
Vincent P. Canney
Examiner (ID: 8153)
| Most Active Art Unit | 2305 |
| Art Unit(s) | 2305, 2413, 2303, 2785, 2709, 2313, 2784, 2300 |
| Total Applications | 1739 |
| Issued Applications | 1512 |
| Pending Applications | 12 |
| Abandoned Applications | 215 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3844776
[patent_doc_number] => 05740178
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-04-14
[patent_title] => 'Software for controlling a reliable backup memory'
[patent_app_type] => 1
[patent_app_number] => 8/703144
[patent_app_country] => US
[patent_app_date] => 1996-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2936
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/740/05740178.pdf
[firstpage_image] =>[orig_patent_app_number] => 703144
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/703144 | Software for controlling a reliable backup memory | Aug 28, 1996 | Issued |
Array
(
[id] => 3667477
[patent_doc_number] => 05659549
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-19
[patent_title] => 'Memory test system having a pattern generator for a multi-bit test'
[patent_app_type] => 1
[patent_app_number] => 8/702929
[patent_app_country] => US
[patent_app_date] => 1996-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4318
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/659/05659549.pdf
[firstpage_image] =>[orig_patent_app_number] => 702929
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/702929 | Memory test system having a pattern generator for a multi-bit test | Aug 25, 1996 | Issued |
Array
(
[id] => 3757623
[patent_doc_number] => 05717694
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-02-10
[patent_title] => 'Fail analysis device for semiconductor memory test system'
[patent_app_type] => 1
[patent_app_number] => 8/701699
[patent_app_country] => US
[patent_app_date] => 1996-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 16
[patent_no_of_words] => 3114
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/717/05717694.pdf
[firstpage_image] =>[orig_patent_app_number] => 701699
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/701699 | Fail analysis device for semiconductor memory test system | Aug 21, 1996 | Issued |
Array
(
[id] => 3675136
[patent_doc_number] => 05668816
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-16
[patent_title] => 'Method and apparatus for injecting errors into an array built-in self-test'
[patent_app_type] => 1
[patent_app_number] => 8/697036
[patent_app_country] => US
[patent_app_date] => 1996-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1799
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/668/05668816.pdf
[firstpage_image] =>[orig_patent_app_number] => 697036
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/697036 | Method and apparatus for injecting errors into an array built-in self-test | Aug 18, 1996 | Issued |
Array
(
[id] => 3805497
[patent_doc_number] => 05727006
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-03-10
[patent_title] => 'Apparatus and method for detecting and correcting reverse polarity, in a packet-based data communications system'
[patent_app_type] => 1
[patent_app_number] => 8/698374
[patent_app_country] => US
[patent_app_date] => 1996-08-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 22
[patent_no_of_words] => 20172
[patent_no_of_claims] => 56
[patent_no_of_ind_claims] => 20
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/727/05727006.pdf
[firstpage_image] =>[orig_patent_app_number] => 698374
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/698374 | Apparatus and method for detecting and correcting reverse polarity, in a packet-based data communications system | Aug 14, 1996 | Issued |
Array
(
[id] => 3675122
[patent_doc_number] => 05668815
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-16
[patent_title] => 'Method for testing integrated memory using an integrated DMA controller'
[patent_app_type] => 1
[patent_app_number] => 8/696734
[patent_app_country] => US
[patent_app_date] => 1996-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 11510
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/668/05668815.pdf
[firstpage_image] =>[orig_patent_app_number] => 696734
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/696734 | Method for testing integrated memory using an integrated DMA controller | Aug 13, 1996 | Issued |
Array
(
[id] => 3757722
[patent_doc_number] => 05717701
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-02-10
[patent_title] => 'Apparatus and method for testing interconnections between semiconductor devices'
[patent_app_type] => 1
[patent_app_number] => 8/702414
[patent_app_country] => US
[patent_app_date] => 1996-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 14
[patent_no_of_words] => 5968
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 130
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/717/05717701.pdf
[firstpage_image] =>[orig_patent_app_number] => 702414
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/702414 | Apparatus and method for testing interconnections between semiconductor devices | Aug 12, 1996 | Issued |
Array
(
[id] => 3874611
[patent_doc_number] => 05796750
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-08-18
[patent_title] => 'Method for programming a programmable logic device in an automatic tester'
[patent_app_type] => 1
[patent_app_number] => 8/696444
[patent_app_country] => US
[patent_app_date] => 1996-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 4049
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 235
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/796/05796750.pdf
[firstpage_image] =>[orig_patent_app_number] => 696444
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/696444 | Method for programming a programmable logic device in an automatic tester | Aug 12, 1996 | Issued |
Array
(
[id] => 3733844
[patent_doc_number] => 05673275
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-30
[patent_title] => 'Accelerated mode tester timing'
[patent_app_type] => 1
[patent_app_number] => 8/696346
[patent_app_country] => US
[patent_app_date] => 1996-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6682
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 88
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/673/05673275.pdf
[firstpage_image] =>[orig_patent_app_number] => 696346
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/696346 | Accelerated mode tester timing | Aug 12, 1996 | Issued |
Array
(
[id] => 3704029
[patent_doc_number] => 05651012
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-07-22
[patent_title] => 'Implementation of half-path joining in a system for global performance analysis of a latch-based design'
