
Tung X. Nguyen
Examiner (ID: 13649, Phone: (571)272-1967 , Office: P/2868 )
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2868, 2829, 2858 |
| Total Applications | 1825 |
| Issued Applications | 1584 |
| Pending Applications | 102 |
| Abandoned Applications | 152 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 20358395
[patent_doc_number] => 12474387
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-11-18
[patent_title] => Method, electronic device and system for iteratively measuring the insulation resistance of an energized electrical apparatus with respect to ground
[patent_app_type] => utility
[patent_app_number] => 18/542906
[patent_app_country] => US
[patent_app_date] => 2023-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 6324
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 574
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18542906
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/542906 | Method, electronic device and system for iteratively measuring the insulation resistance of an energized electrical apparatus with respect to ground | Dec 17, 2023 | Issued |
Array
(
[id] => 19302015
[patent_doc_number] => 20240230592
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => DETECTOR FOR DETECTING ANALYTES IN GAS PHASE COMPRISING POROUS DIELECTRIC OR SEMICONDUCTING SORBENT AND CORRESPONDING DETECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/538368
[patent_app_country] => US
[patent_app_date] => 2023-12-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 21425
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18538368
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/538368 | Detector for detecting analytes in gas phase comprising porous dielectric or semiconducting sorbent and corresponding detection method | Dec 12, 2023 | Issued |
Array
(
[id] => 19369146
[patent_doc_number] => 12061225
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-08-13
[patent_title] => Small-sized fast cold and hot shock test devices
[patent_app_type] => utility
[patent_app_number] => 18/534693
[patent_app_country] => US
[patent_app_date] => 2023-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 7311
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 340
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18534693
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/534693 | Small-sized fast cold and hot shock test devices | Dec 9, 2023 | Issued |
Array
(
[id] => 19219195
[patent_doc_number] => 20240183899
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-06
[patent_title] => TESTING OF ELECTRONIC EQUIPMENT
[patent_app_type] => utility
[patent_app_number] => 18/531429
[patent_app_country] => US
[patent_app_date] => 2023-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6777
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18531429
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/531429 | TESTING OF ELECTRONIC EQUIPMENT | Dec 5, 2023 | Pending |
Array
(
[id] => 19282987
[patent_doc_number] => 20240219463
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-04
[patent_title] => DISPLAY DEVICE, PANEL DEFECT DETECTION CIRCUIT AND PANEL DEFECT DETECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/529919
[patent_app_country] => US
[patent_app_date] => 2023-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 22388
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 78
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18529919
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/529919 | DISPLAY DEVICE, PANEL DEFECT DETECTION CIRCUIT AND PANEL DEFECT DETECTION METHOD | Dec 4, 2023 | Pending |
Array
(
[id] => 20316751
[patent_doc_number] => 12455298
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-10-28
[patent_title] => Test system for testing semiconductor devices
[patent_app_type] => utility
[patent_app_number] => 18/526899
[patent_app_country] => US
[patent_app_date] => 2023-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 0
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 473
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18526899
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/526899 | Test system for testing semiconductor devices | Nov 30, 2023 | Issued |
Array
(
[id] => 20242159
[patent_doc_number] => 12422471
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-23
[patent_title] => Multiphase thermal interface component, method of forming the same and electronic device testing apparatus provided with the same
[patent_app_type] => utility
[patent_app_number] => 18/511638
[patent_app_country] => US
[patent_app_date] => 2023-11-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 0
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18511638
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/511638 | Multiphase thermal interface component, method of forming the same and electronic device testing apparatus provided with the same | Nov 15, 2023 | Issued |
Array
(
[id] => 20316750
[patent_doc_number] => 12455297
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-10-28
[patent_title] => Test socket for and a method of testing electronic components, in particular high-power semiconductor components
[patent_app_type] => utility
[patent_app_number] => 18/505405
[patent_app_country] => US
[patent_app_date] => 2023-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 10
[patent_no_of_words] => 940
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18505405
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/505405 | Test socket for and a method of testing electronic components, in particular high-power semiconductor components | Nov 8, 2023 | Issued |
Array
(
[id] => 19557828
[patent_doc_number] => 20240369620
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-07
[patent_title] => WAFER TEST SYSTEM AND METHODS
[patent_app_type] => utility
[patent_app_number] => 18/505781
[patent_app_country] => US
[patent_app_date] => 2023-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10173
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18505781
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/505781 | Wafer test system and methods | Nov 8, 2023 | Issued |
Array
(
[id] => 20913628
[patent_doc_number] => 12710471
