
Tung X. Nguyen
Examiner (ID: 14310, Phone: (571)272-1967 , Office: P/2868 )
| Most Active Art Unit | 2868 |
| Art Unit(s) | 2858, 2868, 2829 |
| Total Applications | 1778 |
| Issued Applications | 1568 |
| Pending Applications | 80 |
| Abandoned Applications | 151 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 11708038
[patent_doc_number] => 20170176536
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-06-22
[patent_title] => 'SYSTEMS AND METHODS FOR CRACK DETECTION IN DOUBLY-FED INDUCTION GENERATORS'
[patent_app_type] => utility
[patent_app_number] => 14/971464
[patent_app_country] => US
[patent_app_date] => 2015-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 9731
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14971464
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/971464 | Systems and methods for crack detection in doubly-fed induction generators | Dec 15, 2015 | Issued |
Array
(
[id] => 11019342
[patent_doc_number] => 20160216295
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-07-28
[patent_title] => 'CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING'
[patent_app_type] => utility
[patent_app_number] => 14/971727
[patent_app_country] => US
[patent_app_date] => 2015-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 10155
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14971727
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/971727 | Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing | Dec 15, 2015 | Issued |
Array
(
[id] => 10981747
[patent_doc_number] => 20160178692
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-06-23
[patent_title] => 'CONTACT ASSEMBLY IN A TESTING APPARATUS FOR INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 14/971604
[patent_app_country] => US
[patent_app_date] => 2015-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3000
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14971604
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/971604 | Contact assembly in a testing apparatus for integrated circuits | Dec 15, 2015 | Issued |
Array
(
[id] => 11707995
[patent_doc_number] => 20170176494
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-06-22
[patent_title] => 'Test Pin Configuration for Test Device for Testing Devices Under Test'
[patent_app_type] => utility
[patent_app_number] => 14/970868
[patent_app_country] => US
[patent_app_date] => 2015-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 7926
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14970868
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/970868 | Test pin configuration for test device for testing devices under test | Dec 15, 2015 | Issued |
Array
(
[id] => 11549708
[patent_doc_number] => 09618548
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-04-11
[patent_title] => 'Integrated systems for miniature circuit breaker load centers'
[patent_app_type] => utility
[patent_app_number] => 14/969820
[patent_app_country] => US
[patent_app_date] => 2015-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 3988
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 464
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14969820
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/969820 | Integrated systems for miniature circuit breaker load centers | Dec 14, 2015 | Issued |
Array
(
[id] => 10823785
[patent_doc_number] => 20160169950
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-06-16
[patent_title] => 'FREQUENCY SELECTIVE POWER MONITOR'
[patent_app_type] => utility
[patent_app_number] => 14/967616
[patent_app_country] => US
[patent_app_date] => 2015-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4571
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14967616
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/967616 | Frequency selective power monitor | Dec 13, 2015 | Issued |
Array
(
[id] => 11699992
[patent_doc_number] => 09689900
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2017-06-27
[patent_title] => 'Current sensing circuit'
[patent_app_type] => utility
[patent_app_number] => 14/968734
[patent_app_country] => US
[patent_app_date] => 2015-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 17
[patent_no_of_words] => 11667
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 214
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14968734
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/968734 | Current sensing circuit | Dec 13, 2015 | Issued |
Array
(
[id] => 11671591
[patent_doc_number] => 20170160312
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-06-08
[patent_title] => 'MEASURING DEVICE'
[patent_app_type] => utility
[patent_app_number] => 14/967951
[patent_app_country] => US
[patent_app_date] => 2015-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4877
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14967951
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/967951 | Measuring device | Dec 13, 2015 | Issued |
Array
(
[id] => 13145897
[patent_doc_number] => 10090288
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-10-02
[patent_title] => Semiconductor device and semiconductor system
[patent_app_type] => utility
[patent_app_number] => 14/966088
[patent_app_country] => US
[patent_app_date] => 2015-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5243
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14966088
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/966088 | Semiconductor device and semiconductor system | Dec 10, 2015 | Issued |
Array
(
[id] => 11558201
[patent_doc_number] => 20170104448
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-04-13
[patent_title] => 'MEASURING DEVICE FOR PROPERTY OF PHOTOVOLTAIC DEVICE AND MEASURING METHOD USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 14/965893
[patent_app_country] => US
[patent_app_date] => 2015-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3955
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14965893
