Search

Wayne Huu Cai

Examiner (ID: 14942, Phone: (571)272-7798 , Office: P/2644 )

Most Active Art Unit
2644
Art Unit(s)
2644, 2617, 2681
Total Applications
1276
Issued Applications
942
Pending Applications
105
Abandoned Applications
249

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6368376 [patent_doc_number] => 20020118034 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-29 [patent_title] => 'Transistor device testing employing virtual device fixturing' [patent_app_type] => new [patent_app_number] => 09/749027 [patent_app_country] => US [patent_app_date] => 2000-12-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4155 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0118/20020118034.pdf [firstpage_image] =>[orig_patent_app_number] => 09749027 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/749027
Transistor device testing employing virtual device fixturing Dec 25, 2000 Issued
Array ( [id] => 7040210 [patent_doc_number] => 20010005132 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-06-28 [patent_title] => 'Semiconductor device testing method and system and recording medium' [patent_app_type] => new-utility [patent_app_number] => 09/747727 [patent_app_country] => US [patent_app_date] => 2000-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9376 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0005/20010005132.pdf [firstpage_image] =>[orig_patent_app_number] => 09747727 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/747727
Semiconductor device testing method and system employing trace data Dec 21, 2000 Issued
Array ( [id] => 6076667 [patent_doc_number] => 20020079880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-27 [patent_title] => 'Signal pin tester for AC defects in integrated circuits' [patent_app_type] => new [patent_app_number] => 09/747902 [patent_app_country] => US [patent_app_date] => 2000-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3623 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20020079880.pdf [firstpage_image] =>[orig_patent_app_number] => 09747902 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/747902
Signal pin tester for AC defects in integrated circuits Dec 21, 2000 Issued
Array ( [id] => 1544791 [patent_doc_number] => 06373274 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-16 [patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors' [patent_app_type] => B1 [patent_app_number] => 09/714148 [patent_app_country] => US [patent_app_date] => 2000-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 29 [patent_no_of_words] => 15973 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 437 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/373/06373274.pdf [firstpage_image] =>[orig_patent_app_number] => 09714148 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/714148
Characteristic evaluation apparatus for insulated gate type transistors Nov 16, 2000 Issued
Array ( [id] => 1425351 [patent_doc_number] => 06507185 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-14 [patent_title] => 'Device, assembly and method for testing electronic components, and calibrating method therefor' [patent_app_type] => B1 [patent_app_number] => 09/646822 [patent_app_country] => US [patent_app_date] => 2000-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2583 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/507/06507185.pdf [firstpage_image] =>[orig_patent_app_number] => 09646822 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/646822
Device, assembly and method for testing electronic components, and calibrating method therefor Nov 8, 2000 Issued
Array ( [id] => 1289504 [patent_doc_number] => 06639421 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-28 [patent_title] => 'Measuring apparatus and method for measuring characteristic of solar cell' [patent_app_type] => B1 [patent_app_number] => 09/691130 [patent_app_country] => US [patent_app_date] => 2000-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 7421 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/639/06639421.pdf [firstpage_image] =>[orig_patent_app_number] => 09691130 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/691130
Measuring apparatus and method for measuring characteristic of solar cell Oct 18, 2000 Issued
Array ( [id] => 1505861 [patent_doc_number] => 06466008 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-15 [patent_title] => 'Method for matching the lengths of signal traces' [patent_app_type] => B1 [patent_app_number] => 09/680577 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4068 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/466/06466008.pdf [firstpage_image] =>[orig_patent_app_number] => 09680577 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/680577
Method for matching the lengths of signal traces Oct 5, 2000 Issued
Array ( [id] => 1476791 [patent_doc_number] => 06388458 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-14 [patent_title] => 'Spring element for use in an apparatus for attaching to a semiconductor and a method of making' [patent_app_type] => B1 [patent_app_number] => 09/678562 [patent_app_country] => US [patent_app_date] => 2000-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 5759 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/388/06388458.pdf [firstpage_image] =>[orig_patent_app_number] => 09678562 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/678562
Spring element for use in an apparatus for attaching to a semiconductor and a method of making Oct 2, 2000 Issued
Array ( [id] => 1468918 [patent_doc_number] => 06459254 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-01 [patent_title] => 'Power sensing RF termination apparatus including temperature compensation means' [patent_app_type] => B1 [patent_app_number] => 09/670938 [patent_app_country] => US [patent_app_date] => 2000-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3465 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459254.pdf [firstpage_image] =>[orig_patent_app_number] => 09670938 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/670938
Power sensing RF termination apparatus including temperature compensation means Sep 25, 2000 Issued
Array ( [id] => 1345246 [patent_doc_number] => 06590381 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-08 [patent_title] => 'Contactor holding mechanism and automatic change mechanism for contactor' [patent_app_type] => B1 [patent_app_number] => 09/646951 [patent_app_country] => US [patent_app_date] => 2000-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 16 [patent_no_of_words] => 6939 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/590/06590381.pdf [firstpage_image] =>[orig_patent_app_number] => 09646951 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/646951
