Search

Tung X. Nguyen

Examiner (ID: 14310, Phone: (571)272-1967 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2868, 2829
Total Applications
1778
Issued Applications
1568
Pending Applications
80
Abandoned Applications
151

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 15742451 [patent_doc_number] => 20200110114 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-04-09 [patent_title] => TEST POINT VOLTAGE SENSOR FOR HIGH VOLTAGE SEPARABLE CONNECTORS [patent_app_type] => utility [patent_app_number] => 16/585803 [patent_app_country] => US [patent_app_date] => 2019-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4761 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16585803 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/585803
Test point voltage sensor for high voltage separable connectors Sep 26, 2019 Issued
Array ( [id] => 16942212 [patent_doc_number] => 11054442 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-07-06 [patent_title] => Ball grid array current meter with a current sense mesh [patent_app_type] => utility [patent_app_number] => 16/583494 [patent_app_country] => US [patent_app_date] => 2019-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 8424 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16583494 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/583494
Ball grid array current meter with a current sense mesh Sep 25, 2019 Issued
Array ( [id] => 16729030 [patent_doc_number] => 20210096177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-01 [patent_title] => BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE LOOP [patent_app_type] => utility [patent_app_number] => 16/583521 [patent_app_country] => US [patent_app_date] => 2019-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8049 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16583521 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/583521
Ball grid array current meter with a current sense loop Sep 25, 2019 Issued
Array ( [id] => 19327031 [patent_doc_number] => 12044708 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-23 [patent_title] => Differential signal current sensor [patent_app_type] => utility [patent_app_number] => 17/762231 [patent_app_country] => US [patent_app_date] => 2019-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2832 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17762231 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/762231
Differential signal current sensor Sep 19, 2019 Issued
Array ( [id] => 16721439 [patent_doc_number] => 20210088586 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-03-25 [patent_title] => PLURALITY OF EDGE THROUGH-SILICON VIAS AND RELATED SYSTEMS, METHODS, AND DEVICES [patent_app_type] => utility [patent_app_number] => 16/577243 [patent_app_country] => US [patent_app_date] => 2019-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7677 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16577243 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/577243
Plurality of edge through-silicon vias and related systems, methods, and devices Sep 19, 2019 Issued
Array ( [id] => 16208050 [patent_doc_number] => 20200241040 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-07-30 [patent_title] => ELECTRONIC COMPONENT HANDLING DEVICE AND ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 16/575470 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8504 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575470 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/575470
Electronic component handling device and electronic component testing apparatus Sep 18, 2019 Issued
Array ( [id] => 16400198 [patent_doc_number] => 20200341056 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-29 [patent_title] => TEST HANDLER HAVING MULTIPLE TESTING SECTORS [patent_app_type] => utility [patent_app_number] => 16/562628 [patent_app_country] => US [patent_app_date] => 2019-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3232 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16562628 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/562628
Test handler having multiple testing sectors Sep 5, 2019 Issued
Array ( [id] => 16674716 [patent_doc_number] => 20210063480 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-03-04 [patent_title] => OVER-THE-AIR MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 16/555922 [patent_app_country] => US [patent_app_date] => 2019-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7305 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16555922 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/555922
Over-the-air measurement system Aug 28, 2019 Issued
Array ( [id] => 15270253 [patent_doc_number] => 20190383861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-19 [patent_title] => DEVICE FOR MEASURING THE CURRENT FLOWING IN AN INDUCTIVE LOAD [patent_app_type] => utility [patent_app_number] => 16/554248 [patent_app_country] => US [patent_app_date] => 2019-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4461 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16554248 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/554248
Device for measuring the current flowing in an inductive load Aug 27, 2019 Issued
Array ( [id] => 17698322 [patent_doc_number] => 11372043 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-06-28 [patent_title] => Heat spreaders for use in semiconductor device testing, such as burn-in testing [patent_app_type] => utility [patent_app_number] => 16/546648 [patent_app_country] => US [patent_app_date] => 2019-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 8031 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16546648 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/546648
Heat spreaders for use in semiconductor device testing, such as burn-in testing Aug 20, 2019 Issued
