Search

Tung X. Nguyen

Examiner (ID: 13649, Phone: (571)272-1967 , Office: P/2868 )

Most Active Art Unit
2858
Art Unit(s)
2868, 2829, 2858
Total Applications
1825
Issued Applications
1584
Pending Applications
102
Abandoned Applications
152

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20358395 [patent_doc_number] => 12474387 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Method, electronic device and system for iteratively measuring the insulation resistance of an energized electrical apparatus with respect to ground [patent_app_type] => utility [patent_app_number] => 18/542906 [patent_app_country] => US [patent_app_date] => 2023-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 6324 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 574 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18542906 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/542906
Method, electronic device and system for iteratively measuring the insulation resistance of an energized electrical apparatus with respect to ground Dec 17, 2023 Issued
Array ( [id] => 19302015 [patent_doc_number] => 20240230592 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => DETECTOR FOR DETECTING ANALYTES IN GAS PHASE COMPRISING POROUS DIELECTRIC OR SEMICONDUCTING SORBENT AND CORRESPONDING DETECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/538368 [patent_app_country] => US [patent_app_date] => 2023-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21425 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18538368 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/538368
Detector for detecting analytes in gas phase comprising porous dielectric or semiconducting sorbent and corresponding detection method Dec 12, 2023 Issued
Array ( [id] => 19369146 [patent_doc_number] => 12061225 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-13 [patent_title] => Small-sized fast cold and hot shock test devices [patent_app_type] => utility [patent_app_number] => 18/534693 [patent_app_country] => US [patent_app_date] => 2023-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7311 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 340 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18534693 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/534693
Small-sized fast cold and hot shock test devices Dec 9, 2023 Issued
Array ( [id] => 19219195 [patent_doc_number] => 20240183899 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-06 [patent_title] => TESTING OF ELECTRONIC EQUIPMENT [patent_app_type] => utility [patent_app_number] => 18/531429 [patent_app_country] => US [patent_app_date] => 2023-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6777 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18531429 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/531429
TESTING OF ELECTRONIC EQUIPMENT Dec 5, 2023 Pending
Array ( [id] => 19282987 [patent_doc_number] => 20240219463 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-04 [patent_title] => DISPLAY DEVICE, PANEL DEFECT DETECTION CIRCUIT AND PANEL DEFECT DETECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/529919 [patent_app_country] => US [patent_app_date] => 2023-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 22388 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18529919 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/529919
DISPLAY DEVICE, PANEL DEFECT DETECTION CIRCUIT AND PANEL DEFECT DETECTION METHOD Dec 4, 2023 Pending
Array ( [id] => 20316751 [patent_doc_number] => 12455298 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Test system for testing semiconductor devices [patent_app_type] => utility [patent_app_number] => 18/526899 [patent_app_country] => US [patent_app_date] => 2023-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 0 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 473 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18526899 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/526899
Test system for testing semiconductor devices Nov 30, 2023 Issued
Array ( [id] => 20242159 [patent_doc_number] => 12422471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-23 [patent_title] => Multiphase thermal interface component, method of forming the same and electronic device testing apparatus provided with the same [patent_app_type] => utility [patent_app_number] => 18/511638 [patent_app_country] => US [patent_app_date] => 2023-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18511638 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/511638
Multiphase thermal interface component, method of forming the same and electronic device testing apparatus provided with the same Nov 15, 2023 Issued
Array ( [id] => 20316750 [patent_doc_number] => 12455297 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Test socket for and a method of testing electronic components, in particular high-power semiconductor components [patent_app_type] => utility [patent_app_number] => 18/505405 [patent_app_country] => US [patent_app_date] => 2023-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 940 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18505405 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/505405
Test socket for and a method of testing electronic components, in particular high-power semiconductor components Nov 8, 2023 Issued
Array ( [id] => 19557828 [patent_doc_number] => 20240369620 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-07 [patent_title] => WAFER TEST SYSTEM AND METHODS [patent_app_type] => utility [patent_app_number] => 18/505781 [patent_app_country] => US [patent_app_date] => 2023-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10173 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18505781 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/505781
Wafer test system and methods Nov 8, 2023 Issued