Contactor holding mechanism and automatic change mechanism for contactor Sep 24, 2000 Issued
Array ( [id] => 1376715 [patent_doc_number] => 06566854 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Apparatus for measuring high frequency currents' [patent_app_type] => B1 [patent_app_number] => 09/646161 [patent_app_country] => US [patent_app_date] => 2000-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5317 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/566/06566854.pdf [firstpage_image] =>[orig_patent_app_number] => 09646161 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/646161
Apparatus for measuring high frequency currents Sep 11, 2000 Issued
Array ( [id] => 1448593 [patent_doc_number] => 06369602 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-09 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => B1 [patent_app_number] => 09/645902 [patent_app_country] => US [patent_app_date] => 2000-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2660 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/369/06369602.pdf [firstpage_image] =>[orig_patent_app_number] => 09645902 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/645902
Method for in-line testing of flip-chip semiconductor assemblies Aug 24, 2000 Issued
Array ( [id] => 1315515 [patent_doc_number] => 06614249 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-02 [patent_title] => 'Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate' [patent_app_type] => B1 [patent_app_number] => 09/644248 [patent_app_country] => US [patent_app_date] => 2000-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 3964 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/614/06614249.pdf [firstpage_image] =>[orig_patent_app_number] => 09644248 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/644248
Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Aug 21, 2000 Issued
Array ( [id] => 1354214 [patent_doc_number] => 06583639 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-24 [patent_title] => 'Reduced cost, high speed circuit test arrangement' [patent_app_type] => B1 [patent_app_number] => 09/633305 [patent_app_country] => US [patent_app_date] => 2000-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4355 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/583/06583639.pdf [firstpage_image] =>[orig_patent_app_number] => 09633305 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/633305
Reduced cost, high speed circuit test arrangement Aug 7, 2000 Issued
Array ( [id] => 1461970 [patent_doc_number] => 06392404 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Triggered integrated circuit tester' [patent_app_type] => B1 [patent_app_number] => 09/628703 [patent_app_country] => US [patent_app_date] => 2000-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 5561 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392404.pdf [firstpage_image] =>[orig_patent_app_number] => 09628703 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/628703
Triggered integrated circuit tester Jul 30, 2000 Issued
Array ( [id] => 1338068 [patent_doc_number] => 06597195 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-07-22 [patent_title] => 'Method of and cassette structure for burn-in and life testing of multiple LEDs and the like' [patent_app_type] => B1 [patent_app_number] => 09/628093 [patent_app_country] => US [patent_app_date] => 2000-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1745 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/597/06597195.pdf [firstpage_image] =>[orig_patent_app_number] => 09628093 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/628093
Method of and cassette structure for burn-in and life testing of multiple LEDs and the like Jul 27, 2000 Issued
Array ( [id] => 1529842 [patent_doc_number] => 06479983 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-12 [patent_title] => 'Semiconductor device testing apparatus having timing hold function' [patent_app_type] => B1 [patent_app_number] => 09/624507 [patent_app_country] => US [patent_app_date] => 2000-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9090 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/479/06479983.pdf [firstpage_image] =>[orig_patent_app_number] => 09624507 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/624507
Semiconductor device testing apparatus having timing hold function Jul 23, 2000 Issued
Array ( [id] => 7645110 [patent_doc_number] => 06472862 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-29 [patent_title] => 'Programmable voltage divider and method for testing the impedance of a programmable element' [patent_app_type] => B1 [patent_app_number] => 09/617316 [patent_app_country] => US [patent_app_date] => 2000-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 6679 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 13 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472862.pdf [firstpage_image] =>[orig_patent_app_number] => 09617316 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/617316
Programmable voltage divider and method for testing the impedance of a programmable element Jul 16, 2000 Issued
Array ( [id] => 1522509 [patent_doc_number] => 06414473 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-02 [patent_title] => 'Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse' [patent_app_type] => B1 [patent_app_number] => 09/617242 [patent_app_country] => US [patent_app_date] => 2000-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 23 [patent_no_of_words] => 8515 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/414/06414473.pdf [firstpage_image] =>[orig_patent_app_number] => 09617242 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/617242
Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse Jul 13, 2000 Issued
Array ( [id] => 1456130 [patent_doc_number] => 06462567 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-08 [patent_title] => 'Self-retained spring probe' [patent_app_type] => B1 [patent_app_number] => 09/614422 [patent_app_country] => US [patent_app_date] => 2000-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 6149 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/462/06462567.pdf [firstpage_image] =>[orig_patent_app_number] => 09614422 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/614422
Self-retained spring probe Jul 11, 2000 Issued
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