
William Burns
Examiner (ID: 17957)
| Most Active Art Unit | 2607 |
| Art Unit(s) | 2607 |
| Total Applications | 448 |
| Issued Applications | 388 |
| Pending Applications | 0 |
| Abandoned Applications | 60 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 2980706
[patent_doc_number] => 05208530
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-05-04
[patent_title] => 'Testability architecture and techniques for programmable interconnect architecture'
[patent_app_type] => 1
[patent_app_number] => 7/889838
[patent_app_country] => US
[patent_app_date] => 1992-05-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 10
[patent_no_of_words] => 8648
[patent_no_of_claims] => 1
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[patent_words_short_claim] => 256
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/208/05208530.pdf
[firstpage_image] =>[orig_patent_app_number] => 889838
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/889838 | Testability architecture and techniques for programmable interconnect architecture | May 25, 1992 | Issued |
Array
(
[id] => 2951804
[patent_doc_number] => 05180974
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-01-19
[patent_title] => 'Semiconductor testing and shipping system'
[patent_app_type] => 1
[patent_app_number] => 7/888779
[patent_app_country] => US
[patent_app_date] => 1992-05-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 1779
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/180/05180974.pdf
[firstpage_image] =>[orig_patent_app_number] => 888779
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/888779 | Semiconductor testing and shipping system | May 25, 1992 | Issued |
Array
(
[id] => 2927363
[patent_doc_number] => 05200694
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-04-06
[patent_title] => 'Head assembly for printed circuit board test fixture'
[patent_app_type] => 1
[patent_app_number] => 7/884909
[patent_app_country] => US
[patent_app_date] => 1992-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3290
[patent_no_of_claims] => 11
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[pdf_file] => patents/05/200/05200694.pdf
[firstpage_image] =>[orig_patent_app_number] => 884909
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/884909 | Head assembly for printed circuit board test fixture | May 17, 1992 | Issued |
Array
(
[id] => 2788697
[patent_doc_number] => 05164665
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-11-17
[patent_title] => 'IC tester'
[patent_app_type] => 1
[patent_app_number] => 7/874213
[patent_app_country] => US
[patent_app_date] => 1992-04-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 6
[patent_no_of_words] => 2570
[patent_no_of_claims] => 2
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/164/05164665.pdf
[firstpage_image] =>[orig_patent_app_number] => 874213
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/874213 | IC tester | Apr 26, 1992 | Issued |
Array
(
[id] => 2882034
[patent_doc_number] => 05159267
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-10-27
[patent_title] => 'Pneumatic energy fluxmeter'
[patent_app_type] => 1
[patent_app_number] => 7/864155
[patent_app_country] => US
[patent_app_date] => 1992-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3518
[patent_no_of_claims] => 9
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/159/05159267.pdf
[firstpage_image] =>[orig_patent_app_number] => 864155
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/864155 | Pneumatic energy fluxmeter | Apr 1, 1992 | Issued |
Array
(
[id] => 2947386
[patent_doc_number] => 05223789
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-06-29
[patent_title] => 'AC/DC current detecting method'
[patent_app_type] => 1
[patent_app_number] => 7/861170
[patent_app_country] => US
[patent_app_date] => 1992-03-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[pdf_file] => patents/05/223/05223789.pdf
[firstpage_image] =>[orig_patent_app_number] => 861170
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/861170 | AC/DC current detecting method | Mar 26, 1992 | Issued |
Array
(
[id] => 2829113
[patent_doc_number] => 05170117
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-12-08
[patent_title] => 'Socket for testing a plug-in type semiconductor'
[patent_app_type] => 1
[patent_app_number] => 7/857668
[patent_app_country] => US
[patent_app_date] => 1992-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 1670
[patent_no_of_claims] => 1
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/170/05170117.pdf
[firstpage_image] =>[orig_patent_app_number] => 857668
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/857668 | Socket for testing a plug-in type semiconductor | Mar 25, 1992 | Issued |
Array
(
[id] => 2965139
[patent_doc_number] => 05198751
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-03-30
[patent_title] => 'Reactive volt-ampere-hour meter'
[patent_app_type] => 1
[patent_app_number] => 7/855288
[patent_app_country] => US
[patent_app_date] => 1992-03-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 4163
[patent_no_of_claims] => 6
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/198/05198751.pdf
[firstpage_image] =>[orig_patent_app_number] => 855288
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/855288 | Reactive volt-ampere-hour meter | Mar 22, 1992 | Issued |
Array
(
[id] => 2900230
[patent_doc_number] => 05184063
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-02-02
[patent_title] => 'Three phase reversal detection system'
[patent_app_type] => 1
[patent_app_number] => 7/834748
[patent_app_country] => US
[patent_app_date] => 1992-02-13
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 1634
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[pdf_file] => patents/05/184/05184063.pdf
[firstpage_image] =>[orig_patent_app_number] => 834748
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/834748 | Three phase reversal detection system | Feb 12, 1992 | Issued |
Array
(
[id] => 2900296
[patent_doc_number] => 05184067
