Search

Tung X. Nguyen

Examiner (ID: 14310, Phone: (571)272-1967 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2868, 2829
Total Applications
1778
Issued Applications
1568
Pending Applications
80
Abandoned Applications
151

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 16542421 [patent_doc_number] => 20200408835 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => PROBER AND METHOD OF PREHEATING PROBE CARD [patent_app_type] => utility [patent_app_number] => 16/910439 [patent_app_country] => US [patent_app_date] => 2020-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5103 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16910439 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/910439
Prober and method of preheating probe card Jun 23, 2020 Issued
Array ( [id] => 17324657 [patent_doc_number] => 11215664 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-01-04 [patent_title] => Non-invasive on-chip power measurement technique [patent_app_type] => utility [patent_app_number] => 16/906715 [patent_app_country] => US [patent_app_date] => 2020-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 11917 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16906715 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/906715
Non-invasive on-chip power measurement technique Jun 18, 2020 Issued
Array ( [id] => 16757820 [patent_doc_number] => 10976362 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-04-13 [patent_title] => Electronics tester with power saving state [patent_app_type] => utility [patent_app_number] => 16/899246 [patent_app_country] => US [patent_app_date] => 2020-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 15475 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16899246 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/899246
Electronics tester with power saving state Jun 10, 2020 Issued
Array ( [id] => 17268534 [patent_doc_number] => 11193954 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-07 [patent_title] => Probe card and test apparatus having the probe card [patent_app_type] => utility [patent_app_number] => 16/898112 [patent_app_country] => US [patent_app_date] => 2020-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 3389 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16898112 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/898112
Probe card and test apparatus having the probe card Jun 9, 2020 Issued
Array ( [id] => 16848227 [patent_doc_number] => 20210148972 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-20 [patent_title] => WAFTER, WAFER TESTING SYSTEM, AND METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 16/896280 [patent_app_country] => US [patent_app_date] => 2020-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5290 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16896280 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/896280
Wafter, wafer testing system, and method thereof Jun 8, 2020 Issued
Array ( [id] => 16534516 [patent_doc_number] => 10877109 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-12-29 [patent_title] => Magnetic field detection device [patent_app_type] => utility [patent_app_number] => 16/890242 [patent_app_country] => US [patent_app_date] => 2020-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 6801 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16890242 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/890242
Magnetic field detection device Jun 1, 2020 Issued
Array ( [id] => 16653787 [patent_doc_number] => 10930981 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-23 [patent_title] => Semiconductor device and battery monitoring system [patent_app_type] => utility [patent_app_number] => 16/890199 [patent_app_country] => US [patent_app_date] => 2020-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 7997 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16890199 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/890199
Semiconductor device and battery monitoring system Jun 1, 2020 Issued
Array ( [id] => 19028253 [patent_doc_number] => 11927605 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-12 [patent_title] => Interconnect system with high current and low leakage capability [patent_app_type] => utility [patent_app_number] => 16/886229 [patent_app_country] => US [patent_app_date] => 2020-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4483 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16886229 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/886229
Interconnect system with high current and low leakage capability May 27, 2020 Issued
Array ( [id] => 17636098 [patent_doc_number] => 11346818 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-31 [patent_title] => Method, device and system for non-destructive detection of defects in a semiconductor die [patent_app_type] => utility [patent_app_number] => 16/881025 [patent_app_country] => US [patent_app_date] => 2020-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 5998 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16881025 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/881025
Method, device and system for non-destructive detection of defects in a semiconductor die May 21, 2020 Issued
Array ( [id] => 18560896 [patent_doc_number] => 11726137 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-15 [patent_title] => Thermal conditioning of electronic devices under test based on extensible elements [patent_app_type] => utility [patent_app_number] => 17/611842 [patent_app_country] => US [patent_app_date] => 2020-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7461 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17611842 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/611842
Thermal conditioning of electronic devices under test based on extensible elements May 14, 2020 Issued
