Search

Vinh P. Nguyen

Examiner (ID: 18804, Phone: (571)272-1964 , Office: P/2867 )

Most Active Art Unit
2858
Art Unit(s)
2607, 2213, 2867, 2858, 2731, 2899, 2829, 3621
Total Applications
3762
Issued Applications
3225
Pending Applications
146
Abandoned Applications
412

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18772123 [patent_doc_number] => 20230366945 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-16 [patent_title] => METHOD FOR ESTIMATING AN SOH OF A BATTERY PACK AND HOUSEHOLD ENERGY STORAGE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/350399 [patent_app_country] => US [patent_app_date] => 2023-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8838 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350399 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/350399
Method and system for estimating state of health (SOH) of battery pack for household energy storage Jul 10, 2023 Issued
Array ( [id] => 20866440 [patent_doc_number] => 12693325 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-07-28 [patent_title] => System and method for determining probe skew [patent_app_type] => utility [patent_app_number] => 18/220222 [patent_app_country] => US [patent_app_date] => 2023-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 2114 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18220222 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/220222
AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS Jul 9, 2023 Pending
Array ( [id] => 20257167 [patent_doc_number] => 12429514 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-30 [patent_title] => Partial discharge measurement system that includes a first bandpass filter and a second bandpass filter and partial discharge measurement method [patent_app_type] => utility [patent_app_number] => 18/348884 [patent_app_country] => US [patent_app_date] => 2023-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 1116 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18348884 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/348884
Partial discharge measurement system that includes a first bandpass filter and a second bandpass filter and partial discharge measurement method Jul 6, 2023 Issued
Array ( [id] => 18903999 [patent_doc_number] => 20240019484 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-18 [patent_title] => Automatic Selection of Connecting Cables for In-line Test [patent_app_type] => utility [patent_app_number] => 18/347268 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5141 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347268 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/347268
Automatic Selection of Connecting Cables for In-line Test Jul 4, 2023 Abandoned
Array ( [id] => 20358406 [patent_doc_number] => 12474398 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Test board capable of regulating testing temperature of semiconductor devices [patent_app_type] => utility [patent_app_number] => 18/341861 [patent_app_country] => US [patent_app_date] => 2023-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1151 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18341861 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/341861
Test board capable of regulating testing temperature of semiconductor devices Jun 26, 2023 Issued
Array ( [id] => 20078750 [patent_doc_number] => 12352810 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => System for testing performance of device in temperature load test [patent_app_type] => utility [patent_app_number] => 18/341860 [patent_app_country] => US [patent_app_date] => 2023-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4522 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18341860 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/341860
System for testing performance of device in temperature load test Jun 26, 2023 Issued
Array ( [id] => 19092097 [patent_doc_number] => 11953544 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-04-09 [patent_title] => Systems and methods for testing functionality and performance of a sensor and hub [patent_app_type] => utility [patent_app_number] => 18/337973 [patent_app_country] => US [patent_app_date] => 2023-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8753 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18337973 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/337973
Systems and methods for testing functionality and performance of a sensor and hub Jun 19, 2023 Issued
Array ( [id] => 20330870 [patent_doc_number] => 12461142 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-04 [patent_title] => Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus [patent_app_type] => utility [patent_app_number] => 18/333209 [patent_app_country] => US [patent_app_date] => 2023-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1134 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18333209 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/333209
Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus Jun 11, 2023 Issued
Array ( [id] => 19632490 [patent_doc_number] => 20240410939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => Improved Thermal and Electrical Conductivity Between Metal Contacts [patent_app_type] => utility [patent_app_number] => 18/332344 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10657 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18332344 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/332344
Thermal and electrical conductivity between metal contacts utilizing spring pin connectors Jun 8, 2023 Issued
Array ( [id] => 18880300 [patent_doc_number] => 20240003669 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-04 [patent_title] => THICKNESS MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 18/207916 [patent_app_country] => US [patent_app_date] => 2023-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4257 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207916 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207916
System for measuring a thickness of a layer coated on a body Jun 8, 2023 Issued
Array ( [id] => 19634543 [patent_doc_number] => 20240412992 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => SYSTEM AND METHOD FOR ALIGNING A WAFER TO A CHUCK [patent_app_type] => utility [patent_app_number] => 18/207553 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5531 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18207553 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/207553
SYSTEM AND METHOD FOR ALIGNING A WAFER TO A CHUCK Jun 7, 2023 Pending
Array ( [id] => 19021359 [patent_doc_number] => 20240077530 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING DIAGNOSTIC PROGRAM OF THE TEST BOARD [patent_app_type] => utility [patent_app_number] => 18/331596 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7919 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331596 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331596
Test board including test executable integrated circuit for testing a device under test, and diagnostic system, diagnostic method, and non-transitory computer-readable storage medium storing diagnostic program of the test board Jun 7, 2023 Issued
Array ( [id] => 19068643 [patent_doc_number] => 20240103069 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-28 [patent_title] => METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/331472 [patent_app_country] => US [patent_app_date] => 2023-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9546 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18331472 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/331472
Electrical testing method for semiconductor device Jun 7, 2023 Issued
Array ( [id] => 18676879 [patent_doc_number] => 20230314512 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 18/330222 [patent_app_country] => US [patent_app_date] => 2023-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8930 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18330222 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/330222
Passive carrier-based device delivery for slot-based high-volume semiconductor test system Jun 5, 2023 Issued
Array ( [id] => 20159326 [patent_doc_number] => 12385947 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same [patent_app_type] => utility [patent_app_number] => 18/327148 [patent_app_country] => US [patent_app_date] => 2023-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18327148 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/327148
Direct liquid cooling system for electronic devices in sockets, method, and electronic device testing apparatus comprising the same May 31, 2023 Issued
Array ( [id] => 19204015 [patent_doc_number] => 20240175914 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => ELECTRONIC DEVICE [patent_app_type] => utility [patent_app_number] => 18/326030 [patent_app_country] => US [patent_app_date] => 2023-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18326030 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/326030
Electronic device May 30, 2023 Issued
Array ( [id] => 20882968 [patent_doc_number] => 12699008 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-08-04 [patent_title] => Test systems configured to test devices at different temperatures [patent_app_type] => utility [patent_app_number] => 18/197445 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18197445 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/197445
TEST SYSTEMS CONFIGURED TO TEST DEVICES AT DIFFERENT TEMPERATURES May 14, 2023 Pending
Array ( [id] => 19433930 [patent_doc_number] => 20240302428 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => TESTING DEVICE AND TESTING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/317100 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2991 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18317100 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/317100
Testing device and testing method thereof May 14, 2023 Issued
Array ( [id] => 19502012 [patent_doc_number] => 20240341030 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => Printed Circuit Board Structure and Printed Circuit Board Detection Method [patent_app_type] => utility [patent_app_number] => 18/143611 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2928 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18143611 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/143611
Printed Circuit Board Structure and Printed Circuit Board Detection Method May 4, 2023 Pending
Array ( [id] => 20358385 [patent_doc_number] => 12474376 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-18 [patent_title] => Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing [patent_app_type] => utility [patent_app_number] => 18/140448 [patent_app_country] => US [patent_app_date] => 2023-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18140448 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/140448
Apparatus and method for 2-phase cooling of test array and condensation prevention during device testing Apr 26, 2023 Issued
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