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/965893 | Measuring device for property of photovoltaic device and measuring method using the same | Dec 9, 2015 | Issued |
Array
(
[id] => 12173116
[patent_doc_number] => 09891252
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-02-13
[patent_title] => 'Thermal management of self-powered power sensors'
[patent_app_type] => utility
[patent_app_number] => 14/965101
[patent_app_country] => US
[patent_app_date] => 2015-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 16
[patent_no_of_words] => 14266
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 324
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14965101
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/965101 | Thermal management of self-powered power sensors | Dec 9, 2015 | Issued |
Array
(
[id] => 13947029
[patent_doc_number] => 10209280
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-02-19
[patent_title] => Circuit breaker
[patent_app_type] => utility
[patent_app_number] => 14/961979
[patent_app_country] => US
[patent_app_date] => 2015-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 4326
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14961979
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/961979 | Circuit breaker | Dec 7, 2015 | Issued |
Array
(
[id] => 11671596
[patent_doc_number] => 20170160317
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-06-08
[patent_title] => 'ON-DIE MEASUREMENT TECHNIQUE FOR I/O DC PARAMETERS VOL AND VOH'
[patent_app_type] => utility
[patent_app_number] => 14/962686
[patent_app_country] => US
[patent_app_date] => 2015-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 15350
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14962686
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/962686 | On-die measurement technique for I/O DC parameters V | Dec 7, 2015 | Issued |
Array
(
[id] => 14487839
[patent_doc_number] => 10330701
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-06-25
[patent_title] => Test probe head for full wafer testing
[patent_app_type] => utility
[patent_app_number] => 14/962331
[patent_app_country] => US
[patent_app_date] => 2015-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 14
[patent_no_of_words] => 3953
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14962331
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/962331 | Test probe head for full wafer testing | Dec 7, 2015 | Issued |
Array
(
[id] => 10815394
[patent_doc_number] => 20160161554
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-06-09
[patent_title] => 'WIRELESS PROBES'
[patent_app_type] => utility
[patent_app_number] => 14/963076
[patent_app_country] => US
[patent_app_date] => 2015-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 3246
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14963076
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/963076 | Wireless probes | Dec 7, 2015 | Issued |
Array
(
[id] => 11613736
[patent_doc_number] => 09651589
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-05-16
[patent_title] => 'Method for correcting electric power loss in an HVDC system'
[patent_app_type] => utility
[patent_app_number] => 14/961565
[patent_app_country] => US
[patent_app_date] => 2015-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 17
[patent_no_of_words] => 12446
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14961565
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/961565 | Method for correcting electric power loss in an HVDC system | Dec 6, 2015 | Issued |
Array
(
[id] => 11012509
[patent_doc_number] => 20160209462
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-07-21
[patent_title] => 'INTEGRATED CIRCUIT HAVING EYE OPENING MONITOR AND\nSERIALIZER/DESERIALIZER DEVICE'
[patent_app_type] => utility
[patent_app_number] => 14/957969
[patent_app_country] => US
[patent_app_date] => 2015-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 7912
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 12
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14957969
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/957969 | Integrated circuit having eye opening monitor and serializer/deserializer device | Dec 2, 2015 | Issued |
Array
(
[id] => 11964896
[patent_doc_number] => 20170269049
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-09-21
[patent_title] => 'PHOTOIONIZATION DETECTOR SYSTEM FOR ORGANICS IN WATER'
[patent_app_type] => utility
[patent_app_number] => 15/532070
[patent_app_country] => US
[patent_app_date] => 2015-11-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4486
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 13
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15532070
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/532070 | PHOTOIONIZATION DETECTOR SYSTEM FOR ORGANICS IN WATER | Nov 26, 2015 | Abandoned |
Array
(
[id] => 11026630
[patent_doc_number] => 20160223586
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2016-08-04
[patent_title] => 'TESTING DEVICE AND ASSEMBLING METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 14/952931
[patent_app_country] => US
[patent_app_date] => 2015-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4868
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14952931
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/952931 | Testing device and assembling method thereof | Nov 25, 2015 | Issued |
Array
(
[id] => 14147919
[patent_doc_number] => 10254331
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-04-09
[patent_title] => Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
[patent_app_type] => utility
[patent_app_number] => 14/950138
[patent_app_country] => US
[patent_app_date] => 2015-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 19
[patent_no_of_words] => 17051
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14950138
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/950138 | Methods and apparatus for testing inaccessible interface circuits in a semiconductor device | Nov 23, 2015 | Issued |