Array ( [id] => 18154153 [patent_doc_number] => 11567128 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-01-31 [patent_title] => Measurement of internal wire delay [patent_app_type] => utility [patent_app_number] => 16/874562 [patent_app_country] => US [patent_app_date] => 2020-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 7295 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16874562 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/874562
Measurement of internal wire delay May 13, 2020 Issued
Array ( [id] => 17736050 [patent_doc_number] => 20220221509 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => TEMPERATURE ADJUSTMENT METHOD FOR MOUNTING BASE, INSPECTION DEVICE, AND MOUNTING BASE [patent_app_type] => utility [patent_app_number] => 17/611879 [patent_app_country] => US [patent_app_date] => 2020-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7987 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17611879 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/611879
Temperature adjustment method for mounting base, inspection device, and mounting base May 7, 2020 Issued
Array ( [id] => 17998909 [patent_doc_number] => 11500011 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-15 [patent_title] => Printed circuit board assembly for aircraft engine, and method monitoring same [patent_app_type] => utility [patent_app_number] => 16/862685 [patent_app_country] => US [patent_app_date] => 2020-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 5398 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16862685 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/862685
Printed circuit board assembly for aircraft engine, and method monitoring same Apr 29, 2020 Issued
Array ( [id] => 16469621 [patent_doc_number] => 20200371158 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-26 [patent_title] => ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 16/860515 [patent_app_country] => US [patent_app_date] => 2020-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6813 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16860515 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/860515
Electronic component handling apparatus and electronic component testing apparatus Apr 27, 2020 Issued
Array ( [id] => 18949140 [patent_doc_number] => 11892429 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-06 [patent_title] => Detector for detecting analytes in gas phase comprising porous dielectric or semiconducting sorbent and corresponding detection method [patent_app_type] => utility [patent_app_number] => 17/608667 [patent_app_country] => US [patent_app_date] => 2020-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 30 [patent_no_of_words] => 21172 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17608667 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/608667
Detector for detecting analytes in gas phase comprising porous dielectric or semiconducting sorbent and corresponding detection method Apr 21, 2020 Issued
Array ( [id] => 16811009 [patent_doc_number] => 20210133564 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-06 [patent_title] => SPACE TIME ELECTRON-HOLE CHARGE TRANSPORT NETWORK FOR SOLID-STATE MATERIAL STUDIES [patent_app_type] => utility [patent_app_number] => 16/850231 [patent_app_country] => US [patent_app_date] => 2020-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5411 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16850231 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/850231
Space time electron-hole charge transport network for solid-state material studies Apr 15, 2020 Issued
Array ( [id] => 16208059 [patent_doc_number] => 20200241049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-07-30 [patent_title] => PLANAR DIFFERENTIAL CURRENT PICKUP FOR WIRELESS POWER TRANSMISSION [patent_app_type] => utility [patent_app_number] => 16/847576 [patent_app_country] => US [patent_app_date] => 2020-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5569 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16847576 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/847576
Planar differential current pickup for wireless power transmission Apr 12, 2020 Issued
Array ( [id] => 17689432 [patent_doc_number] => 20220196725 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-06-23 [patent_title] => Electronic Component and System with Integrated Self-Test Functionality [patent_app_type] => utility [patent_app_number] => 17/603874 [patent_app_country] => US [patent_app_date] => 2020-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11811 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17603874 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/603874
Electronic component and system with integrated self-test functionality Apr 8, 2020 Issued
Array ( [id] => 16542420 [patent_doc_number] => 20200408834 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => APPARATUS AND METHOD FOR EARLY LIFETIME FAILURE DETECTION SYSTEM [patent_app_type] => utility [patent_app_number] => 16/844895 [patent_app_country] => US [patent_app_date] => 2020-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9038 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16844895 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/844895
Apparatus and method for early lifetime failure detection system Apr 8, 2020 Issued
Array ( [id] => 18749502 [patent_doc_number] => 11808807 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-07 [patent_title] => Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit device [patent_app_type] => utility [patent_app_number] => 17/594431 [patent_app_country] => US [patent_app_date] => 2020-04-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 3428 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17594431 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/594431
Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit device Apr 2, 2020 Issued
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