Search

William E. Mcclain

Examiner (ID: 5611, Phone: (303)297-4253 , Office: P/1754 )

Most Active Art Unit
1721
Art Unit(s)
1721, 1754, 1755
Total Applications
297
Issued Applications
109
Pending Applications
0
Abandoned Applications
186

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3421243 [patent_doc_number] => 05453702 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-26 [patent_title] => 'Automatic probe fixture loading apparatus with gimballing compensation' [patent_app_type] => 1 [patent_app_number] => 8/172034 [patent_app_country] => US [patent_app_date] => 1993-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 5361 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/453/05453702.pdf [firstpage_image] =>[orig_patent_app_number] => 172034 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/172034
Automatic probe fixture loading apparatus with gimballing compensation Dec 21, 1993 Issued
Array ( [id] => 3434042 [patent_doc_number] => 05463311 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-31 [patent_title] => 'Apparatus and method for measuring operating voltage electrical signals in a high voltage environment' [patent_app_type] => 1 [patent_app_number] => 8/171781 [patent_app_country] => US [patent_app_date] => 1993-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2504 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/463/05463311.pdf [firstpage_image] =>[orig_patent_app_number] => 171781 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/171781
Apparatus and method for measuring operating voltage electrical signals in a high voltage environment Dec 20, 1993 Issued
Array ( [id] => 3122294 [patent_doc_number] => 05450017 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-12 [patent_title] => 'Test fixture having translator for grid interface' [patent_app_type] => 1 [patent_app_number] => 8/161250 [patent_app_country] => US [patent_app_date] => 1993-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7680 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 414 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/450/05450017.pdf [firstpage_image] =>[orig_patent_app_number] => 161250 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/161250
Test fixture having translator for grid interface Dec 2, 1993 Issued
Array ( [id] => 3111421 [patent_doc_number] => 05418449 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-23 [patent_title] => 'Device for the detection of power at the output of an electronic circuit' [patent_app_type] => 1 [patent_app_number] => 8/161271 [patent_app_country] => US [patent_app_date] => 1993-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 4 [patent_no_of_words] => 1578 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/418/05418449.pdf [firstpage_image] =>[orig_patent_app_number] => 161271 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/161271
Device for the detection of power at the output of an electronic circuit Dec 2, 1993 Issued
Array ( [id] => 3446867 [patent_doc_number] => 05430368 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-04 [patent_title] => 'Method for remotely approximating the stem thrust of motor operated valves' [patent_app_type] => 1 [patent_app_number] => 8/161833 [patent_app_country] => US [patent_app_date] => 1993-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 6697 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 334 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/430/05430368.pdf [firstpage_image] =>[orig_patent_app_number] => 161833 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/161833
Method for remotely approximating the stem thrust of motor operated valves Dec 2, 1993 Issued
Array ( [id] => 3421259 [patent_doc_number] => 05453703 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-26 [patent_title] => 'Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor material' [patent_app_type] => 1 [patent_app_number] => 8/159334 [patent_app_country] => US [patent_app_date] => 1993-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4926 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/453/05453703.pdf [firstpage_image] =>[orig_patent_app_number] => 159334 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/159334
Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor material Nov 28, 1993 Issued
Array ( [id] => 3116879 [patent_doc_number] => 05414346 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-09 [patent_title] => 'Adjustable piercing probe tip' [patent_app_type] => 1 [patent_app_number] => 8/158133 [patent_app_country] => US [patent_app_date] => 1993-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1610 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/414/05414346.pdf [firstpage_image] =>[orig_patent_app_number] => 158133 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/158133
Adjustable piercing probe tip Nov 23, 1993 Issued
Array ( [id] => 3502346 [patent_doc_number] => 05532615 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-02 [patent_title] => 'Inspecting method, inspecting apparatus, and defect correcting method' [patent_app_type] => 1 [patent_app_number] => 8/158843 [patent_app_country] => US [patent_app_date] => 1993-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 58 [patent_no_of_words] => 14017 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 339 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/532/05532615.pdf [firstpage_image] =>[orig_patent_app_number] => 158843 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/158843
Inspecting method, inspecting apparatus, and defect correcting method Nov 23, 1993 Issued
Array ( [id] => 3481420 [patent_doc_number] => 05432456 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-07-11 [patent_title] => 'Connector installation GO/NO-GO test fixture' [patent_app_type] => 1 [patent_app_number] => 8/157641 [patent_app_country] => US [patent_app_date] => 1993-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2478 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/432/05432456.pdf [firstpage_image] =>[orig_patent_app_number] => 157641 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/157641
