
Vinh P. Nguyen
Examiner (ID: 16647, Phone: (571)272-1964 , Office: P/2867 )
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2829, 2899, 2858, 2867, 2213, 3621, 2607, 2731 |
| Total Applications | 3723 |
| Issued Applications | 3204 |
| Pending Applications | 132 |
| Abandoned Applications | 411 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 13225113
[patent_doc_number] => 10126328
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2018-11-13
[patent_title] => Electrical measurement test fixture
[patent_app_type] => utility
[patent_app_number] => 15/330902
[patent_app_country] => US
[patent_app_date] => 2016-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2556
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 282
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15330902
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/330902 | Electrical measurement test fixture | Nov 14, 2016 | Issued |
Array
(
[id] => 11472863
[patent_doc_number] => 20170059645
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-03-02
[patent_title] => 'Addressable test circuit and test method for key parameters of transistors'
[patent_app_type] => utility
[patent_app_number] => 15/351421
[patent_app_country] => US
[patent_app_date] => 2016-11-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 8291
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15351421
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/351421 | Addressable test circuit and test method for key parameters of transistors | Nov 13, 2016 | Issued |
Array
(
[id] => 16415703
[patent_doc_number] => 10823585
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2020-11-03
[patent_title] => Contactless motion sensor for a magnetic bearing
[patent_app_type] => utility
[patent_app_number] => 16/075076
[patent_app_country] => US
[patent_app_date] => 2016-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 4115
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16075076
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/075076 | Contactless motion sensor for a magnetic bearing | Nov 8, 2016 | Issued |
Array
(
[id] => 13211267
[patent_doc_number] => 10119998
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-11-06
[patent_title] => Variable capacitance non-contact AC voltage measurement system
[patent_app_type] => utility
[patent_app_number] => 15/345256
[patent_app_country] => US
[patent_app_date] => 2016-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 8324
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 163
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15345256
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/345256 | Variable capacitance non-contact AC voltage measurement system | Nov 6, 2016 | Issued |
Array
(
[id] => 11674526
[patent_doc_number] => 20170163250
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-06-08
[patent_title] => 'DELAY CIRCUIT AND TEST METHOD OF DELAY CIRCUIT'
[patent_app_type] => utility
[patent_app_number] => 15/344722
[patent_app_country] => US
[patent_app_date] => 2016-11-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 4928
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15344722
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/344722 | Test method of delay circuit including delay line | Nov 6, 2016 | Issued |
Array
(
[id] => 11621162
[patent_doc_number] => 20170131349
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-05-11
[patent_title] => 'Waveform Mapping and Gated Laser Voltage Imaging'
[patent_app_type] => utility
[patent_app_number] => 15/344366
[patent_app_country] => US
[patent_app_date] => 2016-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5737
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15344366
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/344366 | Waveform mapping and gated laser voltage imaging | Nov 3, 2016 | Issued |
Array
(
[id] => 13239277
[patent_doc_number] => 10132834
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-11-20
[patent_title] => Probe
[patent_app_type] => utility
[patent_app_number] => 15/343231
[patent_app_country] => US
[patent_app_date] => 2016-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1862
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15343231
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/343231 | Probe | Nov 3, 2016 | Issued |
Array
(
[id] => 12683380
[patent_doc_number] => 20180119626
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-05-03
[patent_title] => METHOD FOR DETERMINING A CHARACTERISTIC OF AN ACTUATOR
[patent_app_type] => utility
[patent_app_number] => 15/342567
[patent_app_country] => US
[patent_app_date] => 2016-11-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10729
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -23
[patent_words_short_claim] => 287
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15342567
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/342567 | Method and actuator for use on an engine having a monitoring arrangement for determining a characteristic of [(and)] the actuator and system | Nov 2, 2016 | Issued |
Array
(
[id] => 13465277
[patent_doc_number] => 20180284181
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-10-04
[patent_title] => ON-LINE HEALTH MANAGEMENT DEVICE AND METHOD FOR INSULATED GATE BIPOLAR TRANSISTOR
[patent_app_type] => utility
[patent_app_number] => 15/764999
[patent_app_country] => US
[patent_app_date] => 2016-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3705
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 107
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15764999
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/764999 | ON-LINE HEALTH MANAGEMENT DEVICE AND METHOD FOR INSULATED GATE BIPOLAR TRANSISTOR | Oct 31, 2016 | Abandoned |
Array
(
[id] => 11650693
[patent_doc_number] => 20170146594
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-05-25
[patent_title] => 'PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT BETWEEN A PROBE AND A DEVICE UNDER TEST DURING A TEMPERATURE CHANGE'
[patent_app_type] => utility
[patent_app_number] => 15/339419
[patent_app_country] => US
[patent_app_date] => 2016-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 13503
