| Application number | Title of the application | Filing Date | Status |
|---|
Array
(
[id] => 3447809
[patent_doc_number] => 05467012
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-14
[patent_title] => 'Power monitoring'
[patent_app_type] => 1
[patent_app_number] => 8/240323
[patent_app_country] => US
[patent_app_date] => 1994-05-10
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[pdf_file] => patents/05/467/05467012.pdf
[firstpage_image] =>[orig_patent_app_number] => 240323
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/240323 | Power monitoring | May 9, 1994 | Issued |
Array
(
[id] => 3423353
[patent_doc_number] => 05434501
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-18
[patent_title] => 'Polarization insensitive current and magnetic field optic sensor'
[patent_app_type] => 1
[patent_app_number] => 8/235842
[patent_app_country] => US
[patent_app_date] => 1994-04-29
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[pdf_file] => patents/05/434/05434501.pdf
[firstpage_image] =>[orig_patent_app_number] => 235842
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/235842 | Polarization insensitive current and magnetic field optic sensor | Apr 28, 1994 | Issued |
Array
(
[id] => 3485529
[patent_doc_number] => 05457402
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-10
[patent_title] => 'Armature resistance measuring apparatus and method'
[patent_app_type] => 1
[patent_app_number] => 8/232503
[patent_app_country] => US
[patent_app_date] => 1994-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/457/05457402.pdf
[firstpage_image] =>[orig_patent_app_number] => 232503
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/232503 | Armature resistance measuring apparatus and method | Apr 24, 1994 | Issued |
Array
(
[id] => 3581005
[patent_doc_number] => 05523694
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-06-04
[patent_title] => 'Integrated circuit failure analysis by low-energy charge-induced voltage alteration'
[patent_app_type] => 1
[patent_app_number] => 8/225119
[patent_app_country] => US
[patent_app_date] => 1994-04-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 8163
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[pdf_file] => patents/05/523/05523694.pdf
[firstpage_image] =>[orig_patent_app_number] => 225119
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/225119 | Integrated circuit failure analysis by low-energy charge-induced voltage alteration | Apr 7, 1994 | Issued |
Array
(
[id] => 3584750
[patent_doc_number] => 05491425
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-02-13
[patent_title] => 'Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same'
[patent_app_type] => 1
[patent_app_number] => 8/215774
[patent_app_country] => US
[patent_app_date] => 1994-03-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => patents/05/491/05491425.pdf
[firstpage_image] =>[orig_patent_app_number] => 215774
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/215774 | Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same | Mar 21, 1994 | Issued |
Array
(
[id] => 3129843
[patent_doc_number] => 05436557
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-25
[patent_title] => 'Current sensor which is attachable to an external object by retention between the external object and an electrical conductor'
[patent_app_type] => 1
[patent_app_number] => 8/203134
[patent_app_country] => US
[patent_app_date] => 1994-02-28
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[pdf_file] => patents/05/436/05436557.pdf
[firstpage_image] =>[orig_patent_app_number] => 203134
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/203134 | Current sensor which is attachable to an external object by retention between the external object and an electrical conductor | Feb 27, 1994 | Issued |
Array
(
[id] => 3448147
[patent_doc_number] => 05397981
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-14
[patent_title] => 'Digital storage oscilloscope with automatic time base'
[patent_app_type] => 1
[patent_app_number] => 8/203974
[patent_app_country] => US
[patent_app_date] => 1994-02-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/397/05397981.pdf
[firstpage_image] =>[orig_patent_app_number] => 203974
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/203974 | Digital storage oscilloscope with automatic time base | Feb 27, 1994 | Issued |
Array
(
[id] => 3458038
[patent_doc_number] => 05451865
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-19
[patent_title] => 'Method and apparatus for sensing an input current with a bridge circuit'
[patent_app_type] => 1
[patent_app_number] => 8/202334
[patent_app_country] => US
[patent_app_date] => 1994-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 6501
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[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/451/05451865.pdf
[firstpage_image] =>[orig_patent_app_number] => 202334
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/202334 | Method and apparatus for sensing an input current with a bridge circuit | Feb 24, 1994 | Issued |
