Search

Wyatt A. Stoffa

Examiner (ID: 9303, Phone: (571)270-1782 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
2872, 2881
Total Applications
1230
Issued Applications
849
Pending Applications
189
Abandoned Applications
207

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 12243152 [patent_doc_number] => 20180076014 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-03-15 [patent_title] => 'SUB-ATMOSPHERIC PRESSURE LASER IONIZATION SOURCE USING AN ION FUNNEL' [patent_app_type] => utility [patent_app_number] => 15/261383 [patent_app_country] => US [patent_app_date] => 2016-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7744 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15261383 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/261383
SUB-ATMOSPHERIC PRESSURE LASER IONIZATION SOURCE USING AN ION FUNNEL Sep 8, 2016 Abandoned
Array ( [id] => 14011439 [patent_doc_number] => 10224194 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-03-05 [patent_title] => Device to manipulate ions of same or different polarities [patent_app_type] => utility [patent_app_number] => 15/260046 [patent_app_country] => US [patent_app_date] => 2016-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 19 [patent_no_of_words] => 7793 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15260046 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/260046
Device to manipulate ions of same or different polarities Sep 7, 2016 Issued
Array ( [id] => 14768975 [patent_doc_number] => 10395889 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-08-27 [patent_title] => In situ beam current monitoring and control in scanned ion implantation systems [patent_app_type] => utility [patent_app_number] => 15/258723 [patent_app_country] => US [patent_app_date] => 2016-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 13343 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15258723 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/258723
In situ beam current monitoring and control in scanned ion implantation systems Sep 6, 2016 Issued
Array ( [id] => 16192146 [patent_doc_number] => 20200232995 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-07-23 [patent_title] => MEASUREMENT OF PROTEIN MOLECULAR FLUX RATES BY QUANTIFYING ISOTOPOLOGUE ABUNDANCES IN IMMONIUM ION USING HIGH RESOLUTION MASS SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 15/758268 [patent_app_country] => US [patent_app_date] => 2016-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 19117 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15758268 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/758268
MEASUREMENT OF PROTEIN MOLECULAR FLUX RATES BY QUANTIFYING ISOTOPOLOGUE ABUNDANCES IN IMMONIUM ION USING HIGH RESOLUTION MASS SPECTROMETRY Sep 6, 2016 Abandoned
Array ( [id] => 14823603 [patent_doc_number] => 10408803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-09-10 [patent_title] => Mass spectrometer detection and analysis method [patent_app_type] => utility [patent_app_number] => 15/548864 [patent_app_country] => US [patent_app_date] => 2016-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 5623 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15548864 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/548864
Mass spectrometer detection and analysis method Sep 5, 2016 Issued
Array ( [id] => 14537251 [patent_doc_number] => 20190204247 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-07-04 [patent_title] => IMAGE ANALYSIS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS [patent_app_type] => utility [patent_app_number] => 16/330003 [patent_app_country] => US [patent_app_date] => 2016-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8454 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16330003 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/330003
Image analysis apparatus and charged particle beam apparatus Aug 31, 2016 Issued
Array ( [id] => 14542065 [patent_doc_number] => 20190206654 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-07-04 [patent_title] => MEASURING DEVICE AND MEASURING METHOD [patent_app_type] => utility [patent_app_number] => 16/325662 [patent_app_country] => US [patent_app_date] => 2016-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16325662 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/325662
Measuring device and measuring method Aug 30, 2016 Issued
Array ( [id] => 15857067 [patent_doc_number] => 10643829 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-05-05 [patent_title] => Pseudo internal standard method, device and application for mass spectrometry quantitative analysis [patent_app_type] => utility [patent_app_number] => 15/762019 [patent_app_country] => US [patent_app_date] => 2016-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 7633 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 326 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15762019 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/762019
Pseudo internal standard method, device and application for mass spectrometry quantitative analysis Aug 29, 2016 Issued
Array ( [id] => 11517347 [patent_doc_number] => 20170084421 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-23 [patent_title] => 'Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools' [patent_app_type] => utility [patent_app_number] => 15/245765 [patent_app_country] => US [patent_app_date] => 2016-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2809 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15245765 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/245765
Backscattered electrons (BSE) imaging using multi-beam tools Aug 23, 2016 Issued
Array ( [id] => 11472739 [patent_doc_number] => 20170059522 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'ANALYTICAL CELL' [patent_app_type] => utility [patent_app_number] => 15/245745 [patent_app_country] => US [patent_app_date] => 2016-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 13560 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15245745 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/245745
