Search

Yasir A. Diab

Examiner (ID: 12811, Phone: (571)270-0486 , Office: P/3722 )

Most Active Art Unit
3722
Art Unit(s)
3722
Total Applications
279
Issued Applications
216
Pending Applications
0
Abandoned Applications
64

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4255215 [patent_doc_number] => 06137283 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-24 [patent_title] => 'Process and machine for signal waveform analysis' [patent_app_type] => 1 [patent_app_number] => 9/435707 [patent_app_country] => US [patent_app_date] => 1999-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 31 [patent_no_of_words] => 9982 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 17 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/137/06137283.pdf [firstpage_image] =>[orig_patent_app_number] => 435707 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/435707
Process and machine for signal waveform analysis Nov 7, 1999 Issued
Array ( [id] => 4139302 [patent_doc_number] => 06147500 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-14 [patent_title] => 'EDM with jump motion detecting reactive force' [patent_app_type] => 1 [patent_app_number] => 9/396456 [patent_app_country] => US [patent_app_date] => 1999-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 5702 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/147/06147500.pdf [firstpage_image] =>[orig_patent_app_number] => 396456 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/396456
EDM with jump motion detecting reactive force Sep 14, 1999 Issued
Array ( [id] => 4366254 [patent_doc_number] => 06191570 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment' [patent_app_type] => 1 [patent_app_number] => 9/361368 [patent_app_country] => US [patent_app_date] => 1999-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6904 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 361 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191570.pdf [firstpage_image] =>[orig_patent_app_number] => 361368 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/361368
System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment Jul 25, 1999 Issued
Array ( [id] => 4266936 [patent_doc_number] => 06204678 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-20 [patent_title] => 'Direct connect interconnect for testing semiconductor dice and wafers' [patent_app_type] => 1 [patent_app_number] => 9/302833 [patent_app_country] => US [patent_app_date] => 1999-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 19 [patent_no_of_words] => 5794 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/204/06204678.pdf [firstpage_image] =>[orig_patent_app_number] => 302833 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/302833
Direct connect interconnect for testing semiconductor dice and wafers Apr 29, 1999 Issued
Array ( [id] => 4413091 [patent_doc_number] => 06172507 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-09 [patent_title] => 'Circuit configuration for measuring resistance and leakage' [patent_app_type] => 1 [patent_app_number] => 9/272962 [patent_app_country] => US [patent_app_date] => 1999-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2797 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/172/06172507.pdf [firstpage_image] =>[orig_patent_app_number] => 272962 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/272962
Circuit configuration for measuring resistance and leakage Mar 18, 1999 Issued
Array ( [id] => 4413074 [patent_doc_number] => 06172505 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-09 [patent_title] => 'Electronic battery tester' [patent_app_type] => 1 [patent_app_number] => 9/264743 [patent_app_country] => US [patent_app_date] => 1999-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4610 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/172/06172505.pdf [firstpage_image] =>[orig_patent_app_number] => 264743 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/264743
Electronic battery tester Mar 8, 1999 Issued
Array ( [id] => 4196958 [patent_doc_number] => 06154041 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-28 [patent_title] => 'Method and apparatus for measuring thickness of semiconductor substrates' [patent_app_type] => 1 [patent_app_number] => 9/258066 [patent_app_country] => US [patent_app_date] => 1999-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 11127 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/154/06154041.pdf [firstpage_image] =>[orig_patent_app_number] => 258066 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/258066
Method and apparatus for measuring thickness of semiconductor substrates Feb 25, 1999 Issued
Array ( [id] => 4211469 [patent_doc_number] => 06078181 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-06-20 [patent_title] => 'Method for the measurement of forest duff moisture content' [patent_app_type] => 1 [patent_app_number] => 9/246272 [patent_app_country] => US [patent_app_date] => 1999-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 4331 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/078/06078181.pdf [firstpage_image] =>[orig_patent_app_number] => 246272 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/246272
Method for the measurement of forest duff moisture content Feb 7, 1999 Issued
