Search

Vinh P Nguyen

Examiner (ID: 2259, Phone: (571)272-1964 , Office: P/2867 )

Most Active Art Unit
2858
Art Unit(s)
2858, 2607, 2213, 2731, 2829, 2867, 3621, 2899
Total Applications
3696
Issued Applications
3184
Pending Applications
137
Abandoned Applications
409

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18282637 [patent_doc_number] => 20230098109 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-30 [patent_title] => ENVIRONMENTAL SENSOR [patent_app_type] => utility [patent_app_number] => 17/894837 [patent_app_country] => US [patent_app_date] => 2022-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3795 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17894837 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/894837
Environmental sensor circuit having a capacitive proximity sensor and magnetic field probe Aug 23, 2022 Issued
Array ( [id] => 19582209 [patent_doc_number] => 12148334 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-19 [patent_title] => Display device including crack detection patterns [patent_app_type] => utility [patent_app_number] => 17/893039 [patent_app_country] => US [patent_app_date] => 2022-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 20 [patent_no_of_words] => 14288 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893039 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/893039
Display device including crack detection patterns Aug 21, 2022 Issued
Array ( [id] => 19581321 [patent_doc_number] => 12147436 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-19 [patent_title] => Battery information processing system and battery information processing method to identify batteries in accordance with a specification [patent_app_type] => utility [patent_app_number] => 17/885492 [patent_app_country] => US [patent_app_date] => 2022-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4645 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17885492 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/885492
Battery information processing system and battery information processing method to identify batteries in accordance with a specification Aug 9, 2022 Issued
Array ( [id] => 19084196 [patent_doc_number] => 20240110997 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-04 [patent_title] => DEVICE AND METHOD FOR DETECTING DEFECTS OF HIGH-VOLTAGE CABLE CROSS-BONDED GROUNDING SYSTEM [patent_app_type] => utility [patent_app_number] => 18/001706 [patent_app_country] => US [patent_app_date] => 2022-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7313 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18001706 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/001706
Device and method for detecting defects of high-voltage cable cross-bonded grounding system Aug 3, 2022 Issued
Array ( [id] => 18252922 [patent_doc_number] => 20230079961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY EFFECT [patent_app_type] => utility [patent_app_number] => 17/880182 [patent_app_country] => US [patent_app_date] => 2022-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 423 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880182 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/880182
Circuit for temperature stress test for memory chips Aug 2, 2022 Issued
Array ( [id] => 18252922 [patent_doc_number] => 20230079961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY EFFECT [patent_app_type] => utility [patent_app_number] => 17/880182 [patent_app_country] => US [patent_app_date] => 2022-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 423 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880182 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/880182
Circuit for temperature stress test for memory chips Aug 2, 2022 Issued
Array ( [id] => 18904000 [patent_doc_number] => 20240019485 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-18 [patent_title] => ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR OPTICAL ENGINES AND ADVANCED PACKAGING [patent_app_type] => utility [patent_app_number] => 17/813203 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4754 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17813203 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/813203
Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging Jul 17, 2022 Issued
Array ( [id] => 18144022 [patent_doc_number] => 20230017873 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => METHOD FOR MONITORING A PROTECTIVE DEVICE [patent_app_type] => utility [patent_app_number] => 17/866729 [patent_app_country] => US [patent_app_date] => 2022-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2867 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17866729 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/866729
Method for monitoring a protective device that includes a series circuit of thyristors connected in parallel with an electrical device to be protected Jul 17, 2022 Issued
Array ( [id] => 18221501 [patent_doc_number] => 20230060495 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS [patent_app_type] => utility [patent_app_number] => 17/862112 [patent_app_country] => US [patent_app_date] => 2022-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2253 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17862112 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/862112
ADAPTABLE TEST FIXTURE FOR ELECTRICAL COMPONENTS Jul 10, 2022 Abandoned
Array ( [id] => 19513473 [patent_doc_number] => 20240345159 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA [patent_app_type] => utility [patent_app_number] => 18/683270 [patent_app_country] => US [patent_app_date] => 2022-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3742 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18683270 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/683270
TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA Jul 7, 2022 Pending