[patent_app_type] => 1
[patent_app_number] => 8/700596
[patent_app_country] => US
[patent_app_date] => 1996-08-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 7960
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/651/05651012.pdf
[firstpage_image] =>[orig_patent_app_number] => 700596
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/700596 | Implementation of half-path joining in a system for global performance analysis of a latch-based design | Aug 11, 1996 | Issued |
Array
(
[id] => 3914372
[patent_doc_number] => 05751736
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-05-12
[patent_title] => 'Testable electronic system'
[patent_app_type] => 1
[patent_app_number] => 8/694595
[patent_app_country] => US
[patent_app_date] => 1996-08-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3520
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 119
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/751/05751736.pdf
[firstpage_image] =>[orig_patent_app_number] => 694595
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/694595 | Testable electronic system | Aug 8, 1996 | Issued |
Array
(
[id] => 3675166
[patent_doc_number] => 05668818
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-09-16
[patent_title] => 'System and method for scan control of a programmable fuse circuit in an integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 8/692736
[patent_app_country] => US
[patent_app_date] => 1996-08-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5239
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 27
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/668/05668818.pdf
[firstpage_image] =>[orig_patent_app_number] => 692736
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/692736 | System and method for scan control of a programmable fuse circuit in an integrated circuit | Aug 5, 1996 | Issued |
Array
(
[id] => 3742652
[patent_doc_number] => 05694406
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-12-02
[patent_title] => 'Parallel associative processor formed from modified dram'
[patent_app_type] => 1
[patent_app_number] => 8/695125
[patent_app_country] => US
[patent_app_date] => 1996-08-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 5293
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 205
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/694/05694406.pdf
[firstpage_image] =>[orig_patent_app_number] => 695125
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/695125 | Parallel associative processor formed from modified dram | Aug 4, 1996 | Issued |
Array
(
[id] => 3658501
[patent_doc_number] => 05640404
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-06-17
[patent_title] => 'Limited probes device testing for high pin count digital devices'
[patent_app_type] => 1
[patent_app_number] => 8/693853
[patent_app_country] => US
[patent_app_date] => 1996-08-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5083
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/640/05640404.pdf
[firstpage_image] =>[orig_patent_app_number] => 693853
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/693853 | Limited probes device testing for high pin count digital devices | Aug 4, 1996 | Issued |
Array
(
[id] => 3802326
[patent_doc_number] => 05737518
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-04-07
[patent_title] => 'Method and apparatus for testing an object management system'
[patent_app_type] => 1
[patent_app_number] => 8/690580
[patent_app_country] => US
[patent_app_date] => 1996-07-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 8768
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 87
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/737/05737518.pdf
[firstpage_image] =>[orig_patent_app_number] => 690580
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/690580 | Method and apparatus for testing an object management system | Jul 30, 1996 | Issued |
Array
(
[id] => 3706045
[patent_doc_number] => 05619511
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-04-08
[patent_title] => 'Dynamic scan circuit and method for using the same'
[patent_app_type] => 1
[patent_app_number] => 8/692864
[patent_app_country] => US
[patent_app_date] => 1996-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 3532
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/619/05619511.pdf
[firstpage_image] =>[orig_patent_app_number] => 692864
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/692864 | Dynamic scan circuit and method for using the same | Jul 29, 1996 | Issued |
| 08/690379 | SELF INITIALIZING AND CORRECTING SHARED RESOURCE BOUNDARY SCAN WITH OUTPUT LATCHING | Jul 29, 1996 | Abandoned |
Array
(
[id] => 3775480
[patent_doc_number] => 05742758
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-04-21
[patent_title] => 'Password protecting ROM based utilities in an adapter ROM'
[patent_app_type] => 1
[patent_app_number] => 8/681740
[patent_app_country] => US
[patent_app_date] => 1996-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 7700
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/742/05742758.pdf
[firstpage_image] =>[orig_patent_app_number] => 681740
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/681740 | Password protecting ROM based utilities in an adapter ROM | Jul 28, 1996 | Issued |
Array
(
[id] => 3716550
[patent_doc_number] => 05654971
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1997-08-05
[patent_title] => 'Electronic circuit or board tester and method of testing an electronic device'
[patent_app_type] => 1
[patent_app_number] => 8/686794
[patent_app_country] => US
[patent_app_date] => 1996-07-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 5018
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/654/05654971.pdf
[firstpage_image] =>[orig_patent_app_number] => 686794
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/686794 | Electronic circuit or board tester and method of testing an electronic device | Jul 25, 1996 | Issued |
Array
(
[id] => 3868572
[patent_doc_number] => 05706295
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1998-01-06
[patent_title] => 'Method of checking design rules for semiconductor integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 8/686815
[patent_app_country] => US
[patent_app_date] => 1996-07-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 20
[patent_no_of_words] => 5435
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/706/05706295.pdf
[firstpage_image] =>[orig_patent_app_number] => 686815
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/686815 | Method of checking design rules for semiconductor integrated circuit | Jul 25, 1996 | Issued |