Search

Venkataraman Balasubramanian

Examiner (ID: 286, Phone: (571)272-0662 , Office: P/1624 )

Most Active Art Unit
1624
Art Unit(s)
1624, 1611
Total Applications
2999
Issued Applications
2017
Pending Applications
254
Abandoned Applications
728

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 9447571 [patent_doc_number] => 20140118740 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2014-05-01 [patent_title] => 'SYSTEMS AND METHODS FOR MEASURING A PROFILE CHARACTERISTIC OF A GLASS SAMPLE' [patent_app_type] => utility [patent_app_number] => 14/055351 [patent_app_country] => US [patent_app_date] => 2013-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10056 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14055351 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/055351
Systems and methods for measuring a profile characteristic of a glass sample Oct 15, 2013 Issued
Array ( [id] => 9763847 [patent_doc_number] => 08848180 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2014-09-30 [patent_title] => 'Reference systems for indicating slope and alignment and related devices, systems, and methods' [patent_app_type] => utility [patent_app_number] => 14/019459 [patent_app_country] => US [patent_app_date] => 2013-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 17 [patent_no_of_words] => 8064 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 327 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14019459 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/019459
Reference systems for indicating slope and alignment and related devices, systems, and methods Sep 4, 2013 Issued
Array ( [id] => 9779408 [patent_doc_number] => 08854621 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2014-10-07 [patent_title] => 'Systems and methods for determining nanoparticle dimensions' [patent_app_type] => utility [patent_app_number] => 14/011055 [patent_app_country] => US [patent_app_date] => 2013-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 7942 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14011055 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/011055
Systems and methods for determining nanoparticle dimensions Aug 26, 2013 Issued
Array ( [id] => 9470482 [patent_doc_number] => 08724123 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-05-13 [patent_title] => 'Method and device for vehicle measurement' [patent_app_type] => utility [patent_app_number] => 14/011355 [patent_app_country] => US [patent_app_date] => 2013-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2978 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14011355 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/011355
Method and device for vehicle measurement Aug 26, 2013 Issued
Array ( [id] => 9089815 [patent_doc_number] => 20130269126 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-10-17 [patent_title] => 'APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE' [patent_app_type] => utility [patent_app_number] => 13/915161 [patent_app_country] => US [patent_app_date] => 2013-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9822 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13915161 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/915161
Apparatus and method for inspecting defect in object surface Jun 10, 2013 Issued
Array ( [id] => 9470472 [patent_doc_number] => 08724113 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-05-13 [patent_title] => 'Method for forming a nanostructure penetrating a layer' [patent_app_type] => utility [patent_app_number] => 13/886148 [patent_app_country] => US [patent_app_date] => 2013-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 20 [patent_no_of_words] => 9678 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13886148 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/886148
Method for forming a nanostructure penetrating a layer May 1, 2013 Issued
Array ( [id] => 9003752 [patent_doc_number] => 20130224877 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-08-29 [patent_title] => 'LUMINESCENCE REFERENCE STANDARDS' [patent_app_type] => utility [patent_app_number] => 13/765568 [patent_app_country] => US [patent_app_date] => 2013-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 14242 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13765568 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/765568
Luminescence reference standards Feb 11, 2013 Issued
Array ( [id] => 9485314 [patent_doc_number] => 08731275 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-05-20 [patent_title] => 'Method and apparatus for reviewing defects' [patent_app_type] => utility [patent_app_number] => 13/729635 [patent_app_country] => US [patent_app_date] => 2012-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 10877 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 257 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13729635 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/729635
Method and apparatus for reviewing defects Dec 27, 2012 Issued
Array ( [id] => 8816678 [patent_doc_number] => 20130117723 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-05-09 [patent_title] => 'PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATING DATA GENERATION DEVICE AND SEMICONDUCTOR SHAPE EVALUATION SYSTEM USING THE SAME' [patent_app_type] => utility [patent_app_number] => 13/712611 [patent_app_country] => US [patent_app_date] => 2012-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 12782 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13712611 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/712611
PATTERN SHAPE EVALUATION METHOD, PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATING DATA GENERATION DEVICE AND SEMICONDUCTOR SHAPE EVALUATION SYSTEM USING THE SAME Dec 11, 2012 Abandoned
Array ( [id] => 9583658 [patent_doc_number] => 08773663 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-07-08 [patent_title] => 'Luminous unit' [patent_app_type] => utility [patent_app_number] => 13/622261 [patent_app_country] => US [patent_app_date] => 2012-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3890 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 17 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13622261 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/622261