Array ( [id] => 20913628 [patent_doc_number] => 12710471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-08-18 [patent_title] => Semiconductor package [patent_app_type] => utility [patent_app_number] => 18/387790 [patent_app_country] => US [patent_app_date] => 2023-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 8696 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18387790 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/387790
SEMICONDUCTOR PACKAGE Nov 6, 2023 Pending
Array ( [id] => 18988220 [patent_doc_number] => 20240060189 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-22 [patent_title] => TEST STATION ASSEMBLIES FOR MONITORING CATHODIC PROTECTION OF STRUCTURES AND RELATED METHODS [patent_app_type] => utility [patent_app_number] => 18/386563 [patent_app_country] => US [patent_app_date] => 2023-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8801 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18386563 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/386563
Test station assemblies for monitoring cathodic protection of structures and related methods Nov 1, 2023 Issued
Array ( [id] => 19189175 [patent_doc_number] => 20240168088 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/498217 [patent_app_country] => US [patent_app_date] => 2023-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4587 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18498217 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/498217
Voltage detection device and voltage protection method Oct 30, 2023 Issued
Array ( [id] => 19143618 [patent_doc_number] => 20240142493 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-02 [patent_title] => SOCKET FOR TESTING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/497401 [patent_app_country] => US [patent_app_date] => 2023-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2719 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18497401 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/497401
SOCKET FOR TESTING SEMICONDUCTOR DEVICE Oct 29, 2023 Pending
Array ( [id] => 19573163 [patent_doc_number] => 20240377455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => System and Method for Automatic Height Adjustment for Chip Testing [patent_app_type] => utility [patent_app_number] => 18/384761 [patent_app_country] => US [patent_app_date] => 2023-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10775 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18384761 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/384761
System and method for automatic height adjustment for chip testing Oct 26, 2023 Issued
Array ( [id] => 20257172 [patent_doc_number] => 12429519 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-30 [patent_title] => Test apparatus for image sensor package [patent_app_type] => utility [patent_app_number] => 18/492008 [patent_app_country] => US [patent_app_date] => 2023-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 1222 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18492008 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/492008
Test apparatus for image sensor package Oct 22, 2023 Issued
Array ( [id] => 19498668 [patent_doc_number] => 20240337686 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => FORCE/MEASURE CURRENT GAIN TRIMMING [patent_app_type] => utility [patent_app_number] => 18/478038 [patent_app_country] => US [patent_app_date] => 2023-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9952 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18478038 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/478038
Force/measure current gain trimming Sep 28, 2023 Issued
Array ( [id] => 19369148 [patent_doc_number] => 12061227 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-08-13 [patent_title] => Integrated heater and temperature measurement [patent_app_type] => utility [patent_app_number] => 18/471192 [patent_app_country] => US [patent_app_date] => 2023-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 8853 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18471192 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/471192
Integrated heater and temperature measurement Sep 19, 2023 Issued
Array ( [id] => 19114097 [patent_doc_number] => 20240125847 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => VOICE COIL LEAF SPRING PROBER [patent_app_type] => utility [patent_app_number] => 18/471270 [patent_app_country] => US [patent_app_date] => 2023-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4195 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18471270 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/471270
Voice coil leaf spring prober Sep 19, 2023 Issued
Array ( [id] => 19189172 [patent_doc_number] => 20240168085 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => SUBSTRATE WITH CRACK DETECTION FUNCTION [patent_app_type] => utility [patent_app_number] => 18/367641 [patent_app_country] => US [patent_app_date] => 2023-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3176 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18367641 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/367641
Substrate with crack detection function Sep 12, 2023 Issued
Array ( [id] => 19235075 [patent_doc_number] => 20240192269 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-13 [patent_title] => TEST SUBSTRATE, TEST APPARATUS, AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT [patent_app_type] => utility [patent_app_number] => 18/463558 [patent_app_country] => US [patent_app_date] => 2023-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10645 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18463558 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/463558
TEST SUBSTRATE, TEST APPARATUS, AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT Sep 7, 2023 Pending
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