Array ( [id] => 17120568 [patent_doc_number] => 11131695 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-28 [patent_title] => Measuring electrical energy consumption [patent_app_type] => utility [patent_app_number] => 16/541948 [patent_app_country] => US [patent_app_date] => 2019-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 8248 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16541948 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/541948
Measuring electrical energy consumption Aug 14, 2019 Issued
Array ( [id] => 17135891 [patent_doc_number] => 11137442 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-05 [patent_title] => Stiffener and probe card including the same [patent_app_type] => utility [patent_app_number] => 16/535433 [patent_app_country] => US [patent_app_date] => 2019-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3748 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16535433 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/535433
Stiffener and probe card including the same Aug 7, 2019 Issued
Array ( [id] => 17282536 [patent_doc_number] => 11199562 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-14 [patent_title] => Wafer testing system including a wafer-flattening multi-zone vacuum chuck and method for operating the same [patent_app_type] => utility [patent_app_number] => 16/535505 [patent_app_country] => US [patent_app_date] => 2019-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6694 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16535505 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/535505
Wafer testing system including a wafer-flattening multi-zone vacuum chuck and method for operating the same Aug 7, 2019 Issued
Array ( [id] => 17422464 [patent_doc_number] => 11255911 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-02-22 [patent_title] => Method and device for testing at a specific channel condition [patent_app_type] => utility [patent_app_number] => 16/529379 [patent_app_country] => US [patent_app_date] => 2019-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3610 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16529379 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/529379
Method and device for testing at a specific channel condition Jul 31, 2019 Issued
Array ( [id] => 15296125 [patent_doc_number] => 20190391198 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-26 [patent_title] => DETECTION OF DETERIORATED ELECTRICAL CONNECTIONS IN A METER USING TEMPERATURE SENSING AND TIME-VARIABLE THRESHOLDS [patent_app_type] => utility [patent_app_number] => 16/513177 [patent_app_country] => US [patent_app_date] => 2019-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9677 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16513177 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/513177
Detection of deteriorated electrical connections in a meter using temperature sensing and time variable thresholds Jul 15, 2019 Issued
Array ( [id] => 16957246 [patent_doc_number] => 11061099 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-07-13 [patent_title] => Systems and methods for calibrating a wafer inspection apparatus [patent_app_type] => utility [patent_app_number] => 16/506458 [patent_app_country] => US [patent_app_date] => 2019-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5491 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16506458 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/506458
Systems and methods for calibrating a wafer inspection apparatus Jul 8, 2019 Issued
Array ( [id] => 16909851 [patent_doc_number] => 11041884 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-06-22 [patent_title] => Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing [patent_app_type] => utility [patent_app_number] => 16/450921 [patent_app_country] => US [patent_app_date] => 2019-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 9947 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16450921 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/450921
Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing Jun 23, 2019 Issued
Array ( [id] => 14965615 [patent_doc_number] => 20190310286 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-10-10 [patent_title] => TEST DEVICE AND METHOD [patent_app_type] => utility [patent_app_number] => 16/448619 [patent_app_country] => US [patent_app_date] => 2019-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4296 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16448619 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/448619
Test device and method Jun 20, 2019 Issued
Array ( [id] => 19028170 [patent_doc_number] => 11927520 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-12 [patent_title] => Rotating levitated particle imaging [patent_app_type] => utility [patent_app_number] => 17/415130 [patent_app_country] => US [patent_app_date] => 2019-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 10784 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17415130 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/415130
Rotating levitated particle imaging May 29, 2019 Issued
Array ( [id] => 14870905 [patent_doc_number] => 20190285694 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-19 [patent_title] => METHOD FOR ESTIMATING AN OPERATING PROFILE OF AN INTEGRATED CIRCUIT OF A SYSTEM-ON-A-CHIP, AND CORRESPONDING SYSTEM-ON-A-CHIP [patent_app_type] => utility [patent_app_number] => 16/424034 [patent_app_country] => US [patent_app_date] => 2019-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4324 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16424034 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/424034
Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chip May 27, 2019 Issued
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