app_number] => 18/975398 [patent_app_country] => US [patent_app_date] => 2024-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 28 [patent_no_of_words] => 6995 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18975398 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/975398
System and method of testing for RF-induced electromigration in semiconductor integrated circuits Dec 9, 2024 Issued
Array ( [id] => 20166185 [patent_doc_number] => 20250258232 [patent_country] => US [patent_kind] => A9 [patent_issue_date] => 2025-08-14 [patent_title] => PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE [patent_app_type] => utility [patent_app_number] => 18/968485 [patent_app_country] => US [patent_app_date] => 2024-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -1 [patent_words_short_claim] => 399 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18968485 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/968485
PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE Dec 3, 2024 Pending
Array ( [id] => 20166185 [patent_doc_number] => 20250258232 [patent_country] => US [patent_kind] => A9 [patent_issue_date] => 2025-08-14 [patent_title] => PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE [patent_app_type] => utility [patent_app_number] => 18/968485 [patent_app_country] => US [patent_app_date] => 2024-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -1 [patent_words_short_claim] => 399 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18968485 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/968485
PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE Dec 3, 2024 Pending
Array ( [id] => 20034373 [patent_doc_number] => 20250172595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-29 [patent_title] => METHOD AND INSULATION MONITORING ARRANGEMENT FOR A FUNCTIONALLY GROUNDED ELECTRIC INSTALLATION OPERATED USING A SUPPLY DIRECT VOLTAGE [patent_app_type] => utility [patent_app_number] => 18/959086 [patent_app_country] => US [patent_app_date] => 2024-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18959086 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/959086
Method and insulation monitoring arrangement for a functionally grounded electric installation operated using a supply direct voltage Nov 24, 2024 Issued
Array ( [id] => 20658680 [patent_doc_number] => 20260110721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-04-23 [patent_title] => Quantum Spectrum Sensing Networks [patent_app_type] => utility [patent_app_number] => 18/919962 [patent_app_country] => US [patent_app_date] => 2024-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13281 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18919962 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/919962
Quantum Spectrum Sensing Networks Oct 17, 2024 Pending
Array ( [id] => 20151586 [patent_doc_number] => 20250251424 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-08-07 [patent_title] => WAFER TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/908303 [patent_app_country] => US [patent_app_date] => 2024-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18908303 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/908303
WAFER TESTING APPARATUS Oct 6, 2024 Pending
Array ( [id] => 20615969 [patent_doc_number] => 20260086060 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-26 [patent_title] => SYSTEM AND METHOD FOR IN-LINE MONITORING OF A QUALITY CHARACTERISTIC OF A SLURRY [patent_app_type] => utility [patent_app_number] => 18/897320 [patent_app_country] => US [patent_app_date] => 2024-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2276 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18897320 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/897320
SYSTEM AND METHOD FOR IN-LINE MONITORING OF A QUALITY CHARACTERISTIC OF A SLURRY Sep 25, 2024 Pending
Array ( [id] => 19877712 [patent_doc_number] => 20250109969 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-03 [patent_title] => SCANNING ELEMENT FOR AN INDUCTIVE POSITION MEASURING DEVICE [patent_app_type] => utility [patent_app_number] => 18/892988 [patent_app_country] => US [patent_app_date] => 2024-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5475 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18892988 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/892988
SCANNING ELEMENT FOR AN INDUCTIVE POSITION MEASURING DEVICE Sep 22, 2024 Issued
Array ( [id] => 20616049 [patent_doc_number] => 20260086140 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-26 [patent_title] => TEST AND/OR MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 18/893195 [patent_app_country] => US [patent_app_date] => 2024-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3351 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 383 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18893195 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/893195
TEST AND/OR MEASUREMENT SYSTEM Sep 22, 2024 Pending
Array ( [id] => 20616034 [patent_doc_number] => 20260086125 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-26 [patent_title] => SPLIT-TYPE MEASUREMENT DEVICE [patent_app_type] => utility [patent_app_number] => 18/893497 [patent_app_country] => US [patent_app_date] => 2024-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5877 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18893497 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/893497
SPLIT-TYPE MEASUREMENT DEVICE Sep 22, 2024 Pending