Luminous unit Sep 17, 2012 Issued
Array ( [id] => 10839363 [patent_doc_number] => 08867044 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-10-21 [patent_title] => 'Computing device and method for scanning edges of an object' [patent_app_type] => utility [patent_app_number] => 13/594857 [patent_app_country] => US [patent_app_date] => 2012-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1826 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 260 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13594857 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/594857
Computing device and method for scanning edges of an object Aug 25, 2012 Issued
Array ( [id] => 8658053 [patent_doc_number] => 20130038882 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-02-14 [patent_title] => 'OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/588857 [patent_app_country] => US [patent_app_date] => 2012-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5724 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13588857 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/588857
OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE Aug 16, 2012 Abandoned
Array ( [id] => 8658053 [patent_doc_number] => 20130038882 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-02-14 [patent_title] => 'OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE' [patent_app_type] => utility [patent_app_number] => 13/588857 [patent_app_country] => US [patent_app_date] => 2012-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5724 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13588857 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/588857
OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE Aug 16, 2012 Abandoned
Array ( [id] => 8463576 [patent_doc_number] => 20120268744 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-10-25 [patent_title] => 'MULTIPLE MEASUREMENT TECHNIQUES INCLUDING FOCUSED BEAM SCATTEROMETRY FOR CHARACTERIZATION OF SAMPLES' [patent_app_type] => utility [patent_app_number] => 13/423866 [patent_app_country] => US [patent_app_date] => 2012-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7475 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13423866 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/423866
Multiple measurement techniques including focused beam scatterometry for characterization of samples Mar 18, 2012 Issued
Array ( [id] => 8404260 [patent_doc_number] => 20120236319 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-09-20 [patent_title] => 'OBJECT DETECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/418652 [patent_app_country] => US [patent_app_date] => 2012-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5105 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13418652 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/418652
OBJECT DETECTING APPARATUS Mar 12, 2012 Abandoned
Array ( [id] => 9498022 [patent_doc_number] => 08736850 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-05-27 [patent_title] => 'Method and device for measuring surfaces in a highly precise manner' [patent_app_type] => utility [patent_app_number] => 13/982455 [patent_app_country] => US [patent_app_date] => 2012-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4938 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13982455 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/982455
Method and device for measuring surfaces in a highly precise manner Feb 7, 2012 Issued
Array ( [id] => 8159302 [patent_doc_number] => 20120100643 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-04-26 [patent_title] => 'DAMAGE EVALUATION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, PRODUCTION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBER, AND GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBRANE' [patent_app_type] => utility [patent_app_number] => 13/342733 [patent_app_country] => US [patent_app_date] => 2012-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 18239 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20120100643.pdf [firstpage_image] =>[orig_patent_app_number] => 13342733 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/342733
DAMAGE EVALUATION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, PRODUCTION METHOD OF COMPOUND SEMICONDUCTOR MEMBER, GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBER, AND GALLIUM NITRIDE COMPOUND SEMICONDUCTOR MEMBRANE Jan 2, 2012 Abandoned
Array ( [id] => 8902461 [patent_doc_number] => 20130169964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-07-04 [patent_title] => 'System and Method for Error Correction in a Polarimeter' [patent_app_type] => utility [patent_app_number] => 13/340071 [patent_app_country] => US [patent_app_date] => 2011-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3354 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13340071 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/340071
System and method for error correction in a polarimeter Dec 28, 2011 Issued
Array ( [id] => 8889801 [patent_doc_number] => 20130162985 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-06-27 [patent_title] => 'REMOTE MONITORING OF TIGHTNESS OF STATOR WINDINGS' [patent_app_type] => utility [patent_app_number] => 13/334857 [patent_app_country] => US [patent_app_date] => 2011-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3456 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13334857 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/334857
Remote monitoring of tightness of stator windings Dec 21, 2011 Issued
Array ( [id] => 8039237 [patent_doc_number] => 20120069353 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-03-22 [patent_title] => 'PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METHOD FOR MANUFACTURING PRODUCT' [patent_app_type] => utility [patent_app_number] => 13/304658 [patent_app_country] => US [patent_app_date] => 2011-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8520 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20120069353.pdf [firstpage_image] =>[orig_patent_app_number] => 13304658 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/304658
Profile measuring apparatus, method for measuring profile, and method for manufacturing product Nov 26, 2011 Issued
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