Tung X. Nguyen

Array ( [id] => 18173563 [patent_doc_number] => 11573266 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-07 [patent_title] => Electronic device temperature test on strip film frames [patent_app_type] => utility [patent_app_number] => 17/029988 [patent_app_country] => US [patent_app_date] => 2020-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 6589 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17029988 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17698321 [patent_doc_number] => 11372042 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-06-28 [patent_title] => Semiconductor device and burn-in test method thereof [patent_app_type] => utility [patent_app_number] => 17/027999 [patent_app_country] => US [patent_app_date] => 2020-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 10661 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17027999 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17714626 [patent_doc_number] => 11378615 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-07-05 [patent_title] => Thermal test head for an integrated circuit device [patent_app_type] => utility [patent_app_number] => 17/023014 [patent_app_country] => US [patent_app_date] => 2020-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 8071 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17023014 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17475109 [patent_doc_number] => 20220082613 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-17 [patent_title] => ELECTRONIC COMPONENT PRESSING APPARATUS AND ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/018456 [patent_app_country] => US [patent_app_date] => 2020-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12747 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17018456 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17529893 [patent_doc_number] => 11302591 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-04-12 [patent_title] => Scan testable through silicon VIAs [patent_app_type] => utility [patent_app_number] => 17/018435 [patent_app_country] => US [patent_app_date] => 2020-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 38 [patent_no_of_words] => 8626 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17018435 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19794461 [patent_doc_number] => 12235404 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-02-25 [patent_title] => Measurement method and apparatus [patent_app_type] => utility [patent_app_number] => 17/642181 [patent_app_country] => US [patent_app_date] => 2020-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 37 [patent_no_of_words] => 21412 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 209 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17642181 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16526663 [patent_doc_number] => 20200400743 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-24 [patent_title] => WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER [patent_app_type] => utility [patent_app_number] => 17/007203 [patent_app_country] => US [patent_app_date] => 2020-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4945 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17007203 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18855103 [patent_doc_number] => 11852677 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Test system [patent_app_type] => utility [patent_app_number] => 17/753222 [patent_app_country] => US [patent_app_date] => 2020-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 4596 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17753222 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18059442 [patent_doc_number] => 20220390528 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => MAGNETIC DETECTION SYSTEM, MAGNETIC SIGNAL WAVEFORM PATTERN CLASSIFICATION METHOD, AND WAVEFORM PATTERN DISTRIBUTION GENERATION METHOD FOR MAGNETIC DETECTION SYSTEM [patent_app_type] => utility [patent_app_number] => 17/642861 [patent_app_country] => US [patent_app_date] => 2020-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14568 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17642861 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16674680 [patent_doc_number] => 20210063443 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-03-04 [patent_title] => PROBER AND PROBE CARD CLEANING METHOD [patent_app_type] => utility [patent_app_number] => 17/001998 [patent_app_country] => US [patent_app_date] => 2020-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5726 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17001998 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19397991 [patent_doc_number] => 12072347 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-27 [patent_title] => Vehicle rotational speed sensor and method for producing same [patent_app_type] => utility [patent_app_number] => 17/640744 [patent_app_country] => US [patent_app_date] => 2020-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2474 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17640744 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17282549 [patent_doc_number] => 11199575 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-14 [patent_title] => Prober and probe card precooling method [patent_app_type] => utility [patent_app_number] => 16/990660 [patent_app_country] => US [patent_app_date] => 2020-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 6032 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16990660 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19397996 [patent_doc_number] => 12072352 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-27 [patent_title] => Inspection jig and inspection device [patent_app_type] => utility [patent_app_number] => 17/636901 [patent_app_country] => US [patent_app_date] => 2020-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9323 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17636901 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16615011 [patent_doc_number] => 20210033664 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-04 [patent_title] => SIGNAL TRANSMISSION SYSTEM [patent_app_type] => utility [patent_app_number] => 16/944264 [patent_app_country] => US [patent_app_date] => 2020-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4875 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16944264 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16440812 [patent_doc_number] => 20200358139 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => INSULATION DETECTION CIRCUIT AND METHOD, AND BATTERY MANAGEMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 16/940252 [patent_app_country] => US [patent_app_date] => 2020-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6233 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16940252 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16423151 [patent_doc_number] => 20200348349 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-05 [patent_title] => APPARATUS AND METHODS FOR TESTING DEVICES [patent_app_type] => utility [patent_app_number] => 16/931912 [patent_app_country] => US [patent_app_date] => 2020-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3548 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16931912 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16757822 [patent_doc_number] => 10976364 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-04-13 [patent_title] => Test head and wafer inspection apparatus [patent_app_type] => utility [patent_app_number] => 16/930751 [patent_app_country] => US [patent_app_date] => 2020-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 4920 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16930751 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 16615012 [patent_doc_number] => 20210033665 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-04 [patent_title] => MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY [patent_app_type] => utility [patent_app_number] => 16/924321 [patent_app_country] => US [patent_app_date] => 2020-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17055 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16924321 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18037593 [patent_doc_number] => 20220381809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => RING-SHAPED POWER SUPPLY SYSTEM [patent_app_type] => utility [patent_app_number] => 17/619587 [patent_app_country] => US [patent_app_date] => 2020-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6540 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17619587 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17171781 [patent_doc_number] => 20210325451 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-21 [patent_title] => WAFER PROBER TO FACILITATE TESTING OF A WAFER USING NANOSECOND PULSES [patent_app_type] => utility [patent_app_number] => 16/917124 [patent_app_country] => US [patent_app_date] => 2020-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5630 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16917124 [rel_patent_id] =>[rel_patent_doc_number] =>)