| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_title] => 'Fiber-optic voltage sensor'
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Array
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[patent_kind] => NA
[patent_issue_date] => 1990-10-16
[patent_title] => 'Diagnostics of a board containing a plurality of hybrid electronic components'
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Array
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[patent_doc_number] => 04902966
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[patent_issue_date] => 1990-02-20
[patent_title] => 'Method and apparatus for operating a scanning microscope'
[patent_app_type] => 1
[patent_app_number] => 7/265949
[patent_app_country] => US
[patent_app_date] => 1988-11-02
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[firstpage_image] =>[orig_patent_app_number] => 265949
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Array
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[patent_doc_number] => 04967152
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[patent_kind] => NA
[patent_issue_date] => 1990-10-30
[patent_title] => 'Apparatus including a focused UV light source for non-contact measurement and alteration of electrical properties of conductors'
[patent_app_type] => 1
[patent_app_number] => 7/261687
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Array
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[patent_doc_number] => 04871963
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[patent_issue_date] => 1989-10-03
[patent_title] => 'Method and apparatus for testing EPROM type semiconductor devices during burn-in'
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[firstpage_image] =>[orig_patent_app_number] => 258962
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/258962 | Method and apparatus for testing EPROM type semiconductor devices during burn-in | Oct 16, 1988 | Issued |
Array
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[id] => 2556970
[patent_doc_number] => 04833398
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[patent_kind] => NA
[patent_issue_date] => 1989-05-23
[patent_title] => 'Electric water heater analyzer'
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[patent_app_number] => 7/257193
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Array
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[patent_issue_date] => 1990-02-27
[patent_title] => 'Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals'
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[patent_app_number] => 7/250289
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[pdf_file] => patents/04/904/04904931.pdf
[firstpage_image] =>[orig_patent_app_number] => 250289
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/250289 | Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals | Sep 27, 1988 | Issued |
Array
(
[id] => 2493209
[patent_doc_number] => 04868493
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1989-09-19
[patent_title] => 'Device for the functional testing of integrated circuits and a method for operating the device'
[patent_app_type] => 1
[patent_app_number] => 7/250999
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[patent_app_date] => 1988-09-27
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[pdf_file] => patents/04/868/04868493.pdf
[firstpage_image] =>[orig_patent_app_number] => 250999
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/250999 | Device for the functional testing of integrated circuits and a method for operating the device | Sep 26, 1988 | Issued |
Array
(
[id] => 2773825
[patent_doc_number] => 04995039
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1991-02-19
[patent_title] => 'Circuit for transparent scan path testing of integrated circuit devices'
[patent_app_type] => 1
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/247289 | Circuit for transparent scan path testing of integrated circuit devices | Sep 21, 1988 | Issued |
Array
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[id] => 2672909
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[patent_issue_date] => 1990-06-19
[patent_title] => 'Probe card fixture'
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[firstpage_image] =>[orig_patent_app_number] => 247088
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/247088 | Probe card fixture | Sep 19, 1988 | Issued |
Array
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[id] => 2631814
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[patent_issue_date] => 1990-10-30
[patent_title] => 'Method and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beam'
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[firstpage_image] =>[orig_patent_app_number] => 245378
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/245378 | Method and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beam | Sep 15, 1988 | Issued |
Array
(
[id] => 2714620
[patent_doc_number] => 05041780
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[patent_title] => 'Integrable current sensors'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 07/243808 | Integrable current sensors | Sep 12, 1988 | Issued |
Array
(
[id] => 2603133
[patent_doc_number] => 04922192
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[patent_kind] => NA
[patent_issue_date] => 1990-05-01
[patent_title] => 'Elastic membrane probe'
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[patent_app_date] => 1988-09-06
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[pdf_file] => patents/04/922/04922192.pdf
[firstpage_image] =>[orig_patent_app_number] => 240798
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/240798 | Elastic membrane probe | Sep 5, 1988 | Issued |
| 07/240427 | BEAM-BLANKING APPARATUS FOR STROBOSCOPIC ELECTRON BEAM INSTRUMENTS | Sep 1, 1988 | Abandoned |
Array
(
[id] => 2602990
[patent_doc_number] => 04922184
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[patent_kind] => NA
[patent_issue_date] => 1990-05-01
[patent_title] => 'Apparatus and process for the simultaneous continuity sensing of multiple circuits'
[patent_app_type] => 1
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[patent_app_date] => 1988-08-29
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[pdf_file] => patents/04/922/04922184.pdf
[firstpage_image] =>[orig_patent_app_number] => 237438
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/237438 | Apparatus and process for the simultaneous continuity sensing of multiple circuits | Aug 28, 1988 | Issued |
| 07/236749 | ELECTRIC PROBING-TEST MACHINE WITH DEHUMIDIFYING FUNCTION | Aug 25, 1988 | Abandoned |
Array
(
[id] => 2602064
[patent_doc_number] => 04924172
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[patent_issue_date] => 1990-05-08
[patent_title] => 'Capacitive sensor and electronic circuit for non-contact distance measurement'
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[firstpage_image] =>[orig_patent_app_number] => 236598
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/236598 | Capacitive sensor and electronic circuit for non-contact distance measurement | Aug 24, 1988 | Issued |
Array
(
[id] => 2662246
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[patent_issue_date] => 1990-10-09
[patent_title] => 'Integrated circuit test socket'
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[firstpage_image] =>[orig_patent_app_number] => 234818
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/234818 | Integrated circuit test socket | Aug 18, 1988 | Issued |
Array
(
[id] => 2481063
[patent_doc_number] => 04871965
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[patent_kind] => NA
[patent_issue_date] => 1989-10-03
[patent_title] => 'Environmental testing facility for electronic components'
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[patent_app_date] => 1988-08-18
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 235751
[rel_patent_id] =>[rel_patent_doc_number] =>) 07/235751 | Environmental testing facility for electronic components | Aug 17, 1988 | Issued |
| 07/232978 | METHOD AND APPARATUS FOR DETECTING FAULTS IN DIFFERENTIAL CURRENT SWITCHING LOGIC CIRCUITS | Aug 16, 1988 | Abandoned |