
V. Paul Harper
Examiner (ID: 11948)
| Most Active Art Unit | 2626 |
| Art Unit(s) | 2626, 2657, 2617, 2654 |
| Total Applications | 383 |
| Issued Applications | 254 |
| Pending Applications | 31 |
| Abandoned Applications | 104 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1425523
[patent_doc_number] => 06507203
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-01-14
[patent_title] => 'Test head assembly'
[patent_app_type] => B1
[patent_app_number] => 09/451896
[patent_app_country] => US
[patent_app_date] => 1999-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 4510
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/507/06507203.pdf
[firstpage_image] =>[orig_patent_app_number] => 09451896
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/451896 | Test head assembly | Nov 30, 1999 | Issued |
Array
(
[id] => 4311923
[patent_doc_number] => 06326798
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-12-04
[patent_title] => 'Electric beam tester and image processing apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/451854
[patent_app_country] => US
[patent_app_date] => 1999-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/326/06326798.pdf
[firstpage_image] =>[orig_patent_app_number] => 451854
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/451854 | Electric beam tester and image processing apparatus | Nov 30, 1999 | Issued |
Array
(
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[patent_doc_number] => 06281694
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-28
[patent_title] => 'Monitor method for testing probe pins'
[patent_app_type] => 1
[patent_app_number] => 9/449662
[patent_app_country] => US
[patent_app_date] => 1999-11-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/281/06281694.pdf
[firstpage_image] =>[orig_patent_app_number] => 449662
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/449662 | Monitor method for testing probe pins | Nov 29, 1999 | Issued |
Array
(
[id] => 1476779
[patent_doc_number] => 06388454
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-14
[patent_title] => 'Electro-optic sampling prober'
[patent_app_type] => B1
[patent_app_number] => 09/452297
[patent_app_country] => US
[patent_app_date] => 1999-11-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[pdf_file] => patents/06/388/06388454.pdf
[firstpage_image] =>[orig_patent_app_number] => 09452297
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/452297 | Electro-optic sampling prober | Nov 29, 1999 | Issued |
Array
(
[id] => 4378433
[patent_doc_number] => 06288557
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-11
[patent_title] => 'Probe station having inner and outer shielding'
[patent_app_type] => 1
[patent_app_number] => 9/451698
[patent_app_country] => US
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[pdf_file] => patents/06/288/06288557.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/451698 | Probe station having inner and outer shielding | Nov 29, 1999 | Issued |
Array
(
[id] => 1576826
[patent_doc_number] => 06469528
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[patent_kind] => B2
[patent_issue_date] => 2002-10-22
[patent_title] => 'Electro-optic sampling probe and measuring method using the same'
[patent_app_type] => B2
[patent_app_number] => 09/452295
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[patent_app_date] => 1999-11-30
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[firstpage_image] =>[orig_patent_app_number] => 09452295
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Array
(
[id] => 1597739
[patent_doc_number] => 06384617
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-07
[patent_title] => 'Signal transfer device for probe test fixture'
[patent_app_type] => B1
[patent_app_number] => 09/441473
[patent_app_country] => US
[patent_app_date] => 1999-11-17
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[pdf_file] => patents/06/384/06384617.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/441473 | Signal transfer device for probe test fixture | Nov 16, 1999 | Issued |
Array
(
[id] => 4391501
[patent_doc_number] => 06262571
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-17
[patent_title] => 'Adjustable electrical connector for test fixture nest'
[patent_app_type] => 1
[patent_app_number] => 9/442434
[patent_app_country] => US
[patent_app_date] => 1999-11-17
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/262/06262571.pdf
[firstpage_image] =>[orig_patent_app_number] => 442434
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/442434 | Adjustable electrical connector for test fixture nest | Nov 16, 1999 | Issued |
Array
(
[id] => 1462067
[patent_doc_number] => 06392428
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-21
[patent_title] => 'Wafer level interposer'
[patent_app_type] => B1
[patent_app_number] => 09/440751
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[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/392/06392428.pdf
[firstpage_image] =>[orig_patent_app_number] => 09440751
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440751 | Wafer level interposer | Nov 15, 1999 | Issued |
Array
(
[id] => 4375377
[patent_doc_number] => 06275054
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-14
[patent_title] => 'Electrical contact system'
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[patent_app_number] => 9/440800
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[pdf_file] => patents/06/275/06275054.pdf
[firstpage_image] =>[orig_patent_app_number] => 440800
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440800 | Electrical contact system | Nov 14, 1999 | Issued |
Array
(
[id] => 4338899
[patent_doc_number] => 06313647
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-06
[patent_title] => 'Technique for measuring resistivity'
[patent_app_type] => 1
[patent_app_number] => 9/436586
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[firstpage_image] =>[orig_patent_app_number] => 436586
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/436586 | Technique for measuring resistivity | Nov 8, 1999 | Issued |
Array
(
[id] => 1562435
[patent_doc_number] => 06437587
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-08-20
[patent_title] => 'ICT test fixture for fine pitch testing'
[patent_app_type] => B1
[patent_app_number] => 09/434195
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[firstpage_image] =>[orig_patent_app_number] => 09434195
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/434195 | ICT test fixture for fine pitch testing | Nov 3, 1999 | Issued |
Array
(
[id] => 5886325
[patent_doc_number] => 20020011864
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-01-31
[patent_title] => 'SOCKET PIN AND SOCKET FOR ELECTRICAL TESTING OF SEMICONDUCTOR PACKAGES'
[patent_app_type] => new
[patent_app_number] => 09/430997
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[firstpage_image] =>[orig_patent_app_number] => 09430997
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/430997 | Socket pin and socket for electrical testing of semiconductor packages | Oct 31, 1999 | Issued |
Array
(
[id] => 4415759
[patent_doc_number] => 06229326
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[patent_issue_date] => 2001-05-08
[patent_title] => 'Method and apparatus for testing electronic device in burn-in process'
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[firstpage_image] =>[orig_patent_app_number] => 412152
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/412152 | Method and apparatus for testing electronic device in burn-in process | Oct 4, 1999 | Issued |
Array
(
[id] => 4414876
[patent_doc_number] => 06310486
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[patent_title] => 'Integrated test cell'
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Array
(
[id] => 1519495
[patent_doc_number] => 06501290
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[patent_title] => 'Direct to chuck coolant delivery for integrated circuit testing'
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Array
(
[id] => 4391678
[patent_doc_number] => 06262584
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[patent_issue_date] => 2001-07-17
[patent_title] => 'IC device temperature control system and IC device inspection apparatus incorporating the same'
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Array
(
[id] => 4415704
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Array
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Array
(
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[patent_title] => 'Three-phrase clamp-type power meter'
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[pdf_file] => patents/06/091/06091237.pdf
[firstpage_image] =>[orig_patent_app_number] => 395350
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/395350 | Three-phrase clamp-type power meter | Sep 13, 1999 | Issued |