Search

Vinh P Nguyen

Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )

Most Active Art Unit
2858
Art Unit(s)
2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899
Total Applications
3696
Issued Applications
3184
Pending Applications
137
Abandoned Applications
409

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18187060 [patent_doc_number] => 11577623 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-02-14 [patent_title] => System for predicting battery usage habits and battery discharge tendencies [patent_app_type] => utility [patent_app_number] => 16/694347 [patent_app_country] => US [patent_app_date] => 2019-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6920 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 287 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694347 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/694347
System for predicting battery usage habits and battery discharge tendencies Nov 24, 2019 Issued
Array ( [id] => 17379200 [patent_doc_number] => 11237207 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-02-01 [patent_title] => Semiconductor test socket with a floating plate and latch for holding the semiconductor device [patent_app_type] => utility [patent_app_number] => 16/694011 [patent_app_country] => US [patent_app_date] => 2019-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4740 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694011 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/694011
Semiconductor test socket with a floating plate and latch for holding the semiconductor device Nov 24, 2019 Issued
Array ( [id] => 15965621 [patent_doc_number] => 20200166562 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-05-28 [patent_title] => INSPECTION APPARATUS, TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD [patent_app_type] => utility [patent_app_number] => 16/694120 [patent_app_country] => US [patent_app_date] => 2019-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2994 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16694120 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/694120
INSPECTION APPARATUS, TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD Nov 24, 2019 Abandoned
Array ( [id] => 16219119 [patent_doc_number] => 10734945 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-08-04 [patent_title] => Potential induced degradation test apparatus for solar cell and the method thereof [patent_app_type] => utility [patent_app_number] => 16/689722 [patent_app_country] => US [patent_app_date] => 2019-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 8369 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16689722 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/689722
Potential induced degradation test apparatus for solar cell and the method thereof Nov 19, 2019 Issued
Array ( [id] => 17252246 [patent_doc_number] => 11187730 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-11-30 [patent_title] => Probe head, probe coupler and probe arrangement [patent_app_type] => utility [patent_app_number] => 16/688648 [patent_app_country] => US [patent_app_date] => 2019-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5485 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16688648 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/688648
Probe head, probe coupler and probe arrangement Nov 18, 2019 Issued
Array ( [id] => 16075745 [patent_doc_number] => 20200191859 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-06-18 [patent_title] => FAILURE POSITIONING METHOD [patent_app_type] => utility [patent_app_number] => 16/681792 [patent_app_country] => US [patent_app_date] => 2019-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3653 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16681792 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/681792
Failure positioning method Nov 11, 2019 Issued
Array ( [id] => 17408231 [patent_doc_number] => 11249110 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-02-15 [patent_title] => Resistivity probes with curved portions [patent_app_type] => utility [patent_app_number] => 16/679223 [patent_app_country] => US [patent_app_date] => 2019-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 52 [patent_no_of_words] => 6170 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16679223 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/679223
Resistivity probes with curved portions Nov 9, 2019 Issued
Array ( [id] => 15901283 [patent_doc_number] => 20200150160 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-05-14 [patent_title] => CURRENT SENSING RECOVERY FOR IMAGING SYSTEMS AND METHODS [patent_app_type] => utility [patent_app_number] => 16/679042 [patent_app_country] => US [patent_app_date] => 2019-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11533 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16679042 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/679042
Current sensing recovery for imaging systems and methods Nov 7, 2019 Issued
Array ( [id] => 15965625 [patent_doc_number] => 20200166564 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-05-28 [patent_title] => PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 16/668093 [patent_app_country] => US [patent_app_date] => 2019-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7816 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16668093 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/668093
Probe device, electrical inspection apparatus, and electrical inspection method Oct 29, 2019 Issued
Array ( [id] => 18110893 [patent_doc_number] => 20230003773 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => SYSTEMS, CIRCUITS, AND METHODS FOR DETERMINING STATUS OF FUSE OR RELAY [patent_app_type] => utility [patent_app_number] => 17/772717 [patent_app_country] => US [patent_app_date] => 2019-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2505 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17772717 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/772717
Systems, circuits, and methods for determining status of fuse or relay Oct 28, 2019 Issued
Array ( [id] => 16779399 [patent_doc_number] => 20210116477 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-22 [patent_title] => Corded Probe with Interface [patent_app_type] => utility [patent_app_number] => 16/658272 [patent_app_country] => US [patent_app_date] => 2019-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2741 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16658272 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/658272
Corded Probe with Interface Oct 20, 2019 Abandoned
Array ( [id] => 16986371 [patent_doc_number] => 11073536 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-07-27 [patent_title] => ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly [patent_app_type] => utility [patent_app_number] => 16/654437 [patent_app_country] => US [patent_app_date] => 2019-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8961 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16654437 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/654437
ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly Oct 15, 2019 Issued
Array ( [id] => 17394237 [patent_doc_number] => 11243244 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-02-08 [patent_title] => Switched bypass capacitor for component characterization [patent_app_type] => utility [patent_app_number] => 16/598532 [patent_app_country] => US [patent_app_date] => 2019-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7178 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16598532 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/598532
Switched bypass capacitor for component characterization Oct 9, 2019 Issued
Array ( [id] => 16550881 [patent_doc_number] => 10884035 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-01-05 [patent_title] => Semiconductor device, semiconductor system, and control method of semiconductor device [patent_app_type] => utility [patent_app_number] => 16/595635 [patent_app_country] => US [patent_app_date] => 2019-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 8576 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16595635 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/595635
Semiconductor device, semiconductor system, and control method of semiconductor device Oct 7, 2019 Issued
Array ( [id] => 17135890 [patent_doc_number] => 11137441 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-05 [patent_title] => Device for testing electronic devices in adjustable and accurate simulation of real-world environments [patent_app_type] => utility [patent_app_number] => 16/596230 [patent_app_country] => US [patent_app_date] => 2019-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1941 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16596230 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/596230
Device for testing electronic devices in adjustable and accurate simulation of real-world environments Oct 7, 2019 Issued
Array ( [id] => 15771483 [patent_doc_number] => 20200116759 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-04-16 [patent_title] => TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION [patent_app_type] => utility [patent_app_number] => 16/593200 [patent_app_country] => US [patent_app_date] => 2019-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3150 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16593200 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/593200
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION Oct 3, 2019 Abandoned
Array ( [id] => 17164203 [patent_doc_number] => 11150295 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-10-19 [patent_title] => Relay circuit for reducing a voltage glitch during device testing [patent_app_type] => utility [patent_app_number] => 16/590581 [patent_app_country] => US [patent_app_date] => 2019-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6165 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16590581 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/590581
Relay circuit for reducing a voltage glitch during device testing Oct 1, 2019 Issued
16/584863 Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making Sep 25, 2019 Abandoned
Array ( [id] => 17282542 [patent_doc_number] => 11199568 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-14 [patent_title] => Millimeter wave active load pull using low frequency phase and amplitude tuning [patent_app_type] => utility [patent_app_number] => 16/580553 [patent_app_country] => US [patent_app_date] => 2019-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3536 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16580553 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/580553
Millimeter wave active load pull using low frequency phase and amplitude tuning Sep 23, 2019 Issued
Array ( [id] => 15683787 [patent_doc_number] => 20200096557 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-03-26 [patent_title] => INSPECTION APPARATUS AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 16/575552 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6098 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575552 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/575552
Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device Sep 18, 2019 Issued
Menu