Search

V. Paul Harper

Examiner (ID: 11948)

Most Active Art Unit
2626
Art Unit(s)
2626, 2657, 2617, 2654
Total Applications
383
Issued Applications
254
Pending Applications
31
Abandoned Applications
104

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 613313 [patent_doc_number] => 07148713 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-12-12 [patent_title] => 'Algoristic spring as probe' [patent_app_type] => utility [patent_app_number] => 11/261551 [patent_app_country] => US [patent_app_date] => 2005-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1027 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/148/07148713.pdf [firstpage_image] =>[orig_patent_app_number] => 11261551 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/261551
Algoristic spring as probe Oct 27, 2005 Issued
Array ( [id] => 660061 [patent_doc_number] => 07106080 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-12 [patent_title] => 'Probe card and contactor of the same' [patent_app_type] => utility [patent_app_number] => 11/239664 [patent_app_country] => US [patent_app_date] => 2005-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 23 [patent_no_of_words] => 8682 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106080.pdf [firstpage_image] =>[orig_patent_app_number] => 11239664 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/239664
Probe card and contactor of the same Sep 28, 2005 Issued
Array ( [id] => 5635357 [patent_doc_number] => 20060066330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Inspection unit' [patent_app_type] => utility [patent_app_number] => 11/238046 [patent_app_country] => US [patent_app_date] => 2005-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5017 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20060066330.pdf [firstpage_image] =>[orig_patent_app_number] => 11238046 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/238046
Inspection unit Sep 28, 2005 Issued
Array ( [id] => 677417 [patent_doc_number] => 07088123 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-08-08 [patent_title] => 'System and method for extraction of C-V characteristics of ultra-thin oxides' [patent_app_type] => utility [patent_app_number] => 11/217144 [patent_app_country] => US [patent_app_date] => 2005-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2067 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/088/07088123.pdf [firstpage_image] =>[orig_patent_app_number] => 11217144 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/217144
System and method for extraction of C-V characteristics of ultra-thin oxides Aug 30, 2005 Issued
Array ( [id] => 660047 [patent_doc_number] => 07106073 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-12 [patent_title] => 'Method and system for area efficient charge-based capacitance measurement' [patent_app_type] => utility [patent_app_number] => 11/140142 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3230 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106073.pdf [firstpage_image] =>[orig_patent_app_number] => 11140142 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140142
Method and system for area efficient charge-based capacitance measurement May 26, 2005 Issued
Array ( [id] => 5635353 [patent_doc_number] => 20060066326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Non-contact tester for electronic circuits' [patent_app_type] => utility [patent_app_number] => 11/113806 [patent_app_country] => US [patent_app_date] => 2005-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 4730 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20060066326.pdf [firstpage_image] =>[orig_patent_app_number] => 11113806 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/113806
Non-contact tester for electronic circuits Apr 24, 2005 Issued
Array ( [id] => 759986 [patent_doc_number] => 07015712 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-03-21 [patent_title] => 'Production line environmental stress screening system' [patent_app_type] => utility [patent_app_number] => 11/107761 [patent_app_country] => US [patent_app_date] => 2005-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 3533 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 434 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015712.pdf [firstpage_image] =>[orig_patent_app_number] => 11107761 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/107761
Production line environmental stress screening system Apr 17, 2005 Issued
Array ( [id] => 759995 [patent_doc_number] => 07015716 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-21 [patent_title] => 'Method for detecting a power load of a power supply module according to duty cycle detection, and related device' [patent_app_type] => utility [patent_app_number] => 10/907654 [patent_app_country] => US [patent_app_date] => 2005-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2668 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/015/07015716.pdf [firstpage_image] =>[orig_patent_app_number] => 10907654 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/907654
Method for detecting a power load of a power supply module according to duty cycle detection, and related device Apr 10, 2005 Issued
Array ( [id] => 949174 [patent_doc_number] => 06963210 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-11-08 [patent_title] => 'Various electrical characteristics and small test point testing module' [patent_app_type] => utility [patent_app_number] => 11/086457 [patent_app_country] => US [patent_app_date] => 2005-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3998 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 614 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/963/06963210.pdf [firstpage_image] =>[orig_patent_app_number] => 11086457 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/086457
Various electrical characteristics and small test point testing module Mar 22, 2005 Issued
Array ( [id] => 6975900 [patent_doc_number] => 20050285615 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'SYSTEM LSI' [patent_app_type] => utility [patent_app_number] => 11/073855 [patent_app_country] => US [patent_app_date] => 2005-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3453 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20050285615.pdf [firstpage_image] =>[orig_patent_app_number] => 11073855 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/073855
