
V. Paul Harper
Examiner (ID: 11948)
| Most Active Art Unit | 2626 |
| Art Unit(s) | 2626, 2657, 2617, 2654 |
| Total Applications | 383 |
| Issued Applications | 254 |
| Pending Applications | 31 |
| Abandoned Applications | 104 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1176991
[patent_doc_number] => 06750672
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-15
[patent_title] => 'Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same'
[patent_app_type] => B2
[patent_app_number] => 10/119067
[patent_app_country] => US
[patent_app_date] => 2002-04-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 20
[patent_no_of_words] => 8410
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/750/06750672.pdf
[firstpage_image] =>[orig_patent_app_number] => 10119067
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/119067 | Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same | Apr 9, 2002 | Issued |
Array
(
[id] => 1074225
[patent_doc_number] => 06838891
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-01-04
[patent_title] => 'Semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 10/119560
[patent_app_country] => US
[patent_app_date] => 2002-04-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 4370
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 141
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/838/06838891.pdf
[firstpage_image] =>[orig_patent_app_number] => 10119560
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/119560 | Semiconductor device | Apr 8, 2002 | Issued |
Array
(
[id] => 1025819
[patent_doc_number] => 06885211
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-04-26
[patent_title] => 'Internal node offset voltage test circuits and methods'
[patent_app_type] => utility
[patent_app_number] => 10/117374
[patent_app_country] => US
[patent_app_date] => 2002-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 10
[patent_no_of_words] => 2726
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/885/06885211.pdf
[firstpage_image] =>[orig_patent_app_number] => 10117374
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/117374 | Internal node offset voltage test circuits and methods | Apr 4, 2002 | Issued |
Array
(
[id] => 1159679
[patent_doc_number] => 06765396
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-07-20
[patent_title] => 'Method, apparatus and software for testing a device including both electrical and optical portions'
[patent_app_type] => B2
[patent_app_number] => 10/116179
[patent_app_country] => US
[patent_app_date] => 2002-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 4537
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 34
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/765/06765396.pdf
[firstpage_image] =>[orig_patent_app_number] => 10116179
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/116179 | Method, apparatus and software for testing a device including both electrical and optical portions | Apr 3, 2002 | Issued |
Array
(
[id] => 1015270
[patent_doc_number] => 06894518
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-05-17
[patent_title] => 'Circuit analysis and manufacture using electric field-induced effects'
[patent_app_type] => utility
[patent_app_number] => 10/113780
[patent_app_country] => US
[patent_app_date] => 2002-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 4328
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/894/06894518.pdf
[firstpage_image] =>[orig_patent_app_number] => 10113780
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/113780 | Circuit analysis and manufacture using electric field-induced effects | Mar 28, 2002 | Issued |
Array
(
[id] => 1137442
[patent_doc_number] => 06784682
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-08-31
[patent_title] => 'Method of detecting shallow trench isolation corner thinning by electrical trapping'
[patent_app_type] => B1
[patent_app_number] => 10/113259
[patent_app_country] => US
[patent_app_date] => 2002-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 11
[patent_no_of_words] => 3044
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/784/06784682.pdf
[firstpage_image] =>[orig_patent_app_number] => 10113259
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/113259 | Method of detecting shallow trench isolation corner thinning by electrical trapping | Mar 27, 2002 | Issued |
Array
(
[id] => 5982789
[patent_doc_number] => 20020097063
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-25
[patent_title] => 'Wafer level interposer'
[patent_app_type] => new
[patent_app_number] => 10/106167
[patent_app_country] => US
[patent_app_date] => 2002-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3834
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20020097063.pdf
[firstpage_image] =>[orig_patent_app_number] => 10106167
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/106167 | Wafer level interposer | Mar 25, 2002 | Issued |
Array
(
[id] => 6158112
[patent_doc_number] => 20020146920
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-10
[patent_title] => 'Method of soldering contact pins and the contact pins'
[patent_app_type] => new
[patent_app_number] => 10/105957
[patent_app_country] => US
[patent_app_date] => 2002-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3521
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0146/20020146920.pdf
[firstpage_image] =>[orig_patent_app_number] => 10105957
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/105957 | Method of soldering contact pins and the contact pins | Mar 20, 2002 | Abandoned |
Array
(
[id] => 1548019
[patent_doc_number] => 06445174
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-09-03
[patent_title] => 'Sliding tray holder for ease in handling IC packages during testing of the IC packages'
[patent_app_type] => B1
[patent_app_number] => 10/101918
[patent_app_country] => US
[patent_app_date] => 2002-03-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 4473
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 270
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/445/06445174.pdf
[firstpage_image] =>[orig_patent_app_number] => 10101918
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/101918 | Sliding tray holder for ease in handling IC packages during testing of the IC packages | Mar 19, 2002 | Issued |
Array
(
[id] => 1171105
[patent_doc_number] => 06756804
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-29
[patent_title] => 'Semiconductor integrated circuit device'
[patent_app_type] => B2
[patent_app_number] => 10/101161
[patent_app_country] => US
[patent_app_date] => 2002-03-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 18
[patent_no_of_words] => 6999
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/756/06756804.pdf
[firstpage_image] =>[orig_patent_app_number] => 10101161