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-02-02
[patent_title] => 'Signature compression circuit'
[patent_app_type] => 1
[patent_app_number] => 7/799719
[patent_app_country] => US
[patent_app_date] => 1991-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 3877
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/184/05184067.pdf
[firstpage_image] =>[orig_patent_app_number] => 799719
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/799719 | Signature compression circuit | Nov 25, 1991 | Issued |
Array
(
[id] => 2864750
[patent_doc_number] => 05166608
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-11-24
[patent_title] => 'Arrangement for high speed testing of field-effect transistors and memory cells employing the same'
[patent_app_type] => 1
[patent_app_number] => 7/788819
[patent_app_country] => US
[patent_app_date] => 1991-11-07
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/166/05166608.pdf
[firstpage_image] =>[orig_patent_app_number] => 788819
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/788819 | Arrangement for high speed testing of field-effect transistors and memory cells employing the same | Nov 6, 1991 | Issued |
Array
(
[id] => 2892048
[patent_doc_number] => 05214372
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-05-25
[patent_title] => 'Linearizing circuit for dectection of a RF-power sensor'
[patent_app_type] => 1
[patent_app_number] => 7/777453
[patent_app_country] => US
[patent_app_date] => 1991-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/214/05214372.pdf
[firstpage_image] =>[orig_patent_app_number] => 777453
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/777453 | Linearizing circuit for dectection of a RF-power sensor | Oct 10, 1991 | Issued |
Array
(
[id] => 2981631
[patent_doc_number] => 05225771
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-07-06
[patent_title] => 'Making and testing an integrated circuit using high density probe points'
[patent_app_type] => 1
[patent_app_number] => 7/775324
[patent_app_country] => US
[patent_app_date] => 1991-10-11
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/225/05225771.pdf
[firstpage_image] =>[orig_patent_app_number] => 775324
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/775324 | Making and testing an integrated circuit using high density probe points | Oct 10, 1991 | Issued |
Array
(
[id] => 2836653
[patent_doc_number] => 05175493
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-12-29
[patent_title] => 'Shielded electrical contact spring probe assembly'
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/175/05175493.pdf
[firstpage_image] =>[orig_patent_app_number] => 775714
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/775714 | Shielded electrical contact spring probe assembly | Oct 10, 1991 | Issued |
Array
(
[id] => 2881981
[patent_doc_number] => 05159264
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-10-27
[patent_title] => 'Pneumatic energy fluxmeter'
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[patent_app_number] => 7/771071
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[pdf_file] => patents/05/159/05159264.pdf
[firstpage_image] =>[orig_patent_app_number] => 771071
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/771071 | Pneumatic energy fluxmeter | Oct 1, 1991 | Issued |
Array
(
[id] => 2864574
[patent_doc_number] => 05166600
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1992-11-24
[patent_title] => 'Measuring device having an auxiliary electrode for a gas-insulated encased high-voltage conductor'
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[patent_app_number] => 7/761988
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[pdf_file] => patents/05/166/05166600.pdf
[firstpage_image] =>[orig_patent_app_number] => 761988
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/761988 | Measuring device having an auxiliary electrode for a gas-insulated encased high-voltage conductor | Sep 22, 1991 | Issued |
Array
(
[id] => 2899094
[patent_doc_number] => 05177439
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-01-05
[patent_title] => 'Probe card for testing unencapsulated semiconductor devices'
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[patent_app_number] => 7/752799
[patent_app_country] => US
[patent_app_date] => 1991-08-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/177/05177439.pdf
[firstpage_image] =>[orig_patent_app_number] => 752799
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/752799 | Probe card for testing unencapsulated semiconductor devices | Aug 29, 1991 | Issued |
Array
(
[id] => 2965216
[patent_doc_number] => 05198755
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1993-03-30
[patent_title] => 'Probe apparatus'
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[pdf_file] => patents/05/198/05198755.pdf
[firstpage_image] =>[orig_patent_app_number] => 753078
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/753078 | Probe apparatus | Aug 29, 1991 | Issued |
Array
(
[id] => 2974707
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[patent_kind] => NA
[patent_issue_date] => 1993-11-02
[patent_title] => 'Electronic watthour meter'
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[pdf_file] => patents/05/258/05258704.pdf
[firstpage_image] =>[orig_patent_app_number] => 750724
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/750724 | Electronic watthour meter | Aug 20, 1991 | Issued |
Array
(
[id] => 2924095
[patent_doc_number] => 05206583
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[patent_kind] => NA
[patent_issue_date] => 1993-04-27
[patent_title] => 'Latch assisted fuse testing for customized integrated circuits'
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[pdf_file] => patents/05/206/05206583.pdf
[firstpage_image] =>[orig_patent_app_number] => 747848
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/747848 | Latch assisted fuse testing for customized integrated circuits | Aug 19, 1991 | Issued |