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William Burns

Examiner (ID: 12269)

Most Active Art Unit
2607
Art Unit(s)
2607
Total Applications
448
Issued Applications
388
Pending Applications
0
Abandoned Applications
60

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2647610 [patent_doc_number] => 04939447 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-07-03 [patent_title] => 'Fiber-optic voltage sensor' [patent_app_type] => 1 [patent_app_number] => 7/269649 [patent_app_country] => US [patent_app_date] => 1988-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 3429 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/939/04939447.pdf [firstpage_image] =>[orig_patent_app_number] => 269649 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/269649
Fiber-optic voltage sensor Nov 9, 1988 Issued
Array ( [id] => 2592539 [patent_doc_number] => 04963824 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-16 [patent_title] => 'Diagnostics of a board containing a plurality of hybrid electronic components' [patent_app_type] => 1 [patent_app_number] => 7/267409 [patent_app_country] => US [patent_app_date] => 1988-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5248 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/963/04963824.pdf [firstpage_image] =>[orig_patent_app_number] => 267409 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/267409
Diagnostics of a board containing a plurality of hybrid electronic components Nov 3, 1988 Issued
Array ( [id] => 2613553 [patent_doc_number] => 04902966 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-20 [patent_title] => 'Method and apparatus for operating a scanning microscope' [patent_app_type] => 1 [patent_app_number] => 7/265949 [patent_app_country] => US [patent_app_date] => 1988-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4210 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/902/04902966.pdf [firstpage_image] =>[orig_patent_app_number] => 265949 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/265949
Method and apparatus for operating a scanning microscope Nov 1, 1988 Issued
Array ( [id] => 2631851 [patent_doc_number] => 04967152 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-30 [patent_title] => 'Apparatus including a focused UV light source for non-contact measurement and alteration of electrical properties of conductors' [patent_app_type] => 1 [patent_app_number] => 7/261687 [patent_app_country] => US [patent_app_date] => 1988-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 7461 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 243 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/967/04967152.pdf [firstpage_image] =>[orig_patent_app_number] => 261687 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/261687
Apparatus including a focused UV light source for non-contact measurement and alteration of electrical properties of conductors Oct 23, 1988 Issued
Array ( [id] => 2481027 [patent_doc_number] => 04871963 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-10-03 [patent_title] => 'Method and apparatus for testing EPROM type semiconductor devices during burn-in' [patent_app_type] => 1 [patent_app_number] => 7/258962 [patent_app_country] => US [patent_app_date] => 1988-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3475 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 285 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/871/04871963.pdf [firstpage_image] =>[orig_patent_app_number] => 258962 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/258962
Method and apparatus for testing EPROM type semiconductor devices during burn-in Oct 16, 1988 Issued
Array ( [id] => 2556970 [patent_doc_number] => 04833398 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-23 [patent_title] => 'Electric water heater analyzer' [patent_app_type] => 1 [patent_app_number] => 7/257193 [patent_app_country] => US [patent_app_date] => 1988-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1697 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/833/04833398.pdf [firstpage_image] =>[orig_patent_app_number] => 257193 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/257193
Electric water heater analyzer Oct 11, 1988 Issued
Array ( [id] => 2672750 [patent_doc_number] => 04904931 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-27 [patent_title] => 'Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals' [patent_app_type] => 1 [patent_app_number] => 7/250289 [patent_app_country] => US [patent_app_date] => 1988-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 7044 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/904/04904931.pdf [firstpage_image] =>[orig_patent_app_number] => 250289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/250289
Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals Sep 27, 1988 Issued
Array ( [id] => 2493209 [patent_doc_number] => 04868493 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-19 [patent_title] => 'Device for the functional testing of integrated circuits and a method for operating the device' [patent_app_type] => 1 [patent_app_number] => 7/250999 [patent_app_country] => US [patent_app_date] => 1988-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2456 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/868/04868493.pdf [firstpage_image] =>[orig_patent_app_number] => 250999 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/250999
Device for the functional testing of integrated circuits and a method for operating the device Sep 26, 1988 Issued
