Search

Zandra V. Smith

Supervisory Patent Examiner (ID: 17804, Phone: (571)272-2429 , Office: P/2816 )

Most Active Art Unit
2877
Art Unit(s)
2816, 2877, 2505, 2822, 2899
Total Applications
656
Issued Applications
506
Pending Applications
109
Abandoned Applications
41

Applications

Application numberTitle of the applicationFiling DateStatus
09/600183 Charged particle energy analysers Oct 15, 2000 Abandoned
Array ( [id] => 1107732 [patent_doc_number] => 06813032 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-02 [patent_title] => 'Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques' [patent_app_type] => B1 [patent_app_number] => 09/680226 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 41 [patent_no_of_words] => 21733 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/813/06813032.pdf [firstpage_image] =>[orig_patent_app_number] => 09680226 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/680226
Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques Oct 5, 2000 Issued
Array ( [id] => 1234028 [patent_doc_number] => 06693708 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-02-17 [patent_title] => 'Method and apparatus for substrate surface inspection using spectral profiling techniques' [patent_app_type] => B1 [patent_app_number] => 09/684714 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 42 [patent_no_of_words] => 21723 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/693/06693708.pdf [firstpage_image] =>[orig_patent_app_number] => 09684714 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684714
Method and apparatus for substrate surface inspection using spectral profiling techniques Oct 5, 2000 Issued
Array ( [id] => 1295086 [patent_doc_number] => 06630995 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-07 [patent_title] => 'Method and apparatus for embedded substrate and system status monitoring' [patent_app_type] => B1 [patent_app_number] => 09/684880 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 42 [patent_no_of_words] => 21739 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/630/06630995.pdf [firstpage_image] =>[orig_patent_app_number] => 09684880 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684880
Method and apparatus for embedded substrate and system status monitoring Oct 5, 2000 Issued
Array ( [id] => 1029236 [patent_doc_number] => 06882416 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-19 [patent_title] => 'Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis' [patent_app_type] => utility [patent_app_number] => 09/684856 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 42 [patent_no_of_words] => 21748 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/882/06882416.pdf [firstpage_image] =>[orig_patent_app_number] => 09684856 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684856
Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis Oct 5, 2000 Issued
Array ( [id] => 1219368 [patent_doc_number] => 06707545 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-03-16 [patent_title] => 'Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems' [patent_app_type] => B1 [patent_app_number] => 09/684733 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 42 [patent_no_of_words] => 21741 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/707/06707545.pdf [firstpage_image] =>[orig_patent_app_number] => 09684733 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684733
Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems Oct 5, 2000 Issued
Array ( [id] => 1204290 [patent_doc_number] => 06721045 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-04-13 [patent_title] => 'Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques' [patent_app_type] => B1 [patent_app_number] => 09/684263 [patent_app_country] => US [patent_app_date] => 2000-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 42 [patent_no_of_words] => 21733 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/721/06721045.pdf [firstpage_image] =>[orig_patent_app_number] => 09684263 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/684263
Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques Oct 5, 2000 Issued
Array ( [id] => 1179115 [patent_doc_number] => 06750958 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-06-15 [patent_title] => 'Automated optical measurement apparatus and method' [patent_app_type] => B1 [patent_app_number] => 09/677679 [patent_app_country] => US [patent_app_date] => 2000-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 27 [patent_no_of_words] => 12807 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/750/06750958.pdf [firstpage_image] =>[orig_patent_app_number] => 09677679 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/677679
Automated optical measurement apparatus and method Oct 1, 2000 Issued
Array ( [id] => 4315419 [patent_doc_number] => 06327031 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-04 [patent_title] => 'Apparatus and semi-reflective optical system for carrying out analysis of samples' [patent_app_type] => 1 [patent_app_number] => 9/665930 [patent_app_country] => US [patent_app_date] => 2000-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5727 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/327/06327031.pdf [firstpage_image] =>[orig_patent_app_number] => 665930 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/665930
Apparatus and semi-reflective optical system for carrying out analysis of samples Sep 19, 2000 Issued
Array ( [id] => 1048197 [patent_doc_number] => 06864978 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-08 [patent_title] => 'Method of characterizing spectrometer instruments and providing calibration models to compensate for instrument variation' [patent_app_type] => utility [patent_app_number] => 09/664973 [patent_app_country] => US [patent_app_date] => 2000-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4025 [patent_no_of_claims] => 55 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/864/06864978.pdf [firstpage_image] =>[orig_patent_app_number] => 09664973 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/664973
Method of characterizing spectrometer instruments and providing calibration models to compensate for instrument variation Sep 17, 2000 Issued
