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William Burns

Examiner (ID: 17957)

Most Active Art Unit
2607
Art Unit(s)
2607
Total Applications
448
Issued Applications
388
Pending Applications
0
Abandoned Applications
60

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2477926 [patent_doc_number] => 04887029 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-12-12 [patent_title] => 'Mutual inductance current transducer, method of making and electric energy meter incorporating same' [patent_app_type] => 1 [patent_app_number] => 7/170173 [patent_app_country] => US [patent_app_date] => 1988-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 12 [patent_no_of_words] => 9772 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 411 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/887/04887029.pdf [firstpage_image] =>[orig_patent_app_number] => 170173 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/170173
Mutual inductance current transducer, method of making and electric energy meter incorporating same Mar 17, 1988 Issued
Array ( [id] => 2565861 [patent_doc_number] => 04837506 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-06 [patent_title] => 'Apparatus including a focused UV light source for non-contact measuremenht and alteration of electrical properties of conductors' [patent_app_type] => 1 [patent_app_number] => 7/166978 [patent_app_country] => US [patent_app_date] => 1988-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 7456 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 299 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/837/04837506.pdf [firstpage_image] =>[orig_patent_app_number] => 166978 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/166978
Apparatus including a focused UV light source for non-contact measuremenht and alteration of electrical properties of conductors Mar 10, 1988 Issued
Array ( [id] => 2522975 [patent_doc_number] => 04855671 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-08 [patent_title] => 'Electrical power line and substation monitoring apparatus' [patent_app_type] => 1 [patent_app_number] => 7/164778 [patent_app_country] => US [patent_app_date] => 1988-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 7444 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/855/04855671.pdf [firstpage_image] =>[orig_patent_app_number] => 164778 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/164778
Electrical power line and substation monitoring apparatus Mar 6, 1988 Issued
Array ( [id] => 2567793 [patent_doc_number] => 04857839 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-15 [patent_title] => 'Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 7/163002 [patent_app_country] => US [patent_app_date] => 1988-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4842 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/857/04857839.pdf [firstpage_image] =>[orig_patent_app_number] => 163002 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/163002
Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers Mar 1, 1988 Issued
Array ( [id] => 2561963 [patent_doc_number] => 04816755 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-03-28 [patent_title] => 'Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers' [patent_app_type] => 1 [patent_app_number] => 7/163001 [patent_app_country] => US [patent_app_date] => 1988-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 5213 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/816/04816755.pdf [firstpage_image] =>[orig_patent_app_number] => 163001 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/163001
Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers Mar 1, 1988 Issued
Array ( [id] => 2516660 [patent_doc_number] => 04841242 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-20 [patent_title] => 'Method for testing conductor networks' [patent_app_type] => 1 [patent_app_number] => 7/161758 [patent_app_country] => US [patent_app_date] => 1988-02-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2547 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/841/04841242.pdf [firstpage_image] =>[orig_patent_app_number] => 161758 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/161758
Method for testing conductor networks Feb 28, 1988 Issued
Array ( [id] => 2522536 [patent_doc_number] => 04870347 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Universal master breakout unit for testing avionic systems' [patent_app_type] => 1 [patent_app_number] => 7/158399 [patent_app_country] => US [patent_app_date] => 1988-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3806 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870347.pdf [firstpage_image] =>[orig_patent_app_number] => 158399 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/158399
Universal master breakout unit for testing avionic systems Feb 21, 1988 Issued
07/159520 POWER SENSOR FOR RF POWER MEASUREMENTS Feb 18, 1988 Issued
Array ( [id] => 2523011 [patent_doc_number] => 04855673 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-08 [patent_title] => 'Electron beam apparatus' [patent_app_type] => 1 [patent_app_number] => 7/156458 [patent_app_country] => US [patent_app_date] => 1988-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 1968 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/855/04855673.pdf [firstpage_image] =>[orig_patent_app_number] => 156458 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/156458
Electron beam apparatus Feb 15, 1988 Issued
Array ( [id] => 2567375 [patent_doc_number] => 04835462 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-30 [patent_title] => 'Means for proximal end measurement of AC voltage across distal end cable load' [patent_app_type] => 1 [patent_app_number] => 7/160498 [patent_app_country] => US [patent_app_date] => 1988-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1537 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/835/04835462.pdf [firstpage_image] =>[orig_patent_app_number] => 160498 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/160498
