Search

Vinh P Nguyen

Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )

Most Active Art Unit
2858
Art Unit(s)
2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899
Total Applications
3696
Issued Applications
3184
Pending Applications
137
Abandoned Applications
409

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18973294 [patent_doc_number] => 20240053386 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-15 [patent_title] => VOLTAGE DROOP AND TEMPERATURE DETECTOR [patent_app_type] => utility [patent_app_number] => 18/362532 [patent_app_country] => US [patent_app_date] => 2023-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5309 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18362532 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/362532
VOLTAGE DROOP AND TEMPERATURE DETECTOR Jul 30, 2023 Pending
Array ( [id] => 20387534 [patent_doc_number] => 12487259 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Contactless power meter [patent_app_type] => utility [patent_app_number] => 18/361360 [patent_app_country] => US [patent_app_date] => 2023-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18361360 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/361360
Contactless power meter Jul 27, 2023 Issued
Array ( [id] => 20316753 [patent_doc_number] => 12455300 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-28 [patent_title] => Current measurement apparatus [patent_app_type] => utility [patent_app_number] => 18/215313 [patent_app_country] => US [patent_app_date] => 2023-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 0 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18215313 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/215313
Current measurement apparatus Jul 24, 2023 Issued
Array ( [id] => 19710553 [patent_doc_number] => 20250020695 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => ROGOWSKI INTEGRATOR KIT AND ROGOWSKI COIL [patent_app_type] => utility [patent_app_number] => 18/221400 [patent_app_country] => US [patent_app_date] => 2023-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2915 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 23 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18221400 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/221400
ROGOWSKI INTEGRATOR KIT AND ROGOWSKI COIL Jul 12, 2023 Pending
Array ( [id] => 18772123 [patent_doc_number] => 20230366945 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-16 [patent_title] => METHOD FOR ESTIMATING AN SOH OF A BATTERY PACK AND HOUSEHOLD ENERGY STORAGE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/350399 [patent_app_country] => US [patent_app_date] => 2023-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8838 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350399 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/350399
Method and system for estimating state of health (SOH) of battery pack for household energy storage Jul 10, 2023 Issued
Array ( [id] => 18924509 [patent_doc_number] => 20240027513 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS [patent_app_type] => utility [patent_app_number] => 18/220222 [patent_app_country] => US [patent_app_date] => 2023-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6777 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18220222 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/220222
AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS Jul 9, 2023 Pending
Array ( [id] => 20257167 [patent_doc_number] => 12429514 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-30 [patent_title] => Partial discharge measurement system that includes a first bandpass filter and a second bandpass filter and partial discharge measurement method [patent_app_type] => utility [patent_app_number] => 18/348884 [patent_app_country] => US [patent_app_date] => 2023-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 1116 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18348884 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/348884
Partial discharge measurement system that includes a first bandpass filter and a second bandpass filter and partial discharge measurement method Jul 6, 2023 Issued
Array ( [id] => 18903999 [patent_doc_number] => 20240019484 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-18 [patent_title] => Automatic Selection of Connecting Cables for In-line Test [patent_app_type] => utility [patent_app_number] => 18/347268 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5141 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347268 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/347268
Automatic Selection of Connecting Cables for In-line Test Jul 4, 2023 Pending
Array ( [id] => 20358406 [patent_doc_number] => 12474398 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Test board capable of regulating testing temperature of semiconductor devices [patent_app_type] => utility [patent_app_number] => 18/341861 [patent_app_country] => US [patent_app_date] => 2023-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1151 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18341861 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/341861
Test board capable of regulating testing temperature of semiconductor devices Jun 26, 2023 Issued
Array ( [id] => 20078750 [patent_doc_number] => 12352810 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => System for testing performance of device in temperature load test [patent_app_type] => utility [patent_app_number] => 18/341860 [patent_app_country] => US [patent_app_date] => 2023-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4522 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18341860 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/341860
System for testing performance of device in temperature load test Jun 26, 2023 Issued
Array ( [id] => 19092097 [patent_doc_number] => 11953544 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-04-09 [patent_title] => Systems and methods for testing functionality and performance of a sensor and hub [patent_app_type] => utility [patent_app_number] => 18/337973 [patent_app_country] => US [patent_app_date] => 2023-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8753 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18337973 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/337973
Systems and methods for testing functionality and performance of a sensor and hub Jun 19, 2023 Issued
Array ( [id] => 20330870 [patent_doc_number] => 12461142 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-04 [patent_title] => Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus [patent_app_type] => utility [patent_app_number] => 18/333209 [patent_app_country] => US [patent_app_date] => 2023-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1134 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18333209 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/333209
Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus Jun 11, 2023 Issued
Array ( [id] => 19632490 [patent_doc_number] => 20240410939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => Improved Thermal and Electrical Conductivity Between Metal Contacts [patent_app_type] => utility [patent_app_number] => 18/332344 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10657 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18332344 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/332344
Thermal and electrical conductivity between metal contacts utilizing spring pin connectors Jun 8, 2023 Issued
Array ( [id] => 18880300 [patent_doc_number] => 20240003669 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-04 [patent_title] => THICKNESS MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 18/207916 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4257 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207916 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207916
System for measuring a thickness of a layer coated on a body Jun 8, 2023 Issued
Array ( [id] => 19068643 [patent_doc_number] => 20240103069 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-28 [patent_title] => METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/331472 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9546 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331472 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331472
Electrical testing method for semiconductor device Jun 7, 2023 Issued
Array ( [id] => 19021359 [patent_doc_number] => 20240077530 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING DIAGNOSTIC PROGRAM OF THE TEST BOARD [patent_app_type] => utility [patent_app_number] => 18/331596 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7919 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331596 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331596
Test board including test executable integrated circuit for testing a device under test, and diagnostic system, diagnostic method, and non-transitory computer-readable storage medium storing diagnostic program of the test board Jun 7, 2023 Issued
Array ( [id] => 18676879 [patent_doc_number] => 20230314512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 18/330222 [patent_app_country] => US [patent_app_date] => 2023-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8930 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18330222 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/330222
Passive carrier-based device delivery for slot-based high-volume semiconductor test system Jun 5, 2023 Issued
Array ( [id] => 20159326 [patent_doc_number] => 12385947 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same [patent_app_type] => utility [patent_app_number] => 18/327148 [patent_app_country] => US [patent_app_date] => 2023-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18327148 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/327148
Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same May 31, 2023 Issued
Array ( [id] => 19204015 [patent_doc_number] => 20240175914 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => ELECTRONIC DEVICE [patent_app_type] => utility [patent_app_number] => 18/326030 [patent_app_country] => US [patent_app_date] => 2023-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18326030 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/326030
Electronic device May 30, 2023 Issued
Array ( [id] => 19433930 [patent_doc_number] => 20240302428 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => TESTING DEVICE AND TESTING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/317100 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2991 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18317100 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/317100
Testing device and testing method thereof May 14, 2023 Issued
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