
Vinh P Nguyen
Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899 |
| Total Applications | 3696 |
| Issued Applications | 3184 |
| Pending Applications | 137 |
| Abandoned Applications | 409 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 18282637
[patent_doc_number] => 20230098109
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-30
[patent_title] => ENVIRONMENTAL SENSOR
[patent_app_type] => utility
[patent_app_number] => 17/894837
[patent_app_country] => US
[patent_app_date] => 2022-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3795
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17894837
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/894837 | Environmental sensor circuit having a capacitive proximity sensor and magnetic field probe | Aug 23, 2022 | Issued |
Array
(
[id] => 19582209
[patent_doc_number] => 12148334
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-11-19
[patent_title] => Display device including crack detection patterns
[patent_app_type] => utility
[patent_app_number] => 17/893039
[patent_app_country] => US
[patent_app_date] => 2022-08-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 20
[patent_no_of_words] => 14288
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893039
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/893039 | Display device including crack detection patterns | Aug 21, 2022 | Issued |
Array
(
[id] => 19581321
[patent_doc_number] => 12147436
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-11-19
[patent_title] => Battery information processing system and battery information processing method to identify batteries in accordance with a specification
[patent_app_type] => utility
[patent_app_number] => 17/885492
[patent_app_country] => US
[patent_app_date] => 2022-08-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 4645
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 191
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17885492
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/885492 | Battery information processing system and battery information processing method to identify batteries in accordance with a specification | Aug 9, 2022 | Issued |
Array
(
[id] => 19084196
[patent_doc_number] => 20240110997
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-04
[patent_title] => DEVICE AND METHOD FOR DETECTING DEFECTS OF HIGH-VOLTAGE CABLE CROSS-BONDED GROUNDING SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/001706
[patent_app_country] => US
[patent_app_date] => 2022-08-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7313
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18001706
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/001706 | Device and method for detecting defects of high-voltage cable cross-bonded grounding system | Aug 3, 2022 | Issued |
Array
(
[id] => 18252922
[patent_doc_number] => 20230079961
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-16
[patent_title] => DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY EFFECT
[patent_app_type] => utility
[patent_app_number] => 17/880182
[patent_app_country] => US
[patent_app_date] => 2022-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5417
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 423
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880182
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/880182 | Circuit for temperature stress test for memory chips | Aug 2, 2022 | Issued |
Array
(
[id] => 18252922
[patent_doc_number] => 20230079961
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-16
[patent_title] => DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY EFFECT
[patent_app_type] => utility
[patent_app_number] => 17/880182
[patent_app_country] => US
[patent_app_date] => 2022-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5417
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -13
[patent_words_short_claim] => 423
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880182
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/880182 | Circuit for temperature stress test for memory chips | Aug 2, 2022 | Issued |
Array
(
[id] => 18904000
[patent_doc_number] => 20240019485
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-01-18
[patent_title] => ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR OPTICAL ENGINES AND ADVANCED PACKAGING
[patent_app_type] => utility
[patent_app_number] => 17/813203
[patent_app_country] => US
[patent_app_date] => 2022-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4754
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17813203
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/813203 | Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging | Jul 17, 2022 | Issued |
Array
(
[id] => 18144022
[patent_doc_number] => 20230017873
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-19
[patent_title] => METHOD FOR MONITORING A PROTECTIVE DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/866729
[patent_app_country] => US
[patent_app_date] => 2022-07-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2867
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 88
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17866729
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/866729 | Method for monitoring a protective device that includes a series circuit of thyristors connected in parallel with an electrical device to be protected | Jul 17, 2022 | Issued |
Array
(
[id] => 18221501
[patent_doc_number] => 20230060495
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-02
[patent_title] => ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS
[patent_app_type] => utility
[patent_app_number] => 17/862112
[patent_app_country] => US
[patent_app_date] => 2022-07-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2253
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17862112
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/862112 | ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS | Jul 10, 2022 | Abandoned |
Array
(
[id] => 19513473
[patent_doc_number] => 20240345159
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-17
[patent_title] => TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA
[patent_app_type] => utility
[patent_app_number] => 18/683270
[patent_app_country] => US
[patent_app_date] => 2022-07-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3742
