William A. Powell

Array ( [id] => 1550565 [patent_doc_number] => 06399512 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-04 [patent_title] => 'Method of making metallization and contact structures in an integrated circuit comprising an etch stop layer' [patent_app_type] => B1 [patent_app_number] => 09/593968 [patent_app_country] => US [patent_app_date] => 2000-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 6821 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/399/06399512.pdf [firstpage_image] =>[orig_patent_app_number] => 09593968 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4226970 [patent_doc_number] => 06165314 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-26 [patent_title] => 'Apparatus for performing jet vapor reduction of the thickness of process layers' [patent_app_type] => 1 [patent_app_number] => 9/588910 [patent_app_country] => US [patent_app_date] => 2000-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4483 [patent_no_of_claims] => 65 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/165/06165314.pdf [firstpage_image] =>[orig_patent_app_number] => 588910 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1566147 [patent_doc_number] => 06376389 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-23 [patent_title] => 'Method for eliminating anti-reflective coating in semiconductors' [patent_app_type] => B1 [patent_app_number] => 09/588117 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 25 [patent_no_of_words] => 4792 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/376/06376389.pdf [firstpage_image] =>[orig_patent_app_number] => 09588117 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1458904 [patent_doc_number] => 06426295 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-30 [patent_title] => 'Reduction of surface roughness during chemical mechanical planarization(CMP)' [patent_app_type] => B1 [patent_app_number] => 09/584468 [patent_app_country] => US [patent_app_date] => 2000-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4119 [patent_no_of_claims] => 63 [patent_no_of_ind_claims] => 19 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/426/06426295.pdf [firstpage_image] =>[orig_patent_app_number] => 09584468 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1462668 [patent_doc_number] => 06350699 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-26 [patent_title] => 'Method for anisotropic plasma etching using non-chlorofluorocarbon, fluorine-based chemistry' [patent_app_type] => B1 [patent_app_number] => 09/584407 [patent_app_country] => US [patent_app_date] => 2000-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3457 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/350/06350699.pdf [firstpage_image] =>[orig_patent_app_number] => 09584407 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4323145 [patent_doc_number] => 06312614 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Method for production of interposer for mounting semiconductor element' [patent_app_type] => 1 [patent_app_number] => 9/577883 [patent_app_country] => US [patent_app_date] => 2000-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 19 [patent_no_of_words] => 2662 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/312/06312614.pdf [firstpage_image] =>[orig_patent_app_number] => 577883 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1559908 [patent_doc_number] => 06436832 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-20 [patent_title] => 'Method to reduce polish initiation time in a polish process' [patent_app_type] => B1 [patent_app_number] => 09/578157 [patent_app_country] => US [patent_app_date] => 2000-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 3648 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/436/06436832.pdf [firstpage_image] =>[orig_patent_app_number] => 09578157 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4381833 [patent_doc_number] => 06294472 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-25 [patent_title] => 'Dual slurry particle sizes for reducing microscratching of wafers' [patent_app_type] => 1 [patent_app_number] => 9/576750 [patent_app_country] => US [patent_app_date] => 2000-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5777 [patent_no_of_claims] => 59 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/294/06294472.pdf [firstpage_image] =>[orig_patent_app_number] => 576750 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4250740 [patent_doc_number] => 06207572 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-27 [patent_title] => 'Reverse linear chemical mechanical polisher with loadable housing' [patent_app_type] => 1 [patent_app_number] => 9/576064 [patent_app_country] => US [patent_app_date] => 2000-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 3910 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 43 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/207/06207572.pdf [firstpage_image] =>[orig_patent_app_number] => 576064 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1585662 [patent_doc_number] => 06358852 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-19 [patent_title] => 'Decapsulation techniques for multi-chip (MCP) devices' [patent_app_type] => B1 [patent_app_number] => 09/574580 [patent_app_country] => US [patent_app_date] => 2000-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1548 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/358/06358852.pdf [firstpage_image] =>[orig_patent_app_number] => 09574580 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1441093 [patent_doc_number] => 06335286 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-01-01 [patent_title] => 'Feedback control of polish buff time as a function of scratch count' [patent_app_type] => B1 [patent_app_number] => 09/568867 [patent_app_country] => US [patent_app_date] => 2000-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6850 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/335/06335286.pdf [firstpage_image] =>[orig_patent_app_number] => 09568867 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4380492 [patent_doc_number] => 06277657 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-21 [patent_title] => 'Apparatus for fabricating semiconductor device and fabrication method therefor' [patent_app_type] => 1 [patent_app_number] => 9/530926 [patent_app_country] => US [patent_app_date] => 2000-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 21 [patent_no_of_words] => 15481 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/277/06277657.pdf [firstpage_image] =>[orig_patent_app_number] => 530926 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4408736 [patent_doc_number] => 06309980 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Semiconductor integrated circuit arrangement fabrication method' [patent_app_type] => 1 [patent_app_number] => 9/564754 [patent_app_country] => US [patent_app_date] => 2000-05-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 8149 [patent_no_of_claims] => 61 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/309/06309980.pdf [firstpage_image] =>[orig_patent_app_number] => 564754 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1043349 [patent_doc_number] => 06866791 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-15 [patent_title] => 'Method of forming patterned nickel and doped nickel films via microcontact printing and uses thereof' [patent_app_type] => utility [patent_app_number] => 09/562681 [patent_app_country] => US [patent_app_date] => 2000-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 2845 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/866/06866791.pdf [firstpage_image] =>[orig_patent_app_number] => 09562681 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4329672 [patent_doc_number] => 06313041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Method of enhancing the rate of removal of a layer of light-sensitive material after an etching step in the fabrication of semiconductor electronic devices' [patent_app_type] => 1 [patent_app_number] => 9/561392 [patent_app_country] => US [patent_app_date] => 2000-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1873 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313041.pdf [firstpage_image] =>[orig_patent_app_number] => 561392 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4408095 [patent_doc_number] => 06228661 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-08 [patent_title] => 'Method to determine the dark-to-clear exposure dose for the swing curve' [patent_app_type] => 1 [patent_app_number] => 9/559960 [patent_app_country] => US [patent_app_date] => 2000-04-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1969 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/228/06228661.pdf [firstpage_image] =>[orig_patent_app_number] => 559960 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4329627 [patent_doc_number] => 06313038 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-06 [patent_title] => 'Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates' [patent_app_type] => 1 [patent_app_number] => 9/558807 [patent_app_country] => US [patent_app_date] => 2000-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4360 [patent_no_of_claims] => 66 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/313/06313038.pdf [firstpage_image] =>[orig_patent_app_number] => 558807 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4337050 [patent_doc_number] => 06333275 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-25 [patent_title] => 'Etchant mixing system for edge bevel removal of copper from silicon wafers' [patent_app_type] => 1 [patent_app_number] => 9/557695 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 11144 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/333/06333275.pdf [firstpage_image] =>[orig_patent_app_number] => 557695 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4408747 [patent_doc_number] => 06309981 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Edge bevel removal of copper from silicon wafers' [patent_app_type] => 1 [patent_app_number] => 9/557668 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8215 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/309/06309981.pdf [firstpage_image] =>[orig_patent_app_number] => 557668 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4357657 [patent_doc_number] => 06174814 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Method for producing a crack stop for interlevel dielectric layers' [patent_app_type] => 1 [patent_app_number] => 9/557537 [patent_app_country] => US [patent_app_date] => 2000-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4869 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/174/06174814.pdf [firstpage_image] =>[orig_patent_app_number] => 557537 [rel_patent_id] =>[rel_patent_doc_number] =>)