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William J. Allen

Examiner (ID: 16308, Phone: (571)272-1443 , Office: P/3625 )

Most Active Art Unit
3625
Art Unit(s)
3619, 3625
Total Applications
911
Issued Applications
504
Pending Applications
103
Abandoned Applications
333

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 939701 [patent_doc_number] => RE038894 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2005-11-29 [patent_title] => 'Method and apparatus for testing integrated circuits' [patent_app_type] => reissue [patent_app_number] => 08/715869 [patent_app_country] => US [patent_app_date] => 1996-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1634 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 13 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/RE/038/RE038894.pdf [firstpage_image] =>[orig_patent_app_number] => 08715869 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/715869
Method and apparatus for testing integrated circuits Sep 18, 1996 Issued
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