
William E. Mcclain
Examiner (ID: 5611, Phone: (303)297-4253 , Office: P/1754 )
| Most Active Art Unit | 1721 |
| Art Unit(s) | 1721, 1754, 1755 |
| Total Applications | 297 |
| Issued Applications | 109 |
| Pending Applications | 0 |
| Abandoned Applications | 186 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 3421243
[patent_doc_number] => 05453702
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-26
[patent_title] => 'Automatic probe fixture loading apparatus with gimballing compensation'
[patent_app_type] => 1
[patent_app_number] => 8/172034
[patent_app_country] => US
[patent_app_date] => 1993-12-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 11
[patent_no_of_words] => 5361
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/453/05453702.pdf
[firstpage_image] =>[orig_patent_app_number] => 172034
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/172034 | Automatic probe fixture loading apparatus with gimballing compensation | Dec 21, 1993 | Issued |
Array
(
[id] => 3434042
[patent_doc_number] => 05463311
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-31
[patent_title] => 'Apparatus and method for measuring operating voltage electrical signals in a high voltage environment'
[patent_app_type] => 1
[patent_app_number] => 8/171781
[patent_app_country] => US
[patent_app_date] => 1993-12-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2504
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/463/05463311.pdf
[firstpage_image] =>[orig_patent_app_number] => 171781
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/171781 | Apparatus and method for measuring operating voltage electrical signals in a high voltage environment | Dec 20, 1993 | Issued |
Array
(
[id] => 3122294
[patent_doc_number] => 05450017
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Test fixture having translator for grid interface'
[patent_app_type] => 1
[patent_app_number] => 8/161250
[patent_app_country] => US
[patent_app_date] => 1993-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 7680
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 414
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/450/05450017.pdf
[firstpage_image] =>[orig_patent_app_number] => 161250
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/161250 | Test fixture having translator for grid interface | Dec 2, 1993 | Issued |
Array
(
[id] => 3111421
[patent_doc_number] => 05418449
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-23
[patent_title] => 'Device for the detection of power at the output of an electronic circuit'
[patent_app_type] => 1
[patent_app_number] => 8/161271
[patent_app_country] => US
[patent_app_date] => 1993-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 4
[patent_no_of_words] => 1578
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/418/05418449.pdf
[firstpage_image] =>[orig_patent_app_number] => 161271
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/161271 | Device for the detection of power at the output of an electronic circuit | Dec 2, 1993 | Issued |
Array
(
[id] => 3446867
[patent_doc_number] => 05430368
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-04
[patent_title] => 'Method for remotely approximating the stem thrust of motor operated valves'
[patent_app_type] => 1
[patent_app_number] => 8/161833
[patent_app_country] => US
[patent_app_date] => 1993-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 8
[patent_no_of_words] => 6697
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 334
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/430/05430368.pdf
[firstpage_image] =>[orig_patent_app_number] => 161833
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/161833 | Method for remotely approximating the stem thrust of motor operated valves | Dec 2, 1993 | Issued |
Array
(
[id] => 3421259
[patent_doc_number] => 05453703
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-26
[patent_title] => 'Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor material'
[patent_app_type] => 1
[patent_app_number] => 8/159334
[patent_app_country] => US
[patent_app_date] => 1993-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4926
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 7
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/453/05453703.pdf
[firstpage_image] =>[orig_patent_app_number] => 159334
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/159334 | Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor material | Nov 28, 1993 | Issued |
Array
(
[id] => 3116879
[patent_doc_number] => 05414346
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-09
[patent_title] => 'Adjustable piercing probe tip'
[patent_app_type] => 1
[patent_app_number] => 8/158133
[patent_app_country] => US
[patent_app_date] => 1993-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 6
[patent_no_of_words] => 1610
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/414/05414346.pdf
[firstpage_image] =>[orig_patent_app_number] => 158133
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/158133 | Adjustable piercing probe tip | Nov 23, 1993 | Issued |
Array
(
[id] => 3502346
[patent_doc_number] => 05532615
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1996-07-02
[patent_title] => 'Inspecting method, inspecting apparatus, and defect correcting method'
[patent_app_type] => 1
[patent_app_number] => 8/158843
[patent_app_country] => US
[patent_app_date] => 1993-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 58
[patent_no_of_words] => 14017
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 339
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/532/05532615.pdf
[firstpage_image] =>[orig_patent_app_number] => 158843
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/158843 | Inspecting method, inspecting apparatus, and defect correcting method | Nov 23, 1993 | Issued |
Array
(
[id] => 3481420
[patent_doc_number] => 05432456
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-07-11
[patent_title] => 'Connector installation GO/NO-GO test fixture'
[patent_app_type] => 1
[patent_app_number] => 8/157641
[patent_app_country] => US
[patent_app_date] => 1993-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2478
