Search

V. Paul Harper

Examiner (ID: 11948)

Most Active Art Unit
2626
Art Unit(s)
2626, 2657, 2617, 2654
Total Applications
383
Issued Applications
254
Pending Applications
31
Abandoned Applications
104

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1176991 [patent_doc_number] => 06750672 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-15 [patent_title] => 'Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same' [patent_app_type] => B2 [patent_app_number] => 10/119067 [patent_app_country] => US [patent_app_date] => 2002-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 20 [patent_no_of_words] => 8410 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/750/06750672.pdf [firstpage_image] =>[orig_patent_app_number] => 10119067 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/119067
Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same Apr 9, 2002 Issued
Array ( [id] => 1074225 [patent_doc_number] => 06838891 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-04 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/119560 [patent_app_country] => US [patent_app_date] => 2002-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4370 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/838/06838891.pdf [firstpage_image] =>[orig_patent_app_number] => 10119560 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/119560
Semiconductor device Apr 8, 2002 Issued
Array ( [id] => 1025819 [patent_doc_number] => 06885211 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-26 [patent_title] => 'Internal node offset voltage test circuits and methods' [patent_app_type] => utility [patent_app_number] => 10/117374 [patent_app_country] => US [patent_app_date] => 2002-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 2726 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/885/06885211.pdf [firstpage_image] =>[orig_patent_app_number] => 10117374 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/117374
Internal node offset voltage test circuits and methods Apr 4, 2002 Issued
Array ( [id] => 1159679 [patent_doc_number] => 06765396 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-20 [patent_title] => 'Method, apparatus and software for testing a device including both electrical and optical portions' [patent_app_type] => B2 [patent_app_number] => 10/116179 [patent_app_country] => US [patent_app_date] => 2002-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4537 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/765/06765396.pdf [firstpage_image] =>[orig_patent_app_number] => 10116179 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/116179
Method, apparatus and software for testing a device including both electrical and optical portions Apr 3, 2002 Issued
Array ( [id] => 1015270 [patent_doc_number] => 06894518 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-05-17 [patent_title] => 'Circuit analysis and manufacture using electric field-induced effects' [patent_app_type] => utility [patent_app_number] => 10/113780 [patent_app_country] => US [patent_app_date] => 2002-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4328 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/894/06894518.pdf [firstpage_image] =>[orig_patent_app_number] => 10113780 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/113780
Circuit analysis and manufacture using electric field-induced effects Mar 28, 2002 Issued
Array ( [id] => 1137442 [patent_doc_number] => 06784682 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-31 [patent_title] => 'Method of detecting shallow trench isolation corner thinning by electrical trapping' [patent_app_type] => B1 [patent_app_number] => 10/113259 [patent_app_country] => US [patent_app_date] => 2002-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 11 [patent_no_of_words] => 3044 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/784/06784682.pdf [firstpage_image] =>[orig_patent_app_number] => 10113259 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/113259
Method of detecting shallow trench isolation corner thinning by electrical trapping Mar 27, 2002 Issued
Array ( [id] => 5982789 [patent_doc_number] => 20020097063 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-25 [patent_title] => 'Wafer level interposer' [patent_app_type] => new [patent_app_number] => 10/106167 [patent_app_country] => US [patent_app_date] => 2002-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3834 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20020097063.pdf [firstpage_image] =>[orig_patent_app_number] => 10106167 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/106167
Wafer level interposer Mar 25, 2002 Issued
Array ( [id] => 6158112 [patent_doc_number] => 20020146920 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-10 [patent_title] => 'Method of soldering contact pins and the contact pins' [patent_app_type] => new [patent_app_number] => 10/105957 [patent_app_country] => US [patent_app_date] => 2002-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3521 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20020146920.pdf [firstpage_image] =>[orig_patent_app_number] => 10105957 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/105957
Method of soldering contact pins and the contact pins Mar 20, 2002 Abandoned
Array ( [id] => 1548019 [patent_doc_number] => 06445174 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-03 [patent_title] => 'Sliding tray holder for ease in handling IC packages during testing of the IC packages' [patent_app_type] => B1 [patent_app_number] => 10/101918 [patent_app_country] => US [patent_app_date] => 2002-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4473 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/445/06445174.pdf [firstpage_image] =>[orig_patent_app_number] => 10101918 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/101918
Sliding tray holder for ease in handling IC packages during testing of the IC packages Mar 19, 2002 Issued
Array ( [id] => 1171105 [patent_doc_number] => 06756804 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-29 [patent_title] => 'Semiconductor integrated circuit device' [patent_app_type] => B2 [patent_app_number] => 10/101161 [patent_app_country] => US [patent_app_date] => 2002-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 18 [patent_no_of_words] => 6999 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/756/06756804.pdf [firstpage_image] =>[orig_patent_app_number] => 10101161 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/101161
