Search

William A Powell

Examiner (ID: 17926)

Most Active Art Unit
1765
Art Unit(s)
1104, 1763, 1106, 1765, 1109, 1301, 1307, 3202, 1502, 1304, 1303
Total Applications
3597
Issued Applications
3357
Pending Applications
97
Abandoned Applications
143

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4259331 [patent_doc_number] => 06204192 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-20 [patent_title] => 'Plasma cleaning process for openings formed in at least one low dielectric constant insulation layer over copper metallization in integrated circuit structures' [patent_app_type] => 1 [patent_app_number] => 9/281602 [patent_app_country] => US [patent_app_date] => 1999-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4064 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/204/06204192.pdf [firstpage_image] =>[orig_patent_app_number] => 281602 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/281602
Plasma cleaning process for openings formed in at least one low dielectric constant insulation layer over copper metallization in integrated circuit structures Mar 28, 1999 Issued
Array ( [id] => 4084606 [patent_doc_number] => 06162735 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-19 [patent_title] => 'In-situ method for preparing and highlighting of defects for failure analysis' [patent_app_type] => 1 [patent_app_number] => 9/277673 [patent_app_country] => US [patent_app_date] => 1999-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4149 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/162/06162735.pdf [firstpage_image] =>[orig_patent_app_number] => 277673 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/277673
In-situ method for preparing and highlighting of defects for failure analysis Mar 25, 1999 Issued
Array ( [id] => 4359402 [patent_doc_number] => 06169036 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Method for cleaning via openings in integrated circuit manufacturing' [patent_app_type] => 1 [patent_app_number] => 9/276034 [patent_app_country] => US [patent_app_date] => 1999-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3395 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169036.pdf [firstpage_image] =>[orig_patent_app_number] => 276034 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/276034
Method for cleaning via openings in integrated circuit manufacturing Mar 24, 1999 Issued
Array ( [id] => 4313020 [patent_doc_number] => 06242350 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-05 [patent_title] => 'Post gate etch cleaning process for self-aligned gate mosfets' [patent_app_type] => 1 [patent_app_number] => 9/270594 [patent_app_country] => US [patent_app_date] => 1999-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4027 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/242/06242350.pdf [firstpage_image] =>[orig_patent_app_number] => 270594 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/270594
Post gate etch cleaning process for self-aligned gate mosfets Mar 17, 1999 Issued
Array ( [id] => 4189106 [patent_doc_number] => 06153530 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-28 [patent_title] => 'Post-etch treatment of plasma-etched feature surfaces to prevent corrosion' [patent_app_type] => 1 [patent_app_number] => 9/270286 [patent_app_country] => US [patent_app_date] => 1999-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 8731 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/153/06153530.pdf [firstpage_image] =>[orig_patent_app_number] => 270286 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/270286
Post-etch treatment of plasma-etched feature surfaces to prevent corrosion Mar 15, 1999 Issued
Array ( [id] => 4208349 [patent_doc_number] => 06086779 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Copper etching compositions and method for etching copper' [patent_app_type] => 1 [patent_app_number] => 9/260169 [patent_app_country] => US [patent_app_date] => 1999-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5299 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/086/06086779.pdf [firstpage_image] =>[orig_patent_app_number] => 260169 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/260169
Copper etching compositions and method for etching copper Feb 28, 1999 Issued
Array ( [id] => 1536220 [patent_doc_number] => 06337286 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-01-08 [patent_title] => 'Method for etching metals using organohalide compounds' [patent_app_type] => B1 [patent_app_number] => 09/258741 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2756 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/337/06337286.pdf [firstpage_image] =>[orig_patent_app_number] => 09258741 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258741
Method for etching metals using organohalide compounds Feb 25, 1999 Issued
Array ( [id] => 4183968 [patent_doc_number] => 06159864 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process' [patent_app_type] => 1 [patent_app_number] => 9/257172 [patent_app_country] => US [patent_app_date] => 1999-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2170 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/159/06159864.pdf [firstpage_image] =>[orig_patent_app_number] => 257172 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/257172
Method of preventing damages of gate oxides of a semiconductor wafer in a plasma-related process Feb 23, 1999 Issued
Array ( [id] => 4183057 [patent_doc_number] => 06150280 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-21 [patent_title] => 'Electron-beam cell projection aperture formation method' [patent_app_type] => 1 [patent_app_number] => 9/256710 [patent_app_country] => US [patent_app_date] => 1999-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 6757 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/150/06150280.pdf [firstpage_image] =>[orig_patent_app_number] => 256710 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/256710
Electron-beam cell projection aperture formation method Feb 23, 1999 Issued
Array ( [id] => 4173221 [patent_doc_number] => 06083845 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-04 [patent_title] => 'Etching method' [patent_app_type] => 1 [patent_app_number] => 9/255678 [patent_app_country] => US [patent_app_date] => 1999-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3515 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/083/06083845.pdf [firstpage_image] =>[orig_patent_app_number] => 255678 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/255678
Etching method Feb 22, 1999 Issued