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-08-18
[patent_title] => Semiconductor package
[patent_app_type] => utility
[patent_app_number] => 18/387790
[patent_app_country] => US
[patent_app_date] => 2023-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 8696
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18387790
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/387790 | SEMICONDUCTOR PACKAGE | Nov 6, 2023 | Pending |
Array
(
[id] => 18988220
[patent_doc_number] => 20240060189
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-02-22
[patent_title] => TEST STATION ASSEMBLIES FOR MONITORING CATHODIC PROTECTION OF STRUCTURES AND RELATED METHODS
[patent_app_type] => utility
[patent_app_number] => 18/386563
[patent_app_country] => US
[patent_app_date] => 2023-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8801
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 120
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18386563
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/386563 | Test station assemblies for monitoring cathodic protection of structures and related methods | Nov 1, 2023 | Issued |
Array
(
[id] => 19189175
[patent_doc_number] => 20240168088
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-23
[patent_title] => VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/498217
[patent_app_country] => US
[patent_app_date] => 2023-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4587
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18498217
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/498217 | Voltage detection device and voltage protection method | Oct 30, 2023 | Issued |
Array
(
[id] => 19143618
[patent_doc_number] => 20240142493
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-02
[patent_title] => SOCKET FOR TESTING SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/497401
[patent_app_country] => US
[patent_app_date] => 2023-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2719
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18497401
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/497401 | SOCKET FOR TESTING SEMICONDUCTOR DEVICE | Oct 29, 2023 | Pending |
Array
(
[id] => 19573163
[patent_doc_number] => 20240377455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-14
[patent_title] => System and Method for Automatic Height Adjustment for Chip Testing
[patent_app_type] => utility
[patent_app_number] => 18/384761
[patent_app_country] => US
[patent_app_date] => 2023-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10775
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18384761
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/384761 | System and method for automatic height adjustment for chip testing | Oct 26, 2023 | Issued |
Array
(
[id] => 20257172
[patent_doc_number] => 12429519
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-30
[patent_title] => Test apparatus for image sensor package
[patent_app_type] => utility
[patent_app_number] => 18/492008
[patent_app_country] => US
[patent_app_date] => 2023-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 15
[patent_no_of_words] => 1222
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 290
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18492008
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/492008 | Test apparatus for image sensor package | Oct 22, 2023 | Issued |
Array
(
[id] => 19498668
[patent_doc_number] => 20240337686
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-10
[patent_title] => FORCE/MEASURE CURRENT GAIN TRIMMING
[patent_app_type] => utility
[patent_app_number] => 18/478038
[patent_app_country] => US
[patent_app_date] => 2023-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9952
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18478038
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/478038 | Force/measure current gain trimming | Sep 28, 2023 | Issued |
Array
(
[id] => 19369148
[patent_doc_number] => 12061227
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2024-08-13
[patent_title] => Integrated heater and temperature measurement
[patent_app_type] => utility
[patent_app_number] => 18/471192
[patent_app_country] => US
[patent_app_date] => 2023-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 8853
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18471192
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/471192 | Integrated heater and temperature measurement | Sep 19, 2023 | Issued |
Array
(
[id] => 19114097
[patent_doc_number] => 20240125847
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-18
[patent_title] => VOICE COIL LEAF SPRING PROBER
[patent_app_type] => utility
[patent_app_number] => 18/471270
[patent_app_country] => US
[patent_app_date] => 2023-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4195
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18471270
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/471270 | Voice coil leaf spring prober | Sep 19, 2023 | Issued |
Array
(
[id] => 19189172
[patent_doc_number] => 20240168085
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-23
[patent_title] => SUBSTRATE WITH CRACK DETECTION FUNCTION
[patent_app_type] => utility
[patent_app_number] => 18/367641
[patent_app_country] => US
[patent_app_date] => 2023-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3176
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 186
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18367641
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/367641 | Substrate with crack detection function | Sep 12, 2023 | Issued |
Array
(
[id] => 19235075
[patent_doc_number] => 20240192269
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-13
[patent_title] => TEST SUBSTRATE, TEST APPARATUS, AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
[patent_app_type] => utility
[patent_app_number] => 18/463558
[patent_app_country] => US
[patent_app_date] => 2023-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10645
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 63
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18463558
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/463558 | TEST SUBSTRATE, TEST APPARATUS, AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT | Sep 7, 2023 | Pending |