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18683270
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/683270 | TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA | Jul 7, 2022 | Pending |
Array
(
[id] => 19412849
[patent_doc_number] => 12078662
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-09-03
[patent_title] => Techniques for reducing an eddy current in a ground plane of a coreless sensor
[patent_app_type] => utility
[patent_app_number] => 17/850152
[patent_app_country] => US
[patent_app_date] => 2022-06-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 22
[patent_no_of_words] => 8576
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 130
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17850152
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/850152 | Techniques for reducing an eddy current in a ground plane of a coreless sensor | Jun 26, 2022 | Issued |
Array
(
[id] => 18863409
[patent_doc_number] => 20230417845
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-28
[patent_title] => SYSTEMS AND METHODS FOR FAULT DETECTION IN VARIABLE DIFFERENTIAL TRANSFORMERS
[patent_app_type] => utility
[patent_app_number] => 17/848916
[patent_app_country] => US
[patent_app_date] => 2022-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4091
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17848916
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/848916 | Systems and methods for fault detection in variable differential transformers | Jun 23, 2022 | Issued |
Array
(
[id] => 18863392
[patent_doc_number] => 20230417828
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-28
[patent_title] => INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS
[patent_app_type] => utility
[patent_app_number] => 17/808357
[patent_app_country] => US
[patent_app_date] => 2022-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10876
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -30
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17808357
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/808357 | Integrated circuit package with internal circuitry to detect external component parameters and parasitics | Jun 22, 2022 | Issued |
Array
(
[id] => 18345258
[patent_doc_number] => 20230133368
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-04
[patent_title] => SEMICONDUCTOR TEST DEVICE AND METHOD OF DRIVING THE SAME
[patent_app_type] => utility
[patent_app_number] => 17/846534
[patent_app_country] => US
[patent_app_date] => 2022-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3847
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17846534
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/846534 | Semiconductor test device including temperature control module and method of driving the same | Jun 21, 2022 | Issued |
Array
(
[id] => 18667600
[patent_doc_number] => 11774492
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-10-03
[patent_title] => Test system including active thermal interposer device
[patent_app_type] => utility
[patent_app_number] => 17/841491
[patent_app_country] => US
[patent_app_date] => 2022-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 10391
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17841491
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/841491 | Test system including active thermal interposer device | Jun 14, 2022 | Issued |
Array
(
[id] => 18346551
[patent_doc_number] => 20230134661
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-04
[patent_title] => BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, AND STORAGE MEDIUM
[patent_app_type] => utility
[patent_app_number] => 17/806823
[patent_app_country] => US
[patent_app_date] => 2022-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9844
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17806823
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/806823 | Board adapter device, test method, system, apparatus, and device, and storage medium | Jun 13, 2022 | Issued |
Array
(
[id] => 18078784
[patent_doc_number] => 20220404396
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2022-12-22
[patent_title] => CIRCUIT SYSTEM FOR MEASURING AN ELECTRICAL VOLTAGE
[patent_app_type] => utility
[patent_app_number] => 17/837289
[patent_app_country] => US
[patent_app_date] => 2022-06-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2323
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17837289
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/837289 | Circuit system for measuring an electrical voltage | Jun 9, 2022 | Issued |
Array
(
[id] => 18667599
[patent_doc_number] => 11774491
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-10-03
[patent_title] => System and method for testing a semiconductor chip
[patent_app_type] => utility
[patent_app_number] => 17/835308
[patent_app_country] => US
[patent_app_date] => 2022-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4841
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17835308
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/835308 | System and method for testing a semiconductor chip | Jun 7, 2022 | Issued |
Array
(
[id] => 18826120
[patent_doc_number] => 11841392
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-12-12
[patent_title] => Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
[patent_app_type] => utility
[patent_app_number] => 17/832348
[patent_app_country] => US
[patent_app_date] => 2022-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5320
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17832348
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/832348 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Jun 2, 2022 | Issued |
Array
(
[id] => 19061260
[patent_doc_number] => 11940486
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-03-26
[patent_title] => Probe station capable of maintaining stable and accurate contact to device under test
[patent_app_type] => utility
[patent_app_number] => 17/805027
[patent_app_country] => US
[patent_app_date] => 2022-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 3103
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17805027
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/805027 | Probe station capable of maintaining stable and accurate contact to device under test | May 31, 2022 | Issued |