| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 18187060
[patent_doc_number] => 11577623
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-02-14
[patent_title] => System for predicting battery usage habits and battery discharge tendencies
[patent_app_type] => utility
[patent_app_number] => 16/694347
[patent_app_country] => US
[patent_app_date] => 2019-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6920
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 287
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694347
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/694347 | System for predicting battery usage habits and battery discharge tendencies | Nov 24, 2019 | Issued |
Array
(
[id] => 17379200
[patent_doc_number] => 11237207
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-02-01
[patent_title] => Semiconductor test socket with a floating plate and latch for holding the semiconductor device
[patent_app_type] => utility
[patent_app_number] => 16/694011
[patent_app_country] => US
[patent_app_date] => 2019-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4740
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694011
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/694011 | Semiconductor test socket with a floating plate and latch for holding the semiconductor device | Nov 24, 2019 | Issued |
Array
(
[id] => 15965621
[patent_doc_number] => 20200166562
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-05-28
[patent_title] => INSPECTION APPARATUS, TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD
[patent_app_type] => utility
[patent_app_number] => 16/694120
[patent_app_country] => US
[patent_app_date] => 2019-11-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2994
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694120
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/694120 | INSPECTION APPARATUS, TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD | Nov 24, 2019 | Abandoned |
Array
(
[id] => 16219119
[patent_doc_number] => 10734945
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2020-08-04
[patent_title] => Potential induced degradation test apparatus for solar cell and the method thereof
[patent_app_type] => utility
[patent_app_number] => 16/689722
[patent_app_country] => US
[patent_app_date] => 2019-11-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 8369
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 204
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16689722
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/689722 | Potential induced degradation test apparatus for solar cell and the method thereof | Nov 19, 2019 | Issued |
Array
(
[id] => 17252246
[patent_doc_number] => 11187730
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-11-30
[patent_title] => Probe head, probe coupler and probe arrangement
[patent_app_type] => utility
[patent_app_number] => 16/688648
[patent_app_country] => US
[patent_app_date] => 2019-11-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5485
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16688648
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/688648 | Probe head, probe coupler and probe arrangement | Nov 18, 2019 | Issued |
Array
(
[id] => 16075745
[patent_doc_number] => 20200191859
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-06-18
[patent_title] => FAILURE POSITIONING METHOD
[patent_app_type] => utility
[patent_app_number] => 16/681792
[patent_app_country] => US
[patent_app_date] => 2019-11-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3653
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 217
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16681792
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/681792 | Failure positioning method | Nov 11, 2019 | Issued |
Array
(
[id] => 17408231
[patent_doc_number] => 11249110
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-02-15
[patent_title] => Resistivity probes with curved portions
[patent_app_type] => utility
[patent_app_number] => 16/679223
[patent_app_country] => US
[patent_app_date] => 2019-11-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 52
[patent_no_of_words] => 6170
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16679223
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/679223 | Resistivity probes with curved portions | Nov 9, 2019 | Issued |
Array
(
[id] => 15901283
[patent_doc_number] => 20200150160
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-05-14
[patent_title] => CURRENT SENSING RECOVERY FOR IMAGING SYSTEMS AND METHODS
[patent_app_type] => utility
[patent_app_number] => 16/679042
[patent_app_country] => US
[patent_app_date] => 2019-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11533
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16679042
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/679042 | Current sensing recovery for imaging systems and methods | Nov 7, 2019 | Issued |
Array
(
[id] => 15965625
[patent_doc_number] => 20200166564
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-05-28
[patent_title] => PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 16/668093
[patent_app_country] => US
[patent_app_date] => 2019-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7816
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16668093
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/668093 | Probe device, electrical inspection apparatus, and electrical inspection method | Oct 29, 2019 | Issued |
Array
(
[id] => 18110893
[patent_doc_number] => 20230003773
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-05
[patent_title] => SYSTEMS, CIRCUITS, AND METHODS FOR DETERMINING STATUS OF FUSE OR RELAY
[patent_app_type] => utility
[patent_app_number] => 17/772717
[patent_app_country] => US
