Vaughn Coolman

Array ( [id] => 8730156 [patent_doc_number] => 20130075725 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-03-28 [patent_title] => 'ENHANCED WAFER TEST LINE STRUCTURE' [patent_app_type] => utility [patent_app_number] => 13/246536 [patent_app_country] => US [patent_app_date] => 2011-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2284 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13246536 [rel_patent_id] =>[rel_patent_doc_number] =>)