Array ( [id] => 4216030 [patent_doc_number] => 06087272 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Method of producing thin film transistor' [patent_app_type] => 1 [patent_app_number] => 9/251290 [patent_app_country] => US [patent_app_date] => 1999-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 12 [patent_no_of_words] => 2096 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 341 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087272.pdf [firstpage_image] =>[orig_patent_app_number] => 251290 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/251290
Method of producing thin film transistor Feb 16, 1999 Issued
Array ( [id] => 4359425 [patent_doc_number] => 06169038 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Method for rough-etching a semiconductor surface' [patent_app_type] => 1 [patent_app_number] => 9/251288 [patent_app_country] => US [patent_app_date] => 1999-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1170 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169038.pdf [firstpage_image] =>[orig_patent_app_number] => 251288 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/251288
Method for rough-etching a semiconductor surface Feb 16, 1999 Issued
Array ( [id] => 4408782 [patent_doc_number] => 06265318 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-24 [patent_title] => 'Iridium etchant methods for anisotropic profile' [patent_app_type] => 1 [patent_app_number] => 9/251633 [patent_app_country] => US [patent_app_date] => 1999-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 28 [patent_no_of_words] => 22571 [patent_no_of_claims] => 140 [patent_no_of_ind_claims] => 126 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/265/06265318.pdf [firstpage_image] =>[orig_patent_app_number] => 251633 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/251633
Iridium etchant methods for anisotropic profile Feb 16, 1999 Issued
Array ( [id] => 4285395 [patent_doc_number] => 06210981 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-03 [patent_title] => 'Method for etching a flip chip using secondary particle emissions to detect the etch end-point' [patent_app_type] => 1 [patent_app_number] => 9/249367 [patent_app_country] => US [patent_app_date] => 1999-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4432 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/210/06210981.pdf [firstpage_image] =>[orig_patent_app_number] => 249367 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/249367
Method for etching a flip chip using secondary particle emissions to detect the etch end-point Feb 11, 1999 Issued
Array ( [id] => 4117385 [patent_doc_number] => 06071826 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-06 [patent_title] => 'Method of manufacturing CMOS image sensor leakage free with double layer spacer' [patent_app_type] => 1 [patent_app_number] => 9/249259 [patent_app_country] => US [patent_app_date] => 1999-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 2186 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/071/06071826.pdf [firstpage_image] =>[orig_patent_app_number] => 249259 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/249259
Method of manufacturing CMOS image sensor leakage free with double layer spacer Feb 11, 1999 Issued
Array ( [id] => 4094475 [patent_doc_number] => 06099662 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-08 [patent_title] => 'Process for cleaning a semiconductor substrate after chemical-mechanical polishing' [patent_app_type] => 1 [patent_app_number] => 9/248726 [patent_app_country] => US [patent_app_date] => 1999-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4726 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/099/06099662.pdf [firstpage_image] =>[orig_patent_app_number] => 248726 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/248726
Process for cleaning a semiconductor substrate after chemical-mechanical polishing Feb 10, 1999 Issued
Array ( [id] => 4303258 [patent_doc_number] => 06187685 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-13 [patent_title] => 'Method and apparatus for etching a substrate' [patent_app_type] => 1 [patent_app_number] => 9/245861 [patent_app_country] => US [patent_app_date] => 1999-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 19 [patent_no_of_words] => 7195 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/187/06187685.pdf [firstpage_image] =>[orig_patent_app_number] => 245861 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/245861
Method and apparatus for etching a substrate Feb 7, 1999 Issued
Array ( [id] => 4352095 [patent_doc_number] => 06174454 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Slurry formulation for selective CMP of organic spin-on-glass insulating layer with low dielectric constant' [patent_app_type] => 1 [patent_app_number] => 9/239664 [patent_app_country] => US [patent_app_date] => 1999-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1943 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/174/06174454.pdf [firstpage_image] =>[orig_patent_app_number] => 239664 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/239664
Slurry formulation for selective CMP of organic spin-on-glass insulating layer with low dielectric constant Jan 28, 1999 Issued
Array ( [id] => 4215962 [patent_doc_number] => 06087268 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-07-11 [patent_title] => 'Method to reduce boron diffusion through gate oxide using sidewall spacers' [patent_app_type] => 1 [patent_app_number] => 9/237762 [patent_app_country] => US [patent_app_date] => 1999-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1359 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/087/06087268.pdf [firstpage_image] =>[orig_patent_app_number] => 237762 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/237762
Method to reduce boron diffusion through gate oxide using sidewall spacers Jan 25, 1999 Issued
Array ( [id] => 4183954 [patent_doc_number] => 06159863 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Insitu hardmask and metal etch in a single etcher' [patent_app_type] => 1 [patent_app_number] => 9/236025 [patent_app_country] => US [patent_app_date] => 1999-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 2679 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/159/06159863.pdf [firstpage_image] =>[orig_patent_app_number] => 236025 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/236025
Insitu hardmask and metal etch in a single etcher Jan 21, 1999 Issued
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