Connector installation GO/NO-GO test fixture Nov 23, 1993 Issued
08/157990 METHOD OF BATCH TESTING SURFACE MOUNT DEVICES USING A SUBSTRATE EDGE CONNECTOR Nov 22, 1993 Abandoned
Array ( [id] => 3417126 [patent_doc_number] => 05412315 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-02 [patent_title] => 'Semiconductor integrated circuit adapted for a current-leak test' [patent_app_type] => 1 [patent_app_number] => 8/157223 [patent_app_country] => US [patent_app_date] => 1993-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2627 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/412/05412315.pdf [firstpage_image] =>[orig_patent_app_number] => 157223 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/157223
Semiconductor integrated circuit adapted for a current-leak test Nov 22, 1993 Issued
Array ( [id] => 3466939 [patent_doc_number] => 05469072 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-21 [patent_title] => 'Integrated circuit test system' [patent_app_type] => 1 [patent_app_number] => 8/143770 [patent_app_country] => US [patent_app_date] => 1993-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 5151 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/469/05469072.pdf [firstpage_image] =>[orig_patent_app_number] => 143770 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/143770
Integrated circuit test system Oct 31, 1993 Issued
Array ( [id] => 3492653 [patent_doc_number] => 05475318 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Microprobe' [patent_app_type] => 1 [patent_app_number] => 8/145403 [patent_app_country] => US [patent_app_date] => 1993-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 23 [patent_no_of_words] => 5338 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475318.pdf [firstpage_image] =>[orig_patent_app_number] => 145403 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/145403
Microprobe Oct 28, 1993 Issued
Array ( [id] => 3122116 [patent_doc_number] => 05450007 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-12 [patent_title] => 'Method and apparatus for power measuring' [patent_app_type] => 1 [patent_app_number] => 8/122503 [patent_app_country] => US [patent_app_date] => 1993-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 6182 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/450/05450007.pdf [firstpage_image] =>[orig_patent_app_number] => 122503 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/122503
Method and apparatus for power measuring Sep 27, 1993 Issued
Array ( [id] => 3418011 [patent_doc_number] => 05444389 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-22 [patent_title] => 'Method and apparatus for measuring lifetime of minority carriers in semiconductor' [patent_app_type] => 1 [patent_app_number] => 8/123443 [patent_app_country] => US [patent_app_date] => 1993-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 3481 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/444/05444389.pdf [firstpage_image] =>[orig_patent_app_number] => 123443 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/123443
Method and apparatus for measuring lifetime of minority carriers in semiconductor Sep 16, 1993 Issued
Array ( [id] => 3459080 [patent_doc_number] => 05378984 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-01-03 [patent_title] => 'EB type IC tester' [patent_app_type] => 1 [patent_app_number] => 8/119061 [patent_app_country] => US [patent_app_date] => 1993-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3695 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/378/05378984.pdf [firstpage_image] =>[orig_patent_app_number] => 119061 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/119061
EB type IC tester Sep 15, 1993 Issued
Array ( [id] => 3415209 [patent_doc_number] => 05461327 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-24 [patent_title] => 'Probe apparatus' [patent_app_type] => 1 [patent_app_number] => 8/113741 [patent_app_country] => US [patent_app_date] => 1993-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5142 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/461/05461327.pdf [firstpage_image] =>[orig_patent_app_number] => 113741 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/113741
Probe apparatus Aug 30, 1993 Issued
Array ( [id] => 3113442 [patent_doc_number] => 05408175 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-18 [patent_title] => 'Storm monitor' [patent_app_type] => 1 [patent_app_number] => 8/115183 [patent_app_country] => US [patent_app_date] => 1993-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 12019 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 280 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/408/05408175.pdf [firstpage_image] =>[orig_patent_app_number] => 115183 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/115183
Storm monitor Aug 30, 1993 Issued
Array ( [id] => 3122098 [patent_doc_number] => 05450006 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-12 [patent_title] => 'Apparatus and methods for measuring magnetic fields and electric currents' [patent_app_type] => 1 [patent_app_number] => 8/108631 [patent_app_country] => US [patent_app_date] => 1993-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 4077 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 43 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/450/05450006.pdf [firstpage_image] =>[orig_patent_app_number] => 108631 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/108631
Apparatus and methods for measuring magnetic fields and electric currents Aug 29, 1993 Issued
Array ( [id] => 3488070 [patent_doc_number] => 05446381 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-29 [patent_title] => 'Optical voltage electric field sensor' [patent_app_type] => 1 [patent_app_number] => 8/112070 [patent_app_country] => US [patent_app_date] => 1993-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4403 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 369 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/446/05446381.pdf [firstpage_image] =>[orig_patent_app_number] => 112070 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/112070
Optical voltage electric field sensor Aug 25, 1993 Issued
Menu