System LSI Mar 7, 2005 Issued
Array ( [id] => 770622 [patent_doc_number] => 07005879 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-02-28 [patent_title] => 'Device for probe card power bus noise reduction' [patent_app_type] => utility [patent_app_number] => 11/067755 [patent_app_country] => US [patent_app_date] => 2005-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2605 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/005/07005879.pdf [firstpage_image] =>[orig_patent_app_number] => 11067755 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/067755
Device for probe card power bus noise reduction Feb 28, 2005 Issued
Array ( [id] => 743486 [patent_doc_number] => 07030624 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-04-18 [patent_title] => 'Electrical circuit tester' [patent_app_type] => utility [patent_app_number] => 11/059861 [patent_app_country] => US [patent_app_date] => 2005-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1730 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/030/07030624.pdf [firstpage_image] =>[orig_patent_app_number] => 11059861 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/059861
Electrical circuit tester Feb 16, 2005 Issued
Array ( [id] => 7239061 [patent_doc_number] => 20050140379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-30 [patent_title] => 'Probe navigation method and device and defect inspection device' [patent_app_type] => utility [patent_app_number] => 11/018356 [patent_app_country] => US [patent_app_date] => 2004-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 14063 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20050140379.pdf [firstpage_image] =>[orig_patent_app_number] => 11018356 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/018356
Probe navigation method and device and defect inspection device Dec 21, 2004 Issued
Array ( [id] => 969921 [patent_doc_number] => 06940781 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-09-06 [patent_title] => 'Semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory' [patent_app_type] => utility [patent_app_number] => 10/981463 [patent_app_country] => US [patent_app_date] => 2004-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 11735 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/940/06940781.pdf [firstpage_image] =>[orig_patent_app_number] => 10981463 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/981463
Semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory Nov 4, 2004 Issued
Array ( [id] => 938755 [patent_doc_number] => 06972584 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-12-06 [patent_title] => 'Power decoupling circuit for loop powered time-of-flight ranging systems' [patent_app_type] => utility [patent_app_number] => 10/953459 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4554 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/972/06972584.pdf [firstpage_image] =>[orig_patent_app_number] => 10953459 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/953459
Power decoupling circuit for loop powered time-of-flight ranging systems Sep 29, 2004 Issued
Array ( [id] => 7243888 [patent_doc_number] => 20050073329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-07 [patent_title] => 'Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system' [patent_app_type] => utility [patent_app_number] => 10/953161 [patent_app_country] => US [patent_app_date] => 2004-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4653 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20050073329.pdf [firstpage_image] =>[orig_patent_app_number] => 10953161 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/953161
Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system Sep 28, 2004 Issued
Array ( [id] => 735000 [patent_doc_number] => 07038474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-02 [patent_title] => 'Laser-induced critical parameter analysis of CMOS devices' [patent_app_type] => utility [patent_app_number] => 10/711556 [patent_app_country] => US [patent_app_date] => 2004-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4230 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/038/07038474.pdf [firstpage_image] =>[orig_patent_app_number] => 10711556 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/711556
Laser-induced critical parameter analysis of CMOS devices Sep 23, 2004 Issued
Array ( [id] => 972865 [patent_doc_number] => 06937005 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-30 [patent_title] => 'Rotating gripper wafer flipper' [patent_app_type] => utility [patent_app_number] => 10/930488 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 4712 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/937/06937005.pdf [firstpage_image] =>[orig_patent_app_number] => 10930488 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/930488
Rotating gripper wafer flipper Aug 30, 2004 Issued
Array ( [id] => 7154583 [patent_doc_number] => 20050026324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Rotating gripper wafer flipper' [patent_app_type] => utility [patent_app_number] => 10/930582 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4705 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0026/20050026324.pdf [firstpage_image] =>[orig_patent_app_number] => 10930582 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/930582
Rotating gripper wafer flipper Aug 30, 2004 Issued
Array ( [id] => 7155527 [patent_doc_number] => 20050083072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-21 [patent_title] => 'Probe card and contactor of the same' [patent_app_type] => utility [patent_app_number] => 10/925861 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 8261 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0083/20050083072.pdf [firstpage_image] =>[orig_patent_app_number] => 10925861 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/925861
Probe card and contactor of the same Aug 24, 2004 Issued
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