Array ( [id] => 2773825 [patent_doc_number] => 04995039 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-02-19 [patent_title] => 'Circuit for transparent scan path testing of integrated circuit devices' [patent_app_type] => 1 [patent_app_number] => 7/247289 [patent_app_country] => US [patent_app_date] => 1988-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 4154 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/995/04995039.pdf [firstpage_image] =>[orig_patent_app_number] => 247289 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/247289
Circuit for transparent scan path testing of integrated circuit devices Sep 21, 1988 Issued
Array ( [id] => 2672909 [patent_doc_number] => 04935694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-06-19 [patent_title] => 'Probe card fixture' [patent_app_type] => 1 [patent_app_number] => 7/247088 [patent_app_country] => US [patent_app_date] => 1988-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 7898 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/935/04935694.pdf [firstpage_image] =>[orig_patent_app_number] => 247088 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/247088
Probe card fixture Sep 19, 1988 Issued
Array ( [id] => 2631814 [patent_doc_number] => 04967150 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-30 [patent_title] => 'Method and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beam' [patent_app_type] => 1 [patent_app_number] => 7/245378 [patent_app_country] => US [patent_app_date] => 1988-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2839 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/967/04967150.pdf [firstpage_image] =>[orig_patent_app_number] => 245378 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/245378
Method and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beam Sep 15, 1988 Issued
Array ( [id] => 2714620 [patent_doc_number] => 05041780 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1991-08-20 [patent_title] => 'Integrable current sensors' [patent_app_type] => 1 [patent_app_number] => 7/243808 [patent_app_country] => US [patent_app_date] => 1988-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 14 [patent_no_of_words] => 3626 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/041/05041780.pdf [firstpage_image] =>[orig_patent_app_number] => 243808 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/243808
Integrable current sensors Sep 12, 1988 Issued
Array ( [id] => 2603133 [patent_doc_number] => 04922192 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-01 [patent_title] => 'Elastic membrane probe' [patent_app_type] => 1 [patent_app_number] => 7/240798 [patent_app_country] => US [patent_app_date] => 1988-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2209 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/922/04922192.pdf [firstpage_image] =>[orig_patent_app_number] => 240798 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/240798
Elastic membrane probe Sep 5, 1988 Issued
07/240427 BEAM-BLANKING APPARATUS FOR STROBOSCOPIC ELECTRON BEAM INSTRUMENTS Sep 1, 1988 Abandoned
Array ( [id] => 2602990 [patent_doc_number] => 04922184 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-01 [patent_title] => 'Apparatus and process for the simultaneous continuity sensing of multiple circuits' [patent_app_type] => 1 [patent_app_number] => 7/237438 [patent_app_country] => US [patent_app_date] => 1988-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 4956 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 264 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/922/04922184.pdf [firstpage_image] =>[orig_patent_app_number] => 237438 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/237438
Apparatus and process for the simultaneous continuity sensing of multiple circuits Aug 28, 1988 Issued
07/236749 ELECTRIC PROBING-TEST MACHINE WITH DEHUMIDIFYING FUNCTION Aug 25, 1988 Abandoned
Array ( [id] => 2602064 [patent_doc_number] => 04924172 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-05-08 [patent_title] => 'Capacitive sensor and electronic circuit for non-contact distance measurement' [patent_app_type] => 1 [patent_app_number] => 7/236598 [patent_app_country] => US [patent_app_date] => 1988-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 3390 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/924/04924172.pdf [firstpage_image] =>[orig_patent_app_number] => 236598 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/236598
Capacitive sensor and electronic circuit for non-contact distance measurement Aug 24, 1988 Issued
Array ( [id] => 2662246 [patent_doc_number] => 04962356 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-10-09 [patent_title] => 'Integrated circuit test socket' [patent_app_type] => 1 [patent_app_number] => 7/234818 [patent_app_country] => US [patent_app_date] => 1988-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2812 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 225 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/962/04962356.pdf [firstpage_image] =>[orig_patent_app_number] => 234818 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/234818
Integrated circuit test socket Aug 18, 1988 Issued
Array ( [id] => 2481063 [patent_doc_number] => 04871965 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-10-03 [patent_title] => 'Environmental testing facility for electronic components' [patent_app_type] => 1 [patent_app_number] => 7/235751 [patent_app_country] => US [patent_app_date] => 1988-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3511 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/871/04871965.pdf [firstpage_image] =>[orig_patent_app_number] => 235751 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/235751
Environmental testing facility for electronic components Aug 17, 1988 Issued
07/232978 METHOD AND APPARATUS FOR DETECTING FAULTS IN DIFFERENTIAL CURRENT SWITCHING LOGIC CIRCUITS Aug 16, 1988 Abandoned
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