Search

V. Paul Harper

Examiner (ID: 11948)

Most Active Art Unit
2626
Art Unit(s)
2626, 2657, 2617, 2654
Total Applications
383
Issued Applications
254
Pending Applications
31
Abandoned Applications
104

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1425523 [patent_doc_number] => 06507203 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-14 [patent_title] => 'Test head assembly' [patent_app_type] => B1 [patent_app_number] => 09/451896 [patent_app_country] => US [patent_app_date] => 1999-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4510 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/507/06507203.pdf [firstpage_image] =>[orig_patent_app_number] => 09451896 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/451896
Test head assembly Nov 30, 1999 Issued
Array ( [id] => 4311923 [patent_doc_number] => 06326798 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-04 [patent_title] => 'Electric beam tester and image processing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/451854 [patent_app_country] => US [patent_app_date] => 1999-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2738 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/326/06326798.pdf [firstpage_image] =>[orig_patent_app_number] => 451854 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/451854
Electric beam tester and image processing apparatus Nov 30, 1999 Issued
Array ( [id] => 4284567 [patent_doc_number] => 06281694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Monitor method for testing probe pins' [patent_app_type] => 1 [patent_app_number] => 9/449662 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1924 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281694.pdf [firstpage_image] =>[orig_patent_app_number] => 449662 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/449662
Monitor method for testing probe pins Nov 29, 1999 Issued
Array ( [id] => 1476779 [patent_doc_number] => 06388454 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-14 [patent_title] => 'Electro-optic sampling prober' [patent_app_type] => B1 [patent_app_number] => 09/452297 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5262 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/388/06388454.pdf [firstpage_image] =>[orig_patent_app_number] => 09452297 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/452297
Electro-optic sampling prober Nov 29, 1999 Issued
Array ( [id] => 4378433 [patent_doc_number] => 06288557 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Probe station having inner and outer shielding' [patent_app_type] => 1 [patent_app_number] => 9/451698 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2570 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/288/06288557.pdf [firstpage_image] =>[orig_patent_app_number] => 451698 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/451698
Probe station having inner and outer shielding Nov 29, 1999 Issued
Array ( [id] => 1576826 [patent_doc_number] => 06469528 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-22 [patent_title] => 'Electro-optic sampling probe and measuring method using the same' [patent_app_type] => B2 [patent_app_number] => 09/452295 [patent_app_country] => US [patent_app_date] => 1999-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3616 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/469/06469528.pdf [firstpage_image] =>[orig_patent_app_number] => 09452295 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/452295
Electro-optic sampling probe and measuring method using the same Nov 29, 1999 Issued
Array ( [id] => 1597739 [patent_doc_number] => 06384617 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-07 [patent_title] => 'Signal transfer device for probe test fixture' [patent_app_type] => B1 [patent_app_number] => 09/441473 [patent_app_country] => US [patent_app_date] => 1999-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2869 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/384/06384617.pdf [firstpage_image] =>[orig_patent_app_number] => 09441473 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/441473
Signal transfer device for probe test fixture Nov 16, 1999 Issued
Array ( [id] => 4391501 [patent_doc_number] => 06262571 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-17 [patent_title] => 'Adjustable electrical connector for test fixture nest' [patent_app_type] => 1 [patent_app_number] => 9/442434 [patent_app_country] => US [patent_app_date] => 1999-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 4012 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/262/06262571.pdf [firstpage_image] =>[orig_patent_app_number] => 442434 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/442434
Adjustable electrical connector for test fixture nest Nov 16, 1999 Issued
Array ( [id] => 1462067 [patent_doc_number] => 06392428 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Wafer level interposer' [patent_app_type] => B1 [patent_app_number] => 09/440751 [patent_app_country] => US [patent_app_date] => 1999-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3757 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392428.pdf [firstpage_image] =>[orig_patent_app_number] => 09440751 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/440751
Wafer level interposer Nov 15, 1999 Issued
Array ( [id] => 4375377 [patent_doc_number] => 06275054 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Electrical contact system' [patent_app_type] => 1 [patent_app_number] => 9/440800 [patent_app_country] => US [patent_app_date] => 1999-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 3182 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 265 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/275/06275054.pdf [firstpage_image] =>[orig_patent_app_number] => 440800 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/440800
Electrical contact system Nov 14, 1999 Issued