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15339419
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/339419 | Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change | Oct 30, 2016 | Issued |
Array
(
[id] => 11605677
[patent_doc_number] => 20170122979
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-05-04
[patent_title] => 'ELECTRICAL MEASUREMENT DEVICES'
[patent_app_type] => utility
[patent_app_number] => 15/335546
[patent_app_country] => US
[patent_app_date] => 2016-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 2255
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15335546
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/335546 | Electrical measurement devices for a device under test | Oct 26, 2016 | Issued |
Array
(
[id] => 15787629
[patent_doc_number] => 10627536
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2020-04-21
[patent_title] => Real and imaginary components of electromagnetic logging measurements
[patent_app_type] => utility
[patent_app_number] => 15/773638
[patent_app_country] => US
[patent_app_date] => 2016-10-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 22
[patent_no_of_words] => 6109
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15773638
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/773638 | Real and imaginary components of electromagnetic logging measurements | Oct 13, 2016 | Issued |
Array
(
[id] => 16415984
[patent_doc_number] => 10823869
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2020-11-03
[patent_title] => Current injection via capacitive coupling
[patent_app_type] => utility
[patent_app_number] => 16/322887
[patent_app_country] => US
[patent_app_date] => 2016-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 30
[patent_no_of_words] => 13444
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 144
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16322887
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/322887 | Current injection via capacitive coupling | Sep 27, 2016 | Issued |
Array
(
[id] => 13755015
[patent_doc_number] => 10170461
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-01-01
[patent_title] => ESD hard backend structures in nanometer dimension
[patent_app_type] => utility
[patent_app_number] => 15/271272
[patent_app_country] => US
[patent_app_date] => 2016-09-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 7559
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 221
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15271272
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/271272 | ESD hard backend structures in nanometer dimension | Sep 20, 2016 | Issued |
Array
(
[id] => 13239331
[patent_doc_number] => 10132861
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2018-11-20
[patent_title] => Visible laser circuit fault isolation
[patent_app_type] => utility
[patent_app_number] => 15/268463
[patent_app_country] => US
[patent_app_date] => 2016-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3494
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 105
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15268463
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/268463 | Visible laser circuit fault isolation | Sep 15, 2016 | Issued |
Array
(
[id] => 14060421
[patent_doc_number] => 10234501
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-03-19
[patent_title] => Active noise suppression for optical voltage sensor
[patent_app_type] => utility
[patent_app_number] => 15/268184
[patent_app_country] => US
[patent_app_date] => 2016-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1998
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 81
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15268184
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/268184 | Active noise suppression for optical voltage sensor | Sep 15, 2016 | Issued |
Array
(
[id] => 12241254
[patent_doc_number] => 20180074118
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-03-15
[patent_title] => 'HEATABLE INTERPOSER FOR TEMPERATURE-CONTROLLED TESTING OF SEMICONDUCTOR DEVICES'
[patent_app_type] => utility
[patent_app_number] => 15/265991
[patent_app_country] => US
[patent_app_date] => 2016-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3515
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15265991
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/265991 | Heatable interposer for temperature-controlled testing of semiconductor devices | Sep 14, 2016 | Issued |
Array
(
[id] => 12241230
[patent_doc_number] => 20180074094
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-03-15
[patent_title] => 'ICT PROBE CONTACT IMPROVEMENT'
[patent_app_type] => utility
[patent_app_number] => 15/264963
[patent_app_country] => US
[patent_app_date] => 2016-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3580
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15264963
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/264963 | ICT probe contact improvement | Sep 13, 2016 | Issued |
Array
(
[id] => 13431145
[patent_doc_number] => 20180267115
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-09-20
[patent_title] => SUPERCONDUCTING DEVICE AND METHOD OF MANUFACTURING A SUPERCONDUCTING DEVICE
[patent_app_type] => utility
[patent_app_number] => 15/756515
[patent_app_country] => US
[patent_app_date] => 2016-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4815
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 33
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15756515
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/756515 | Quantum interference device, device incorporating same, and method of manufacturing a quantum interference device | Aug 25, 2016 | Issued |
Array
(
[id] => 14147985
[patent_doc_number] => 10254364
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-04-09
[patent_title] => Optimizing a slice orientation
[patent_app_type] => utility
[patent_app_number] => 15/230674
[patent_app_country] => US
[patent_app_date] => 2016-08-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 6537
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15230674
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/230674 | Optimizing a slice orientation | Aug 7, 2016 | Issued |