Yan Lan

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Array ( [id] => 7655587 [patent_doc_number] => 20110304856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-12-15 [patent_title] => 'LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/149198 [patent_app_country] => US [patent_app_date] => 2011-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9267 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0304/20110304856.pdf [firstpage_image] =>[orig_patent_app_number] => 13149198 [rel_patent_id] =>[rel_patent_doc_number] =>)

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Array ( [id] => 7482173 [patent_doc_number] => 20110249270 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-13 [patent_title] => 'HETERODYNE INTERFEROMETRY DISPLACEMENT MEASUREMENT APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/079390 [patent_app_country] => US [patent_app_date] => 2011-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8446 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0249/20110249270.pdf [firstpage_image] =>[orig_patent_app_number] => 13079390 [rel_patent_id] =>[rel_patent_doc_number] =>)

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