Array ( [id] => 19412849 [patent_doc_number] => 12078662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-09-03 [patent_title] => Techniques for reducing an eddy current in a ground plane of a coreless sensor [patent_app_type] => utility [patent_app_number] => 17/850152 [patent_app_country] => US [patent_app_date] => 2022-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 22 [patent_no_of_words] => 8576 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17850152 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/850152
Techniques for reducing an eddy current in a ground plane of a coreless sensor Jun 26, 2022 Issued
Array ( [id] => 18863409 [patent_doc_number] => 20230417845 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => SYSTEMS AND METHODS FOR FAULT DETECTION IN VARIABLE DIFFERENTIAL TRANSFORMERS [patent_app_type] => utility [patent_app_number] => 17/848916 [patent_app_country] => US [patent_app_date] => 2022-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4091 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17848916 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/848916
Systems and methods for fault detection in variable differential transformers Jun 23, 2022 Issued
Array ( [id] => 18863392 [patent_doc_number] => 20230417828 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-28 [patent_title] => INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS [patent_app_type] => utility [patent_app_number] => 17/808357 [patent_app_country] => US [patent_app_date] => 2022-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10876 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -30 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17808357 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/808357
Integrated circuit package with internal circuitry to detect external component parameters and parasitics Jun 22, 2022 Issued
Array ( [id] => 18345258 [patent_doc_number] => 20230133368 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-04 [patent_title] => SEMICONDUCTOR TEST DEVICE AND METHOD OF DRIVING THE SAME [patent_app_type] => utility [patent_app_number] => 17/846534 [patent_app_country] => US [patent_app_date] => 2022-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3847 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17846534 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/846534
Semiconductor test device including temperature control module and method of driving the same Jun 21, 2022 Issued
Array ( [id] => 18667600 [patent_doc_number] => 11774492 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-03 [patent_title] => Test system including active thermal interposer device [patent_app_type] => utility [patent_app_number] => 17/841491 [patent_app_country] => US [patent_app_date] => 2022-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 10391 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17841491 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/841491
Test system including active thermal interposer device Jun 14, 2022 Issued
Array ( [id] => 18346551 [patent_doc_number] => 20230134661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-04 [patent_title] => BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, AND STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/806823 [patent_app_country] => US [patent_app_date] => 2022-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9844 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17806823 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/806823
Board adapter device, test method, system, apparatus, and device, and storage medium Jun 13, 2022 Issued
Array ( [id] => 18078784 [patent_doc_number] => 20220404396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-22 [patent_title] => CIRCUIT SYSTEM FOR MEASURING AN ELECTRICAL VOLTAGE [patent_app_type] => utility [patent_app_number] => 17/837289 [patent_app_country] => US [patent_app_date] => 2022-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2323 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17837289 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/837289
Circuit system for measuring an electrical voltage Jun 9, 2022 Issued
Array ( [id] => 18667599 [patent_doc_number] => 11774491 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-10-03 [patent_title] => System and method for testing a semiconductor chip [patent_app_type] => utility [patent_app_number] => 17/835308 [patent_app_country] => US [patent_app_date] => 2022-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4841 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17835308 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/835308
System and method for testing a semiconductor chip Jun 7, 2022 Issued
Array ( [id] => 18826120 [patent_doc_number] => 11841392 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-12 [patent_title] => Integrated test cell using active thermal interposer (ATI) with parallel socket actuation [patent_app_type] => utility [patent_app_number] => 17/832348 [patent_app_country] => US [patent_app_date] => 2022-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5320 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17832348 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/832348
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation Jun 2, 2022 Issued
Array ( [id] => 19061260 [patent_doc_number] => 11940486 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-26 [patent_title] => Probe station capable of maintaining stable and accurate contact to device under test [patent_app_type] => utility [patent_app_number] => 17/805027 [patent_app_country] => US [patent_app_date] => 2022-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3103 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17805027 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/805027
Probe station capable of maintaining stable and accurate contact to device under test May 31, 2022 Issued
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