Means for proximal end measurement of AC voltage across distal end cable load Jan 31, 1988 Issued
Array ( [id] => 2516621 [patent_doc_number] => 04841240 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-20 [patent_title] => 'Method and apparatus for verifying the continuity between a circuit board and a test fixture' [patent_app_type] => 1 [patent_app_number] => 7/149829 [patent_app_country] => US [patent_app_date] => 1988-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2898 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/841/04841240.pdf [firstpage_image] =>[orig_patent_app_number] => 149829 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/149829
Method and apparatus for verifying the continuity between a circuit board and a test fixture Jan 28, 1988 Issued
07/146058 LOADING AND ACCURATE MEASUREMENT OF INTEGRATED DYNAMIC PARAMETERS AT POINT OF CONTACT IN AUTOMATIC DEVICE HANDLERS Jan 19, 1988 Abandoned
Array ( [id] => 2522641 [patent_doc_number] => 04870353 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-09-26 [patent_title] => 'Pre-loaded compression spring assembly' [patent_app_type] => 1 [patent_app_number] => 7/139418 [patent_app_country] => US [patent_app_date] => 1987-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 2899 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/870/04870353.pdf [firstpage_image] =>[orig_patent_app_number] => 139418 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/139418
Pre-loaded compression spring assembly Dec 29, 1987 Issued
Array ( [id] => 2494699 [patent_doc_number] => 04859939 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-08-22 [patent_title] => 'Non-destructive testing of SOS wafers using surface photovoltage measurements' [patent_app_type] => 1 [patent_app_number] => 7/135968 [patent_app_country] => US [patent_app_date] => 1987-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1432 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/859/04859939.pdf [firstpage_image] =>[orig_patent_app_number] => 135968 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/135968
Non-destructive testing of SOS wafers using surface photovoltage measurements Dec 20, 1987 Issued
07/129859 BEAM-BLANKING APPARATUS FOR STROBOSCOPIC ELECTRON BEAM INSTRUMENTS Dec 3, 1987 Abandoned
Array ( [id] => 2490494 [patent_doc_number] => 04820976 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-04-11 [patent_title] => 'Test fixture capable of electrically testing an integrated circuit die having a planar array of contacts' [patent_app_type] => 1 [patent_app_number] => 7/124719 [patent_app_country] => US [patent_app_date] => 1987-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 3093 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 392 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/820/04820976.pdf [firstpage_image] =>[orig_patent_app_number] => 124719 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/124719
Test fixture capable of electrically testing an integrated circuit die having a planar array of contacts Nov 23, 1987 Issued
Array ( [id] => 2640657 [patent_doc_number] => 04899104 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-02-06 [patent_title] => 'Adapter for a printed circuit board testing device' [patent_app_type] => 1 [patent_app_number] => 7/121039 [patent_app_country] => US [patent_app_date] => 1987-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 14 [patent_no_of_words] => 3794 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 228 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/899/04899104.pdf [firstpage_image] =>[orig_patent_app_number] => 121039 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/121039
Adapter for a printed circuit board testing device Nov 15, 1987 Issued
Array ( [id] => 2651757 [patent_doc_number] => 04896107 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1990-01-23 [patent_title] => 'Test pin for an adapter for connecting test contacts on the grid of a printed circuit board testing device with test points of a test-piece on and/or off the grid' [patent_app_type] => 1 [patent_app_number] => 7/121063 [patent_app_country] => US [patent_app_date] => 1987-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 12 [patent_no_of_words] => 3638 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/896/04896107.pdf [firstpage_image] =>[orig_patent_app_number] => 121063 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/121063
Test pin for an adapter for connecting test contacts on the grid of a printed circuit board testing device with test points of a test-piece on and/or off the grid Nov 15, 1987 Issued
Array ( [id] => 2516454 [patent_doc_number] => 04841231 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-06-20 [patent_title] => 'Test probe accessibility method and tool' [patent_app_type] => 1 [patent_app_number] => 7/114918 [patent_app_country] => US [patent_app_date] => 1987-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3435 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/841/04841231.pdf [firstpage_image] =>[orig_patent_app_number] => 114918 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/114918
Test probe accessibility method and tool Oct 29, 1987 Issued
Array ( [id] => 2567437 [patent_doc_number] => 04835465 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1989-05-30 [patent_title] => 'Testing apparatus for plated through-holes on printed circuit boards, and probe therefor' [patent_app_type] => 1 [patent_app_number] => 7/113389 [patent_app_country] => US [patent_app_date] => 1987-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 5574 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/835/04835465.pdf [firstpage_image] =>[orig_patent_app_number] => 113389 [rel_patent_id] =>[rel_patent_doc_number] =>)
07/113389
Testing apparatus for plated through-holes on printed circuit boards, and probe therefor Oct 21, 1987 Issued
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