[patent_app_date] => 2019-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2505
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17772717
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/772717 | Systems, circuits, and methods for determining status of fuse or relay | Oct 28, 2019 | Issued |
Array
(
[id] => 16779399
[patent_doc_number] => 20210116477
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-04-22
[patent_title] => Corded Probe with Interface
[patent_app_type] => utility
[patent_app_number] => 16/658272
[patent_app_country] => US
[patent_app_date] => 2019-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2741
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16658272
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/658272 | Corded Probe with Interface | Oct 20, 2019 | Abandoned |
Array
(
[id] => 16986371
[patent_doc_number] => 11073536
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-07-27
[patent_title] => ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly
[patent_app_type] => utility
[patent_app_number] => 16/654437
[patent_app_country] => US
[patent_app_date] => 2019-10-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 8961
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16654437
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/654437 | ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly | Oct 15, 2019 | Issued |
Array
(
[id] => 17394237
[patent_doc_number] => 11243244
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-02-08
[patent_title] => Switched bypass capacitor for component characterization
[patent_app_type] => utility
[patent_app_number] => 16/598532
[patent_app_country] => US
[patent_app_date] => 2019-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 7178
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16598532
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/598532 | Switched bypass capacitor for component characterization | Oct 9, 2019 | Issued |
Array
(
[id] => 16550881
[patent_doc_number] => 10884035
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-01-05
[patent_title] => Semiconductor device, semiconductor system, and control method of semiconductor device
[patent_app_type] => utility
[patent_app_number] => 16/595635
[patent_app_country] => US
[patent_app_date] => 2019-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 18
[patent_no_of_words] => 8576
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16595635
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/595635 | Semiconductor device, semiconductor system, and control method of semiconductor device | Oct 7, 2019 | Issued |
Array
(
[id] => 17135890
[patent_doc_number] => 11137441
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-10-05
[patent_title] => Device for testing electronic devices in adjustable and accurate simulation of real-world environments
[patent_app_type] => utility
[patent_app_number] => 16/596230
[patent_app_country] => US
[patent_app_date] => 2019-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1941
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16596230
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/596230 | Device for testing electronic devices in adjustable and accurate simulation of real-world environments | Oct 7, 2019 | Issued |
Array
(
[id] => 15771483
[patent_doc_number] => 20200116759
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-04-16
[patent_title] => TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
[patent_app_type] => utility
[patent_app_number] => 16/593200
[patent_app_country] => US
[patent_app_date] => 2019-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3150
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16593200
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/593200 | TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION | Oct 3, 2019 | Abandoned |
Array
(
[id] => 17164203
[patent_doc_number] => 11150295
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2021-10-19
[patent_title] => Relay circuit for reducing a voltage glitch during device testing
[patent_app_type] => utility
[patent_app_number] => 16/590581
[patent_app_country] => US
[patent_app_date] => 2019-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6165
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16590581
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/590581 | Relay circuit for reducing a voltage glitch during device testing | Oct 1, 2019 | Issued |
| 16/584863 | Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making | Sep 25, 2019 | Abandoned |
Array
(
[id] => 17282542
[patent_doc_number] => 11199568
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-12-14
[patent_title] => Millimeter wave active load pull using low frequency phase and amplitude tuning
[patent_app_type] => utility
[patent_app_number] => 16/580553
[patent_app_country] => US
[patent_app_date] => 2019-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3536
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16580553
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/580553 | Millimeter wave active load pull using low frequency phase and amplitude tuning | Sep 23, 2019 | Issued |
Array
(
[id] => 15683787
[patent_doc_number] => 20200096557
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-03-26
[patent_title] => INSPECTION APPARATUS AND INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 16/575552
[patent_app_country] => US
[patent_app_date] => 2019-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6098
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -7
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575552
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/575552 | Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device | Sep 18, 2019 | Issued |