William Burns

Array ( [id] => 2449384 [patent_doc_number] => 04749947 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-06-07 [patent_title] => 'Grid-based, \"cross-check\" test structure for testing integrated circuits' [patent_app_type] => 1 [patent_app_number] => 6/838330 [patent_app_country] => US [patent_app_date] => 1986-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 12 [patent_no_of_words] => 6956 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 227 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/749/04749947.pdf [firstpage_image] =>[orig_patent_app_number] => 838330 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2456177 [patent_doc_number] => 04733174 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-03-22 [patent_title] => 'Circuit testing method and apparatus' [patent_app_type] => 1 [patent_app_number] => 6/837990 [patent_app_country] => US [patent_app_date] => 1986-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5294 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/733/04733174.pdf [firstpage_image] =>[orig_patent_app_number] => 837990 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2353579 [patent_doc_number] => 04703258 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-10-27 [patent_title] => 'Method of testing control devices' [patent_app_type] => 1 [patent_app_number] => 6/852805 [patent_app_country] => US [patent_app_date] => 1986-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1923 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/703/04703258.pdf [firstpage_image] =>[orig_patent_app_number] => 852805 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2456052 [patent_doc_number] => 04733167 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-03-22 [patent_title] => 'Measurement circuit for digital to analog converter' [patent_app_type] => 1 [patent_app_number] => 6/829363 [patent_app_country] => US [patent_app_date] => 1986-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1578 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/733/04733167.pdf [firstpage_image] =>[orig_patent_app_number] => 829363 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2389122 [patent_doc_number] => 04737708 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-04-12 [patent_title] => 'Device for testing electrical or electronic systems with electromagnetic pulses' [patent_app_type] => 1 [patent_app_number] => 6/828900 [patent_app_country] => US [patent_app_date] => 1986-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 2131 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/737/04737708.pdf [firstpage_image] =>[orig_patent_app_number] => 828900 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2300278 [patent_doc_number] => 04697140 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-09-29 [patent_title] => 'Semiconductor integrated circuit having a test circuit for testing an internal circuit' [patent_app_type] => 1 [patent_app_number] => 6/828188 [patent_app_country] => US [patent_app_date] => 1986-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3738 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 367 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/697/04697140.pdf [firstpage_image] =>[orig_patent_app_number] => 828188 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2423469 [patent_doc_number] => 04748403 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-05-31 [patent_title] => 'Apparatus for measuring circuit element characteristics with VHF signal' [patent_app_type] => 1 [patent_app_number] => 6/826473 [patent_app_country] => US [patent_app_date] => 1986-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2055 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/748/04748403.pdf [firstpage_image] =>[orig_patent_app_number] => 826473 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2390656 [patent_doc_number] => 04724381 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-02-09 [patent_title] => 'RF antenna for transmission line sensor' [patent_app_type] => 1 [patent_app_number] => 6/825623 [patent_app_country] => US [patent_app_date] => 1986-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 3189 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/724/04724381.pdf [firstpage_image] =>[orig_patent_app_number] => 825623 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2348990 [patent_doc_number] => 04656418 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-07 [patent_title] => 'Molded clamp-type ammeter probe' [patent_app_type] => 1 [patent_app_number] => 6/822789 [patent_app_country] => US [patent_app_date] => 1986-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 7 [patent_no_of_words] => 3282 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/656/04656418.pdf [firstpage_image] =>[orig_patent_app_number] => 822789 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2428091 [patent_doc_number] => 04763068 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-08-09 [patent_title] => 'Method, circuit and apparatus for the elimination of the d.c. voltage components of a capacitive a.c. voltage divider' [patent_app_type] => 1 [patent_app_number] => 6/822312 [patent_app_country] => US [patent_app_date] => 1986-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3281 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/763/04763068.pdf [firstpage_image] =>[orig_patent_app_number] => 822312 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2456196 [patent_doc_number] => 04733175 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-03-22 [patent_title] => 'Varistor defect detection by incipient hot spot observation' [patent_app_type] => 1 [patent_app_number] => 6/813809 [patent_app_country] => US [patent_app_date] => 1985-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2353 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/733/04733175.pdf [firstpage_image] =>[orig_patent_app_number] => 813809 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2424194 [patent_doc_number] => 04727319 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-02-23 [patent_title] => 'Apparatus for on-wafer testing of electrical circuits' [patent_app_type] => 1 [patent_app_number] => 6/813179 [patent_app_country] => US [patent_app_date] => 1985-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 5014 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 295 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/727/04727319.pdf [firstpage_image] =>[orig_patent_app_number] => 813179 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2302112 [patent_doc_number] => 04682102 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-07-21 [patent_title] => 'Solid state watthour meter with switched-capacitor integration' [patent_app_type] => 1 [patent_app_number] => 6/812369 [patent_app_country] => US [patent_app_date] => 1985-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 4688 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/682/04682102.pdf [firstpage_image] =>[orig_patent_app_number] => 812369 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2424059 [patent_doc_number] => 04727312 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1988-02-23 [patent_title] => 'Circuit tester' [patent_app_type] => 1 [patent_app_number] => 6/812906 [patent_app_country] => US [patent_app_date] => 1985-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 3072 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/727/04727312.pdf [firstpage_image] =>[orig_patent_app_number] => 812906 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 2331001 [patent_doc_number] => 04672307 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-06-09 [patent_title] => 'Simplified delay testing for LSI circuit faults' [patent_app_type] => 1 [patent_app_number] => 6/811349 [patent_app_country] => US [patent_app_date] => 1985-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 29 [patent_no_of_words] => 12708 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/672/04672307.pdf [firstpage_image] =>[orig_patent_app_number] => 811349 [rel_patent_id] =>[rel_patent_doc_number] =>)