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/432/05432456.pdf
[firstpage_image] =>[orig_patent_app_number] => 157641
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/157641 | Connector installation GO/NO-GO test fixture | Nov 23, 1993 | Issued |
| 08/157990 | METHOD OF BATCH TESTING SURFACE MOUNT DEVICES USING A SUBSTRATE EDGE CONNECTOR | Nov 22, 1993 | Abandoned |
Array
(
[id] => 3417126
[patent_doc_number] => 05412315
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-05-02
[patent_title] => 'Semiconductor integrated circuit adapted for a current-leak test'
[patent_app_type] => 1
[patent_app_number] => 8/157223
[patent_app_country] => US
[patent_app_date] => 1993-11-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 2627
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 245
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/412/05412315.pdf
[firstpage_image] =>[orig_patent_app_number] => 157223
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/157223 | Semiconductor integrated circuit adapted for a current-leak test | Nov 22, 1993 | Issued |
Array
(
[id] => 3466939
[patent_doc_number] => 05469072
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-11-21
[patent_title] => 'Integrated circuit test system'
[patent_app_type] => 1
[patent_app_number] => 8/143770
[patent_app_country] => US
[patent_app_date] => 1993-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 5151
[patent_no_of_claims] => 2
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[patent_words_short_claim] => 124
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/469/05469072.pdf
[firstpage_image] =>[orig_patent_app_number] => 143770
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/143770 | Integrated circuit test system | Oct 31, 1993 | Issued |
Array
(
[id] => 3492653
[patent_doc_number] => 05475318
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-12-12
[patent_title] => 'Microprobe'
[patent_app_type] => 1
[patent_app_number] => 8/145403
[patent_app_country] => US
[patent_app_date] => 1993-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_claims] => 36
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[patent_words_short_claim] => 140
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/475/05475318.pdf
[firstpage_image] =>[orig_patent_app_number] => 145403
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/145403 | Microprobe | Oct 28, 1993 | Issued |
Array
(
[id] => 3122116
[patent_doc_number] => 05450007
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Method and apparatus for power measuring'
[patent_app_type] => 1
[patent_app_number] => 8/122503
[patent_app_country] => US
[patent_app_date] => 1993-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => patents/05/450/05450007.pdf
[firstpage_image] =>[orig_patent_app_number] => 122503
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/122503 | Method and apparatus for power measuring | Sep 27, 1993 | Issued |
Array
(
[id] => 3418011
[patent_doc_number] => 05444389
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-22
[patent_title] => 'Method and apparatus for measuring lifetime of minority carriers in semiconductor'
[patent_app_type] => 1
[patent_app_number] => 8/123443
[patent_app_country] => US
[patent_app_date] => 1993-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/444/05444389.pdf
[firstpage_image] =>[orig_patent_app_number] => 123443
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/123443 | Method and apparatus for measuring lifetime of minority carriers in semiconductor | Sep 16, 1993 | Issued |
Array
(
[id] => 3459080
[patent_doc_number] => 05378984
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-01-03
[patent_title] => 'EB type IC tester'
[patent_app_type] => 1
[patent_app_number] => 8/119061
[patent_app_country] => US
[patent_app_date] => 1993-09-16
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/378/05378984.pdf
[firstpage_image] =>[orig_patent_app_number] => 119061
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/119061 | EB type IC tester | Sep 15, 1993 | Issued |
Array
(
[id] => 3415209
[patent_doc_number] => 05461327
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-10-24
[patent_title] => 'Probe apparatus'
[patent_app_type] => 1
[patent_app_number] => 8/113741
[patent_app_country] => US
[patent_app_date] => 1993-08-31
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/461/05461327.pdf
[firstpage_image] =>[orig_patent_app_number] => 113741
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/113741 | Probe apparatus | Aug 30, 1993 | Issued |
Array
(
[id] => 3113442
[patent_doc_number] => 05408175
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-04-18
[patent_title] => 'Storm monitor'
[patent_app_type] => 1
[patent_app_number] => 8/115183
[patent_app_country] => US
[patent_app_date] => 1993-08-31
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/408/05408175.pdf
[firstpage_image] =>[orig_patent_app_number] => 115183
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/115183 | Storm monitor | Aug 30, 1993 | Issued |
Array
(
[id] => 3122098
[patent_doc_number] => 05450006
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-09-12
[patent_title] => 'Apparatus and methods for measuring magnetic fields and electric currents'
[patent_app_type] => 1
[patent_app_number] => 8/108631
[patent_app_country] => US
[patent_app_date] => 1993-08-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/05/450/05450006.pdf
[firstpage_image] =>[orig_patent_app_number] => 108631
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/108631 | Apparatus and methods for measuring magnetic fields and electric currents | Aug 29, 1993 | Issued |
Array
(
[id] => 3488070
[patent_doc_number] => 05446381
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 1995-08-29
[patent_title] => 'Optical voltage electric field sensor'
[patent_app_type] => 1
[patent_app_number] => 8/112070
[patent_app_country] => US
[patent_app_date] => 1993-08-26
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/05/446/05446381.pdf
[firstpage_image] =>[orig_patent_app_number] => 112070
[rel_patent_id] =>[rel_patent_doc_number] =>) 08/112070 | Optical voltage electric field sensor | Aug 25, 1993 | Issued |