Semiconductor integrated circuit device Mar 19, 2002 Issued
Array ( [id] => 6795115 [patent_doc_number] => 20030173988 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-18 [patent_title] => 'High speed threshold voltage and average surface doping measurements' [patent_app_type] => new [patent_app_number] => 10/099207 [patent_app_country] => US [patent_app_date] => 2002-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1007 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0173/20030173988.pdf [firstpage_image] =>[orig_patent_app_number] => 10099207 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/099207
High speed threshold voltage and average surface doping measurements Mar 14, 2002 Issued
Array ( [id] => 6417627 [patent_doc_number] => 20020125879 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-12 [patent_title] => 'Parallel test board used in testing semiconductor memory devices' [patent_app_type] => new [patent_app_number] => 10/094561 [patent_app_country] => US [patent_app_date] => 2002-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5177 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0125/20020125879.pdf [firstpage_image] =>[orig_patent_app_number] => 10094561 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/094561
Parallel test board used in testing semiconductor memory devices Mar 7, 2002 Issued
Array ( [id] => 1190287 [patent_doc_number] => 06734694 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-11 [patent_title] => 'Method and apparatus for automatically testing semiconductor device' [patent_app_type] => B2 [patent_app_number] => 10/092163 [patent_app_country] => US [patent_app_date] => 2002-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 0 [patent_no_of_words] => 8200 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734694.pdf [firstpage_image] =>[orig_patent_app_number] => 10092163 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/092163
Method and apparatus for automatically testing semiconductor device Mar 4, 2002 Issued
Array ( [id] => 1257726 [patent_doc_number] => 06667627 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-23 [patent_title] => 'Probe for inspecting semiconductor device and method of manufacturing the same' [patent_app_type] => B2 [patent_app_number] => 10/090957 [patent_app_country] => US [patent_app_date] => 2002-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 26 [patent_no_of_words] => 3350 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/667/06667627.pdf [firstpage_image] =>[orig_patent_app_number] => 10090957 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/090957
Probe for inspecting semiconductor device and method of manufacturing the same Mar 4, 2002 Issued
Array ( [id] => 1172855 [patent_doc_number] => 06753685 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-22 [patent_title] => 'Power detector with increased detection range' [patent_app_type] => B2 [patent_app_number] => 10/073149 [patent_app_country] => US [patent_app_date] => 2002-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2578 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/753/06753685.pdf [firstpage_image] =>[orig_patent_app_number] => 10073149 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/073149
Power detector with increased detection range Feb 12, 2002 Issued
Array ( [id] => 6315544 [patent_doc_number] => 20020195313 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-26 [patent_title] => 'Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus' [patent_app_type] => new [patent_app_number] => 10/072451 [patent_app_country] => US [patent_app_date] => 2002-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10811 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 28 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0195/20020195313.pdf [firstpage_image] =>[orig_patent_app_number] => 10072451 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/072451
Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus Feb 4, 2002 Issued
Array ( [id] => 6510647 [patent_doc_number] => 20020135383 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-26 [patent_title] => 'Device for generator diagnosis with built-in rotor' [patent_app_type] => new [patent_app_number] => 10/055957 [patent_app_country] => US [patent_app_date] => 2002-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3489 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0135/20020135383.pdf [firstpage_image] =>[orig_patent_app_number] => 10055957 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/055957
Device for generator diagnosis with built-in rotor Jan 27, 2002 Issued
Array ( [id] => 5984060 [patent_doc_number] => 20020097615 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-25 [patent_title] => 'Connection pad arrangements for electronic circuit comprising both functional logic and Flash-EEPROM' [patent_app_type] => new [patent_app_number] => 10/053958 [patent_app_country] => US [patent_app_date] => 2002-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1870 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0097/20020097615.pdf [firstpage_image] =>[orig_patent_app_number] => 10053958 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/053958
Connection pad arrangements for electronic circuit comprising both functional logic and Flash-EEPROM Jan 23, 2002 Abandoned
Array ( [id] => 6656565 [patent_doc_number] => 20030132774 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-17 [patent_title] => 'Analogue signal testing system for integrated circuit' [patent_app_type] => new [patent_app_number] => 10/047755 [patent_app_country] => US [patent_app_date] => 2002-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1735 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20030132774.pdf [firstpage_image] =>[orig_patent_app_number] => 10047755 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/047755
Analogue signal testing system for integrated circuit Jan 13, 2002 Abandoned
Array ( [id] => 1331614 [patent_doc_number] => 06600330 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-29 [patent_title] => 'Probe head holder' [patent_app_type] => B1 [patent_app_number] => 10/047558 [patent_app_country] => US [patent_app_date] => 2002-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3010 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/600/06600330.pdf [firstpage_image] =>[orig_patent_app_number] => 10047558 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/047558
Probe head holder Jan 10, 2002 Issued
Menu