Array ( [id] => 4192140 [patent_doc_number] => 06160406 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-12 [patent_title] => 'Condom testing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/226753 [patent_app_country] => US [patent_app_date] => 1999-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3962 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/160/06160406.pdf [firstpage_image] =>[orig_patent_app_number] => 226753 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/226753
Condom testing apparatus Jan 5, 1999 Issued
Array ( [id] => 4092276 [patent_doc_number] => 06025726 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-02-15 [patent_title] => 'Method and apparatus for determining three-dimensional position, orientation and mass distribution' [patent_app_type] => 1 [patent_app_number] => 9/200609 [patent_app_country] => US [patent_app_date] => 1998-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 12356 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/025/06025726.pdf [firstpage_image] =>[orig_patent_app_number] => 200609 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/200609
Method and apparatus for determining three-dimensional position, orientation and mass distribution Nov 29, 1998 Issued
Array ( [id] => 4364819 [patent_doc_number] => 06169394 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Electrical detector for micro-analysis systems' [patent_app_type] => 1 [patent_app_number] => 9/154668 [patent_app_country] => US [patent_app_date] => 1998-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 26 [patent_no_of_words] => 10703 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169394.pdf [firstpage_image] =>[orig_patent_app_number] => 154668 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/154668
Electrical detector for micro-analysis systems Sep 17, 1998 Issued
09/146363 DEVICE FOR DETERMINING THE MOISTURE CONTENT OF A SMALL VOLUME OF MATERIAL IN REAL-TIME Sep 2, 1998 Abandoned
09/143966 METHOD AND DEVICE FOR HIGHLY ACCURATE, HIGH SPEED, REAL TIME, CONTINUOUS OR STATIONARY, IN-LINE, NON-INVASIVE, THREE DIMENSIONAL, MULTI-SLICE DENSITY DEVIATION AND DENSITY MEASUREMENTS AND CALCULATIONS OF HOMOGENEOUS OR NON-HOMOGENEOUS FIBROUS YARN, SLIVERS, Aug 30, 1998 Abandoned
Array ( [id] => 4110501 [patent_doc_number] => 06100703 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-08 [patent_title] => 'Polarization-sensitive near-field microwave microscope' [patent_app_type] => 1 [patent_app_number] => 9/111453 [patent_app_country] => US [patent_app_date] => 1998-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 5035 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/100/06100703.pdf [firstpage_image] =>[orig_patent_app_number] => 111453 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/111453
Polarization-sensitive near-field microwave microscope Jul 7, 1998 Issued
Array ( [id] => 4178622 [patent_doc_number] => 06140821 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Method and system for the recognition of insulation defects' [patent_app_type] => 1 [patent_app_number] => 9/105140 [patent_app_country] => US [patent_app_date] => 1998-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5383 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/140/06140821.pdf [firstpage_image] =>[orig_patent_app_number] => 105140 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/105140
Method and system for the recognition of insulation defects Jun 25, 1998 Issued
Array ( [id] => 4425244 [patent_doc_number] => 06225812 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-01 [patent_title] => 'Method and apparatus for measuring the density of a substance having free water compensation' [patent_app_type] => 1 [patent_app_number] => 9/104661 [patent_app_country] => US [patent_app_date] => 1998-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 3369 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/225/06225812.pdf [firstpage_image] =>[orig_patent_app_number] => 104661 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/104661
Method and apparatus for measuring the density of a substance having free water compensation Jun 24, 1998 Issued
08/973977 CAPACITANCE MEASUREMENT Jun 23, 1998 Abandoned
Array ( [id] => 4362830 [patent_doc_number] => 06201400 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-13 [patent_title] => 'Bulls-eye mid-frequency impedance probe' [patent_app_type] => 1 [patent_app_number] => 9/103369 [patent_app_country] => US [patent_app_date] => 1998-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 2896 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/201/06201400.pdf [firstpage_image] =>[orig_patent_app_number] => 103369 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/103369
Bulls-eye mid-frequency impedance probe Jun 22, 1998 Issued
09/029171 DEVICE FOR DETECTION OF PROHIBITED OPERATION OF A MEASUREMENT EQUIPMENT Jun 16, 1998 Abandoned
Array ( [id] => 4178692 [patent_doc_number] => 06140825 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-31 [patent_title] => 'Method and apparatus for evaluating quality of resistance welds' [patent_app_type] => 1 [patent_app_number] => 9/075953 [patent_app_country] => US [patent_app_date] => 1998-05-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2753 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/140/06140825.pdf [firstpage_image] =>[orig_patent_app_number] => 075953 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/075953
Method and apparatus for evaluating quality of resistance welds May 11, 1998 Issued
Menu