Array ( [id] => 1163234 [patent_doc_number] => 06762840 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-07-13 [patent_title] => 'Image information reading apparatus designed to maintain light amount to be detected at uniform level' [patent_app_type] => B1 [patent_app_number] => 09/654169 [patent_app_country] => US [patent_app_date] => 2000-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6957 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 214 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/762/06762840.pdf [firstpage_image] =>[orig_patent_app_number] => 09654169 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/654169
Image information reading apparatus designed to maintain light amount to be detected at uniform level Aug 31, 2000 Issued
Array ( [id] => 1104055 [patent_doc_number] => 06816262 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-09 [patent_title] => 'Colorimeter having field programmable gate array' [patent_app_type] => B1 [patent_app_number] => 09/650182 [patent_app_country] => US [patent_app_date] => 2000-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 6584 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/816/06816262.pdf [firstpage_image] =>[orig_patent_app_number] => 09650182 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/650182
Colorimeter having field programmable gate array Aug 28, 2000 Issued
Array ( [id] => 1472892 [patent_doc_number] => 06407814 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-18 [patent_title] => 'Method for correcting alignment, method for manufacturing a semiconductor device and a semiconductor device' [patent_app_type] => B1 [patent_app_number] => 09/648751 [patent_app_country] => US [patent_app_date] => 2000-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 31 [patent_no_of_words] => 8548 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 348 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/407/06407814.pdf [firstpage_image] =>[orig_patent_app_number] => 09648751 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/648751
Method for correcting alignment, method for manufacturing a semiconductor device and a semiconductor device Aug 27, 2000 Issued
Array ( [id] => 1567289 [patent_doc_number] => 06339473 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-01-15 [patent_title] => 'Apparatus and method for carrying out analysis of samples' [patent_app_type] => B1 [patent_app_number] => 09/643030 [patent_app_country] => US [patent_app_date] => 2000-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5610 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/339/06339473.pdf [firstpage_image] =>[orig_patent_app_number] => 09643030 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/643030
Apparatus and method for carrying out analysis of samples Aug 20, 2000 Issued
Array ( [id] => 1114511 [patent_doc_number] => 06803999 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-12 [patent_title] => 'Analytical disc with optically trackable encoded information and related optical inspection system' [patent_app_type] => B1 [patent_app_number] => 09/642996 [patent_app_country] => US [patent_app_date] => 2000-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 5610 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/803/06803999.pdf [firstpage_image] =>[orig_patent_app_number] => 09642996 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/642996
Analytical disc with optically trackable encoded information and related optical inspection system Aug 20, 2000 Issued
Array ( [id] => 1492945 [patent_doc_number] => 06417923 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-09 [patent_title] => 'Vapochromic photodiode' [patent_app_type] => B1 [patent_app_number] => 09/638281 [patent_app_country] => US [patent_app_date] => 2000-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 2699 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/417/06417923.pdf [firstpage_image] =>[orig_patent_app_number] => 09638281 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/638281
Vapochromic photodiode Aug 13, 2000 Issued
Array ( [id] => 1569934 [patent_doc_number] => 06377348 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-23 [patent_title] => 'Smoke chamber for evaluating foundry sand shapes and its method of use' [patent_app_type] => B1 [patent_app_number] => 09/633395 [patent_app_country] => US [patent_app_date] => 2000-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 1781 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/377/06377348.pdf [firstpage_image] =>[orig_patent_app_number] => 09633395 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/633395
Smoke chamber for evaluating foundry sand shapes and its method of use Aug 6, 2000 Issued
Array ( [id] => 1122374 [patent_doc_number] => 06798516 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-28 [patent_title] => 'Projection exposure apparatus having compact substrate stage' [patent_app_type] => B1 [patent_app_number] => 09/634328 [patent_app_country] => US [patent_app_date] => 2000-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 17100 [patent_no_of_claims] => 143 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 33 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/798/06798516.pdf [firstpage_image] =>[orig_patent_app_number] => 09634328 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/634328
Projection exposure apparatus having compact substrate stage Aug 6, 2000 Issued
Array ( [id] => 1546063 [patent_doc_number] => 06373568 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-16 [patent_title] => 'Spectral imaging system' [patent_app_type] => B1 [patent_app_number] => 09/633417 [patent_app_country] => US [patent_app_date] => 2000-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8796 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/373/06373568.pdf [firstpage_image] =>[orig_patent_app_number] => 09633417 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/633417
Spectral imaging system Aug 6, 2000 Issued
Array ( [id] => 4339854 [patent_doc_number] => 06320657 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-20 [patent_title] => 'Broadband spectroscopic rotating compensator ellipsometer' [patent_app_type] => 1 [patent_app_number] => 9/619456 [patent_app_country] => US [patent_app_date] => 2000-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 7340 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/320/06320657.pdf [firstpage_image] =>[orig_patent_app_number] => 619456 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/619456
Broadband spectroscopic rotating compensator ellipsometer Jul 18, 2000 Issued
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