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William Burns

Examiner (ID: 17957)

Most Active Art Unit
2607
Art Unit(s)
2607
Total Applications
448
Issued Applications
388
Pending Applications
0
Abandoned Applications
60

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 2356550 [patent_doc_number] => 04654588 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-03-31 [patent_title] => 'Time-of-use watt-hour meter with demand profile capability' [patent_app_type] => 1 [patent_app_number] => 6/657921 [patent_app_country] => US [patent_app_date] => 1984-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 9242 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/654/04654588.pdf [firstpage_image] =>[orig_patent_app_number] => 657921 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/657921
Time-of-use watt-hour meter with demand profile capability Oct 4, 1984 Issued
Array ( [id] => 2314204 [patent_doc_number] => 04638246 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-01-20 [patent_title] => 'Integrated circuit input-output diagnostic system' [patent_app_type] => 1 [patent_app_number] => 6/653441 [patent_app_country] => US [patent_app_date] => 1984-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3291 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/638/04638246.pdf [firstpage_image] =>[orig_patent_app_number] => 653441 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/653441
Integrated circuit input-output diagnostic system Sep 20, 1984 Issued
Array ( [id] => 2349002 [patent_doc_number] => 04656419 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-04-07 [patent_title] => 'Simplified solar cell material tester' [patent_app_type] => 1 [patent_app_number] => 6/652554 [patent_app_country] => US [patent_app_date] => 1984-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 2961 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/656/04656419.pdf [firstpage_image] =>[orig_patent_app_number] => 652554 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/652554
Simplified solar cell material tester Sep 19, 1984 Issued
Array ( [id] => 2216629 [patent_doc_number] => 04616174 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1986-10-07 [patent_title] => 'Detector circuit for current measurements' [patent_app_type] => 1 [patent_app_number] => 6/650718 [patent_app_country] => US [patent_app_date] => 1984-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3992 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 233 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/616/04616174.pdf [firstpage_image] =>[orig_patent_app_number] => 650718 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/650718
Detector circuit for current measurements Sep 13, 1984 Issued
Array ( [id] => 2364512 [patent_doc_number] => 04694245 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-09-15 [patent_title] => 'Vacuum-actuated top access test probe fixture' [patent_app_type] => 1 [patent_app_number] => 6/648786 [patent_app_country] => US [patent_app_date] => 1984-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2714 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/694/04694245.pdf [firstpage_image] =>[orig_patent_app_number] => 648786 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/648786
Vacuum-actuated top access test probe fixture Sep 6, 1984 Issued
06/648870 AUTOMATIC TEST SYSTEM WITH ENHANCED PERFORMANCE OF TIMING GENERATORS Sep 6, 1984 Abandoned
Array ( [id] => 2352648 [patent_doc_number] => 04692694 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-09-08 [patent_title] => 'Load testing apparatus for electronic components' [patent_app_type] => 1 [patent_app_number] => 6/645364 [patent_app_country] => US [patent_app_date] => 1984-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2812 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 210 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/692/04692694.pdf [firstpage_image] =>[orig_patent_app_number] => 645364 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/645364
Load testing apparatus for electronic components Aug 28, 1984 Issued
Array ( [id] => 2313712 [patent_doc_number] => 04675600 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1987-06-23 [patent_title] => 'Testing apparatus for plated through-holes on printed circuit boards, and probe therefor' [patent_app_type] => 1 [patent_app_number] => 6/611140 [patent_app_country] => US [patent_app_date] => 1984-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 5576 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/04/675/04675600.pdf [firstpage_image] =>[orig_patent_app_number] => 611140 [rel_patent_id] =>[rel_patent_doc_number] =>)
06/611140
Testing apparatus for plated through-holes on printed circuit boards, and probe therefor May 16, 1984 Issued
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