
Vincent P. Canney
Examiner (ID: 2111)
| Most Active Art Unit | 2305 |
| Art Unit(s) | 2709, 2784, 2313, 2305, 2785, 2300, 2303, 2413 |
| Total Applications | 1739 |
| Issued Applications | 1512 |
| Pending Applications | 12 |
| Abandoned Applications | 215 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4046171
[patent_doc_number] => 05856981
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1999-01-05
[patent_title] => 'Reliable connection oriented networks'
[patent_app_type] => 1
[patent_app_number] => 8/856895
[patent_app_country] => US
[patent_app_date] => 1997-05-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/856/05856981.pdf
[firstpage_image] =>[orig_patent_app_number] => 856895
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/856895 | Reliable connection oriented networks | May 14, 1997 | Issued |
Array
(
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[patent_doc_number] => 05781558
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[patent_kind] => NA
[patent_issue_date] => 1998-07-14
[patent_title] => 'Diagnostic memory access'
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[firstpage_image] =>[orig_patent_app_number] => 854976
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/854976 | Diagnostic memory access | May 12, 1997 | Issued |
Array
(
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[patent_issue_date] => 1998-05-12
[patent_title] => 'Method and apparatus for efficient self testing of on-chip memory'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/853314 | Method and apparatus for efficient self testing of on-chip memory | May 7, 1997 | Issued |
Array
(
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[patent_issue_date] => 1998-12-01
[patent_title] => 'Test circuit and method for refresh and descrambling in an integrated memory circuit'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/850807 | Test circuit and method for refresh and descrambling in an integrated memory circuit | May 1, 1997 | Issued |
Array
(
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[patent_issue_date] => 1999-03-16
[patent_title] => 'Asymmetrical digital subscriber line (ADSL) block encoder circuit and method of operation'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/848902 | Asymmetrical digital subscriber line (ADSL) block encoder circuit and method of operation | Apr 30, 1997 | Issued |
Array
(
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[patent_doc_number] => 05784553
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[patent_issue_date] => 1998-07-21
[patent_title] => 'Method and system for generating a computer program test suite using dynamic symbolic execution of JAVA programs'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/846639 | Method and system for generating a computer program test suite using dynamic symbolic execution of JAVA programs | Apr 29, 1997 | Issued |
Array
(
[id] => 3883982
[patent_doc_number] => 05838694
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[patent_title] => 'Dual source data distribution system for integrated circuit tester'
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Array
(
[id] => 3874597
[patent_doc_number] => 05796749
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[patent_issue_date] => 1998-08-18
[patent_title] => 'Delay correction circuit for semiconductor tester'
[patent_app_type] => 1
[patent_app_number] => 8/776835
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/776835 | Delay correction circuit for semiconductor tester | Apr 24, 1997 | Issued |
Array
(
[id] => 3940719
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[patent_title] => 'Circuits and methods for read-enabling memory devices synchronously with the reaching of the minimum functionality conditions of the memory cells and reading circuits, particularly for non-volatile memories'
[patent_app_type] => 1
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/840056 | Circuits and methods for read-enabling memory devices synchronously with the reaching of the minimum functionality conditions of the memory cells and reading circuits, particularly for non-volatile memories | Apr 23, 1997 | Issued |
Array
(
[id] => 3940706
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[patent_issue_date] => 1999-03-02
[patent_title] => 'Mask ROM having redundancy function'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 08/838039 | Mask ROM having redundancy function | Apr 21, 1997 | Issued |
Array
(
[id] => 3994828
[patent_doc_number] => 05862147
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[patent_issue_date] => 1999-01-19
[patent_title] => 'Semiconductor device on semiconductor wafer having simple wirings for test and capable of being tested in a short time'
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Array
(
[id] => 3906397
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[patent_title] => 'Soft fuses using bist for cache self test'
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Array
(
[id] => 3972036
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[patent_title] => 'Three-value data storing semiconductor memory system'
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Array
(
[id] => 3875358
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[patent_title] => 'Method and apparatus for testing analog and digital circuitry within a larger circuit'
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Array
(
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Array
(
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Array
(
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Array
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Array
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Array
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