Analytical cell Aug 23, 2016 Issued
Array ( [id] => 13861983 [patent_doc_number] => 10192716 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-01-29 [patent_title] => Multi-beam dark field imaging [patent_app_type] => utility [patent_app_number] => 15/245911 [patent_app_country] => US [patent_app_date] => 2016-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3018 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15245911 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/245911
Multi-beam dark field imaging Aug 23, 2016 Issued
Array ( [id] => 16593783 [patent_doc_number] => 10903060 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-01-26 [patent_title] => Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor [patent_app_type] => utility [patent_app_number] => 15/244720 [patent_app_country] => US [patent_app_date] => 2016-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 9515 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15244720 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/244720
Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor Aug 22, 2016 Issued
Array ( [id] => 11475393 [patent_doc_number] => 20170062176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-02 [patent_title] => 'SAMPLE HOLDER' [patent_app_type] => utility [patent_app_number] => 15/243301 [patent_app_country] => US [patent_app_date] => 2016-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8158 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243301 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/243301
Sample holder Aug 21, 2016 Issued
Array ( [id] => 11607906 [patent_doc_number] => 20170125209 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-05-04 [patent_title] => 'CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION' [patent_app_type] => utility [patent_app_number] => 15/243753 [patent_app_country] => US [patent_app_date] => 2016-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6752 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15243753 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/243753
Charged particle microscope with vibration detection / correction Aug 21, 2016 Issued
Array ( [id] => 11459872 [patent_doc_number] => 20170053778 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-23 [patent_title] => 'METHOD OF PREPARING A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPE SAMPLE USED IN AN INTEGRATED CIRCUIT ANALYSIS' [patent_app_type] => utility [patent_app_number] => 15/241284 [patent_app_country] => US [patent_app_date] => 2016-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3022 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15241284 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/241284
Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis Aug 18, 2016 Issued
Array ( [id] => 11326197 [patent_doc_number] => 20160356809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-12-08 [patent_title] => 'CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY' [patent_app_type] => utility [patent_app_number] => 15/241029 [patent_app_country] => US [patent_app_date] => 2016-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 18161 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15241029 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/241029
Chemical nano-identification of a sample using normalized near-field spectroscopy Aug 17, 2016 Issued
Array ( [id] => 11493750 [patent_doc_number] => 20170067935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-09 [patent_title] => 'Fixing Mechanism Actuatable Without a Tool and Which Fixes a Measuring Probe in a Detachable Manner for a Scanning Probe Microscope' [patent_app_type] => utility [patent_app_number] => 15/240148 [patent_app_country] => US [patent_app_date] => 2016-08-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 9932 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15240148 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/240148
Fixing mechanism actuatable without a tool and which fixes a measuring probe in a detachable manner for a scanning probe microscope Aug 17, 2016 Issued
Array ( [id] => 11458303 [patent_doc_number] => 20170052210 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-23 [patent_title] => 'MEASURING METHOD FOR ATOMIC FORCE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 15/238326 [patent_app_country] => US [patent_app_date] => 2016-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5671 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15238326 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/238326
Measuring method for atomic force microscope Aug 15, 2016 Issued
Array ( [id] => 14148093 [patent_doc_number] => 10254419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-04-09 [patent_title] => Acquisition and processing of data in a tomographic imaging apparatus [patent_app_type] => utility [patent_app_number] => 15/237309 [patent_app_country] => US [patent_app_date] => 2016-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5307 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15237309 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/237309
Acquisition and processing of data in a tomographic imaging apparatus Aug 14, 2016 Issued
Array ( [id] => 12186819 [patent_doc_number] => 20180045755 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-15 [patent_title] => 'Scanning Probe and Electron Microscope Probes and Their Manufacture' [patent_app_type] => utility [patent_app_number] => 15/235889 [patent_app_country] => US [patent_app_date] => 2016-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4065 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15235889 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/235889
Scanning probe and electron microscope probes and their manufacture Aug 11, 2016 Issued
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