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/101161 | Semiconductor integrated circuit device | Mar 19, 2002 | Issued |
Array
(
[id] => 6795115
[patent_doc_number] => 20030173988
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-09-18
[patent_title] => 'High speed threshold voltage and average surface doping measurements'
[patent_app_type] => new
[patent_app_number] => 10/099207
[patent_app_country] => US
[patent_app_date] => 2002-03-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1007
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0173/20030173988.pdf
[firstpage_image] =>[orig_patent_app_number] => 10099207
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/099207 | High speed threshold voltage and average surface doping measurements | Mar 14, 2002 | Issued |
Array
(
[id] => 6417627
[patent_doc_number] => 20020125879
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-09-12
[patent_title] => 'Parallel test board used in testing semiconductor memory devices'
[patent_app_type] => new
[patent_app_number] => 10/094561
[patent_app_country] => US
[patent_app_date] => 2002-03-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5177
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 67
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0125/20020125879.pdf
[firstpage_image] =>[orig_patent_app_number] => 10094561
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/094561 | Parallel test board used in testing semiconductor memory devices | Mar 7, 2002 | Issued |
Array
(
[id] => 1190287
[patent_doc_number] => 06734694
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-11
[patent_title] => 'Method and apparatus for automatically testing semiconductor device'
[patent_app_type] => B2
[patent_app_number] => 10/092163
[patent_app_country] => US
[patent_app_date] => 2002-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 0
[patent_no_of_words] => 8200
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/734/06734694.pdf
[firstpage_image] =>[orig_patent_app_number] => 10092163
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/092163 | Method and apparatus for automatically testing semiconductor device | Mar 4, 2002 | Issued |
Array
(
[id] => 1257726
[patent_doc_number] => 06667627
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-12-23
[patent_title] => 'Probe for inspecting semiconductor device and method of manufacturing the same'
[patent_app_type] => B2
[patent_app_number] => 10/090957
[patent_app_country] => US
[patent_app_date] => 2002-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 26
[patent_no_of_words] => 3350
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/667/06667627.pdf
[firstpage_image] =>[orig_patent_app_number] => 10090957
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/090957 | Probe for inspecting semiconductor device and method of manufacturing the same | Mar 4, 2002 | Issued |
Array
(
[id] => 1172855
[patent_doc_number] => 06753685
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-22
[patent_title] => 'Power detector with increased detection range'
[patent_app_type] => B2
[patent_app_number] => 10/073149
[patent_app_country] => US
[patent_app_date] => 2002-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 2578
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/753/06753685.pdf
[firstpage_image] =>[orig_patent_app_number] => 10073149
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/073149 | Power detector with increased detection range | Feb 12, 2002 | Issued |
Array
(
[id] => 6315544
[patent_doc_number] => 20020195313
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-12-26
[patent_title] => 'Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus'
[patent_app_type] => new
[patent_app_number] => 10/072451
[patent_app_country] => US
[patent_app_date] => 2002-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 10811
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 15
[patent_words_short_claim] => 28
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0195/20020195313.pdf
[firstpage_image] =>[orig_patent_app_number] => 10072451
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/072451 | Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus | Feb 4, 2002 | Issued |
Array
(
[id] => 6510647
[patent_doc_number] => 20020135383
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-09-26
[patent_title] => 'Device for generator diagnosis with built-in rotor'
[patent_app_type] => new
[patent_app_number] => 10/055957
[patent_app_country] => US
[patent_app_date] => 2002-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3489
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 30
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0135/20020135383.pdf
[firstpage_image] =>[orig_patent_app_number] => 10055957
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/055957 | Device for generator diagnosis with built-in rotor | Jan 27, 2002 | Issued |
Array
(
[id] => 5984060
[patent_doc_number] => 20020097615
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-07-25
[patent_title] => 'Connection pad arrangements for electronic circuit comprising both functional logic and Flash-EEPROM'
[patent_app_type] => new
[patent_app_number] => 10/053958
[patent_app_country] => US
[patent_app_date] => 2002-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1870
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 26
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20020097615.pdf
[firstpage_image] =>[orig_patent_app_number] => 10053958
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/053958 | Connection pad arrangements for electronic circuit comprising both functional logic and Flash-EEPROM | Jan 23, 2002 | Abandoned |
Array
(
[id] => 6656565
[patent_doc_number] => 20030132774
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-17
[patent_title] => 'Analogue signal testing system for integrated circuit'
[patent_app_type] => new
[patent_app_number] => 10/047755
[patent_app_country] => US
[patent_app_date] => 2002-01-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1735
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0132/20030132774.pdf
[firstpage_image] =>[orig_patent_app_number] => 10047755
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/047755 | Analogue signal testing system for integrated circuit | Jan 13, 2002 | Abandoned |
Array
(
[id] => 1331614
[patent_doc_number] => 06600330
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-29
[patent_title] => 'Probe head holder'
[patent_app_type] => B1
[patent_app_number] => 10/047558
[patent_app_country] => US
[patent_app_date] => 2002-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3010
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/600/06600330.pdf
[firstpage_image] =>[orig_patent_app_number] => 10047558
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/047558 | Probe head holder | Jan 10, 2002 | Issued |