| 08/201573 | RETENTION OF TEST PROBES IN TRANSLATOR FIXTURES | Feb 24, 1994 | Abandoned |
| 08/200783 | TRANSLATOR FIXTURE WITH MODULE FOR EXPANDING TEST POINTS | Feb 22, 1994 | Abandoned |
Array
(
[id] => 3122313
[patent_doc_number] => 05450018
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Device for testing electrical modules'
[patent_app_type] => 1
[patent_app_number] => 8/194503
[patent_app_country] => US
[patent_app_date] => 1994-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/05/450/05450018.pdf
[firstpage_image] =>[orig_patent_app_number] => 194503
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/194503 | Device for testing electrical modules | Feb 8, 1994 | Issued |
| 08/192703 | METHOD AND CONTROL CIRCUIT FOR MEASURING THE TEMPERATURE OF AN INTEGRATED CIRCUIT | Feb 6, 1994 | Abandoned |
Array
(
[id] => 3467192
[patent_doc_number] => 05391995
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-02-21
[patent_title] => 'Twisting electrical test probe with controlled pointing accuracy'
[patent_app_type] => 1
[patent_app_number] => 8/189693
[patent_app_country] => US
[patent_app_date] => 1994-02-01
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/391/05391995.pdf
[firstpage_image] =>[orig_patent_app_number] => 189693
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/189693 | Twisting electrical test probe with controlled pointing accuracy | Jan 31, 1994 | Issued |
Array
(
[id] => 3494690
[patent_doc_number] => 05471148
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-28
[patent_title] => 'Probe card changer system and method'
[patent_app_type] => 1
[patent_app_number] => 8/188636
[patent_app_country] => US
[patent_app_date] => 1994-01-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[pdf_file] => patents/05/471/05471148.pdf
[firstpage_image] =>[orig_patent_app_number] => 188636
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/188636 | Probe card changer system and method | Jan 27, 1994 | Issued |
Array
(
[id] => 3448135
[patent_doc_number] => 05397980
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-03-14
[patent_title] => 'Current probe calibration fixture'
[patent_app_type] => 1
[patent_app_number] => 8/186964
[patent_app_country] => US
[patent_app_date] => 1994-01-27
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[pdf_file] => patents/05/397/05397980.pdf
[firstpage_image] =>[orig_patent_app_number] => 186964
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/186964 | Current probe calibration fixture | Jan 26, 1994 | Issued |
Array
(
[id] => 3481175
[patent_doc_number] => 05432439
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-11
[patent_title] => 'Arrangement in a current detection circuit'
[patent_app_type] => 1
[patent_app_number] => 8/170263
[patent_app_country] => US
[patent_app_date] => 1993-12-29
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[pdf_file] => patents/05/432/05432439.pdf
[firstpage_image] =>[orig_patent_app_number] => 170263
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/170263 | Arrangement in a current detection circuit | Dec 28, 1993 | Issued |
Array
(
[id] => 3414925
[patent_doc_number] => 05461306
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-24
[patent_title] => 'DC current detection system for a current transformer'
[patent_app_type] => 1
[patent_app_number] => 8/174104
[patent_app_country] => US
[patent_app_date] => 1993-12-28
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[pdf_file] => patents/05/461/05461306.pdf
[firstpage_image] =>[orig_patent_app_number] => 174104
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/174104 | DC current detection system for a current transformer | Dec 27, 1993 | Issued |
Array
(
[id] => 3492626
[patent_doc_number] => 05475316
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-12
[patent_title] => 'Transportable image emission microscope'
[patent_app_type] => 1
[patent_app_number] => 8/174943
[patent_app_country] => US
[patent_app_date] => 1993-12-27
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[pdf_file] => patents/05/475/05475316.pdf
[firstpage_image] =>[orig_patent_app_number] => 174943
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/174943 | Transportable image emission microscope | Dec 26, 1993 | Issued |
Array
(
[id] => 3428831
[patent_doc_number] => 05422567
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-06-06
[patent_title] => 'High frequency power measurement'
[patent_app_type] => 1
[patent_app_number] => 8/174593
[patent_app_country] => US
[patent_app_date] => 1993-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
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[pdf_file] => patents/05/422/05422567.pdf
[firstpage_image] =>[orig_patent_app_number] => 174593
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/174593 | High frequency power measurement | Dec 26, 1993 | Issued |
| 08/172580 | SINGULATED BARE DIE TESTER AND METHOD OF PERFORMING FORCED TEMPERATURE ELECTRICAL TESTS AND BURN-IN | Dec 22, 1993 | Abandoned |