Array ( [id] => 4338899 [patent_doc_number] => 06313647 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Technique for measuring resistivity' [patent_app_type] => 1 [patent_app_number] => 9/436586 [patent_app_country] => US [patent_app_date] => 1999-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 4615 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313647.pdf [firstpage_image] =>[orig_patent_app_number] => 436586 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/436586
Technique for measuring resistivity Nov 8, 1999 Issued
Array ( [id] => 1562435 [patent_doc_number] => 06437587 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-20 [patent_title] => 'ICT test fixture for fine pitch testing' [patent_app_type] => B1 [patent_app_number] => 09/434195 [patent_app_country] => US [patent_app_date] => 1999-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 5072 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/437/06437587.pdf [firstpage_image] =>[orig_patent_app_number] => 09434195 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/434195
ICT test fixture for fine pitch testing Nov 3, 1999 Issued
Array ( [id] => 5886325 [patent_doc_number] => 20020011864 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'SOCKET PIN AND SOCKET FOR ELECTRICAL TESTING OF SEMICONDUCTOR PACKAGES' [patent_app_type] => new [patent_app_number] => 09/430997 [patent_app_country] => US [patent_app_date] => 1999-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3133 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20020011864.pdf [firstpage_image] =>[orig_patent_app_number] => 09430997 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/430997
Socket pin and socket for electrical testing of semiconductor packages Oct 31, 1999 Issued
Array ( [id] => 4415759 [patent_doc_number] => 06229326 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Method and apparatus for testing electronic device in burn-in process' [patent_app_type] => 1 [patent_app_number] => 9/412152 [patent_app_country] => US [patent_app_date] => 1999-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2733 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/229/06229326.pdf [firstpage_image] =>[orig_patent_app_number] => 412152 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/412152
Method and apparatus for testing electronic device in burn-in process Oct 4, 1999 Issued
Array ( [id] => 4414876 [patent_doc_number] => 06310486 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Integrated test cell' [patent_app_type] => 1 [patent_app_number] => 9/410857 [patent_app_country] => US [patent_app_date] => 1999-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2982 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/310/06310486.pdf [firstpage_image] =>[orig_patent_app_number] => 410857 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/410857
Integrated test cell Sep 30, 1999 Issued
Array ( [id] => 1519495 [patent_doc_number] => 06501290 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-12-31 [patent_title] => 'Direct to chuck coolant delivery for integrated circuit testing' [patent_app_type] => B2 [patent_app_number] => 09/408891 [patent_app_country] => US [patent_app_date] => 1999-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1827 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/501/06501290.pdf [firstpage_image] =>[orig_patent_app_number] => 09408891 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/408891
Direct to chuck coolant delivery for integrated circuit testing Sep 28, 1999 Issued
Array ( [id] => 4391678 [patent_doc_number] => 06262584 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-17 [patent_title] => 'IC device temperature control system and IC device inspection apparatus incorporating the same' [patent_app_type] => 1 [patent_app_number] => 9/408777 [patent_app_country] => US [patent_app_date] => 1999-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6152 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/262/06262584.pdf [firstpage_image] =>[orig_patent_app_number] => 408777 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/408777
IC device temperature control system and IC device inspection apparatus incorporating the same Sep 28, 1999 Issued
Array ( [id] => 4415704 [patent_doc_number] => 06265887 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Mounting fixture for a pin grid array device' [patent_app_type] => 1 [patent_app_number] => 9/400750 [patent_app_country] => US [patent_app_date] => 1999-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2148 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265887.pdf [firstpage_image] =>[orig_patent_app_number] => 400750 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/400750
Mounting fixture for a pin grid array device Sep 21, 1999 Issued
Array ( [id] => 4293734 [patent_doc_number] => 06268718 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-31 [patent_title] => 'Burn-in test device' [patent_app_type] => 1 [patent_app_number] => 9/401390 [patent_app_country] => US [patent_app_date] => 1999-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 2565 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/268/06268718.pdf [firstpage_image] =>[orig_patent_app_number] => 401390 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/401390
Burn-in test device Sep 21, 1999 Issued
Array ( [id] => 4245861 [patent_doc_number] => 06091237 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-18 [patent_title] => 'Three-phrase clamp-type power meter' [patent_app_type] => 1 [patent_app_number] => 9/395350 [patent_app_country] => US [patent_app_date] => 1999-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3435 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/091/06091237.pdf [firstpage_image] =>[orig_patent_app_number] => 395350 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/395350
Three-phrase clamp-type power meter Sep 13, 1999 Issued
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