Tung X. Nguyen

Array ( [id] => 18037601 [patent_doc_number] => 20220381817 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => TESTING MODULE AND TESTING METHOD USING THE SAME [patent_app_type] => utility [patent_app_number] => 17/884487 [patent_app_country] => US [patent_app_date] => 2022-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21736 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17884487 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18519311 [patent_doc_number] => 11709200 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-25 [patent_title] => Thermal sensor [patent_app_type] => utility [patent_app_number] => 17/876692 [patent_app_country] => US [patent_app_date] => 2022-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 6130 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17876692 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18342481 [patent_doc_number] => 11639958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-02 [patent_title] => Voltage tracking circuit and method of operating the same [patent_app_type] => utility [patent_app_number] => 17/816064 [patent_app_country] => US [patent_app_date] => 2022-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 22 [patent_no_of_words] => 16072 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17816064 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20415128 [patent_doc_number] => 12498406 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-16 [patent_title] => Method for the self-diagnosis of a circuit for measuring the insulation resistance of a high-voltage system [patent_app_type] => utility [patent_app_number] => 18/292683 [patent_app_country] => US [patent_app_date] => 2022-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 0 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18292683 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20415128 [patent_doc_number] => 12498406 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-16 [patent_title] => Method for the self-diagnosis of a circuit for measuring the insulation resistance of a high-voltage system [patent_app_type] => utility [patent_app_number] => 18/292683 [patent_app_country] => US [patent_app_date] => 2022-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 0 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18292683 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18949211 [patent_doc_number] => 11892501 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-02-06 [patent_title] => Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns [patent_app_type] => utility [patent_app_number] => 17/865104 [patent_app_country] => US [patent_app_date] => 2022-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 19986 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17865104 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18145878 [patent_doc_number] => 20230019734 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => SWEPT PARAMETER OSCILLOSCOPE [patent_app_type] => utility [patent_app_number] => 17/862293 [patent_app_country] => US [patent_app_date] => 2022-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3834 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17862293 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18230439 [patent_doc_number] => 20230069433 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => Test Structure and Test Method for Online Detection of Metal Via Open Circuit [patent_app_type] => utility [patent_app_number] => 17/861974 [patent_app_country] => US [patent_app_date] => 2022-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1735 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17861974 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18110895 [patent_doc_number] => 20230003775 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => ADVANCED CHARGE TRANSFER MEASUREMENT TECHNIQUES [patent_app_type] => utility [patent_app_number] => 17/855295 [patent_app_country] => US [patent_app_date] => 2022-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16287 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17855295 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18863393 [patent_doc_number] => 20230417829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR [patent_app_type] => utility [patent_app_number] => 17/846397 [patent_app_country] => US [patent_app_date] => 2022-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5475 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17846397 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19077595 [patent_doc_number] => 11946952 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-02 [patent_title] => Measurement arrangement [patent_app_type] => utility [patent_app_number] => 17/844057 [patent_app_country] => US [patent_app_date] => 2022-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3470 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17844057 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18337163 [patent_doc_number] => 20230129112 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-04-27 [patent_title] => ACTIVE THERMAL INTERPOSER DEVICE [patent_app_type] => utility [patent_app_number] => 17/841471 [patent_app_country] => US [patent_app_date] => 2022-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -25 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17841471 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18568374 [patent_doc_number] => 20230258710 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => CHIP RELIABILITY TEST ASSEMBLY [patent_app_type] => utility [patent_app_number] => 17/836744 [patent_app_country] => US [patent_app_date] => 2022-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1248 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17836744 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18591392 [patent_doc_number] => 11740283 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-29 [patent_title] => Multistory electronic device testing apparatus [patent_app_type] => utility [patent_app_number] => 17/834035 [patent_app_country] => US [patent_app_date] => 2022-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 5337 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 353 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17834035 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19412859 [patent_doc_number] => 12078672 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-09-03 [patent_title] => Heat spreaders for use in semiconductor device testing, such as burn-in testing [patent_app_type] => utility [patent_app_number] => 17/829224 [patent_app_country] => US [patent_app_date] => 2022-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 8071 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17829224 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18414208 [patent_doc_number] => 11668746 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-06-06 [patent_title] => Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block [patent_app_type] => utility [patent_app_number] => 17/750405 [patent_app_country] => US [patent_app_date] => 2022-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 28 [patent_no_of_words] => 23374 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17750405 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18787332 [patent_doc_number] => 20230375616 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-23 [patent_title] => METHODS AND STRUCTURES FOR SEMICONDUCTOR DEVICE TESTING [patent_app_type] => utility [patent_app_number] => 17/749815 [patent_app_country] => US [patent_app_date] => 2022-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7524 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17749815 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18734183 [patent_doc_number] => 11802910 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-10-31 [patent_title] => Probe apparatus for testing semiconductor devices [patent_app_type] => utility [patent_app_number] => 17/742629 [patent_app_country] => US [patent_app_date] => 2022-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8755 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17742629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17831531 [patent_doc_number] => 20220268835 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-25 [patent_title] => Leakage Screening Based on Use-Case Power Prediction [patent_app_type] => utility [patent_app_number] => 17/663060 [patent_app_country] => US [patent_app_date] => 2022-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3211 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17663060 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19898766 [patent_doc_number] => 12276682 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-15 [patent_title] => Method for monitoring the status of an apparatus and assembly [patent_app_type] => utility [patent_app_number] => 17/741674 [patent_app_country] => US [patent_app_date] => 2022-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 0 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17741674 [rel_patent_id] =>[rel_patent_doc_number] =>)