Array ( [id] => 20086508 [patent_doc_number] => 20250216444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING APPARATUS HAVING THE SAME [patent_app_type] => utility [patent_app_number] => 18/882149 [patent_app_country] => US [patent_app_date] => 2024-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18882149 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/882149
ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING APPARATUS HAVING THE SAME Sep 10, 2024 Pending
Array ( [id] => 19877903 [patent_doc_number] => 20250110160 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-03 [patent_title] => SENSOR CIRCUIT HAVING A COMPENSATING RESISTOR FOR COMPENSATING A TEMPERATURE COEFFICIENT OF A BRIDGE CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/882094 [patent_app_country] => US [patent_app_date] => 2024-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7540 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18882094 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/882094
SENSOR CIRCUIT HAVING A COMPENSATING RESISTOR FOR COMPENSATING A TEMPERATURE COEFFICIENT OF A BRIDGE CIRCUIT Sep 10, 2024 Pending
Array ( [id] => 19662690 [patent_doc_number] => 20240429755 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-26 [patent_title] => SENSOR ARRANGEMENT FOR A FOREIGN OBJECT DETECTION DEVICE [patent_app_type] => utility [patent_app_number] => 18/829318 [patent_app_country] => US [patent_app_date] => 2024-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14836 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18829318 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/829318
SENSOR ARRANGEMENT FOR A FOREIGN OBJECT DETECTION DEVICE Sep 9, 2024 Pending
Array ( [id] => 20042549 [patent_doc_number] => 20250180771 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-05 [patent_title] => MOISTURE DETECTION CIRCUITS AND METHODS FOR SERIAL BUS CONNECTORS [patent_app_type] => utility [patent_app_number] => 18/827450 [patent_app_country] => US [patent_app_date] => 2024-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18827450 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/827450
MOISTURE DETECTION CIRCUITS AND METHODS FOR SERIAL BUS CONNECTORS Sep 5, 2024 Pending
Array ( [id] => 19632495 [patent_doc_number] => 20240410944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => METHOD AND ARRANGEMENT FOR TESTING THE FUNCTIONALITY OF A SEMICONDUCTOR SWITCH [patent_app_type] => utility [patent_app_number] => 18/812705 [patent_app_country] => US [patent_app_date] => 2024-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2554 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18812705 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/812705
METHOD AND ARRANGEMENT FOR TESTING THE FUNCTIONALITY OF A SEMICONDUCTOR SWITCH Aug 21, 2024 Pending
Array ( [id] => 19801864 [patent_doc_number] => 20250067789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-27 [patent_title] => Method and Apparatus for Estimating Cyclic Thermal Stress [patent_app_type] => utility [patent_app_number] => 18/808733 [patent_app_country] => US [patent_app_date] => 2024-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7647 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18808733 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/808733
Method and Apparatus for Estimating Cyclic Thermal Stress Aug 18, 2024 Pending
Array ( [id] => 19863773 [patent_doc_number] => 20250102559 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-27 [patent_title] => CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURING THE SAME [patent_app_type] => utility [patent_app_number] => 18/806672 [patent_app_country] => US [patent_app_date] => 2024-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6121 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18806672 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/806672
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURING THE SAME Aug 14, 2024 Pending
Array ( [id] => 20519744 [patent_doc_number] => 20260043850 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-12 [patent_title] => GENERATOR CONTROL RELAY CONTINUOUS BUILT-IN TEST CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/797092 [patent_app_country] => US [patent_app_date] => 2024-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18797092 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/797092
GENERATOR CONTROL RELAY CONTINUOUS BUILT-IN TEST CIRCUIT Aug 6, 2024 Pending
Array ( [id] => 19801872 [patent_doc_number] => 20250067797 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-27 [patent_title] => THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS [patent_app_type] => utility [patent_app_number] => 18/797339 [patent_app_country] => US [patent_app_date] => 2024-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14443 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18797339 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/797339
THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS Aug 6, 2024 Pending
Array ( [id] => 19600218 [patent_doc_number] => 20240391098 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => Monitoring a Resolver [patent_app_type] => utility [patent_app_number] => 18/796971 [patent_app_country] => US [patent_app_date] => 2024-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5456 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18796971 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/796971
Monitoring a Resolver Aug 6, 2024 Pending
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