| Application number | Title of the application | Filing Date | Status |
|---|
| 09/600183 | Charged particle energy analysers | Oct 15, 2000 | Abandoned |
Array
(
[id] => 1107732
[patent_doc_number] => 06813032
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-02
[patent_title] => 'Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques'
[patent_app_type] => B1
[patent_app_number] => 09/680226
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 41
[patent_no_of_words] => 21733
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/813/06813032.pdf
[firstpage_image] =>[orig_patent_app_number] => 09680226
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/680226 | Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques | Oct 5, 2000 | Issued |
Array
(
[id] => 1234028
[patent_doc_number] => 06693708
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-02-17
[patent_title] => 'Method and apparatus for substrate surface inspection using spectral profiling techniques'
[patent_app_type] => B1
[patent_app_number] => 09/684714
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 42
[patent_no_of_words] => 21723
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 14
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/693/06693708.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684714
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684714 | Method and apparatus for substrate surface inspection using spectral profiling techniques | Oct 5, 2000 | Issued |
Array
(
[id] => 1295086
[patent_doc_number] => 06630995
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-10-07
[patent_title] => 'Method and apparatus for embedded substrate and system status monitoring'
[patent_app_type] => B1
[patent_app_number] => 09/684880
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 42
[patent_no_of_words] => 21739
[patent_no_of_claims] => 41
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/630/06630995.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684880
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684880 | Method and apparatus for embedded substrate and system status monitoring | Oct 5, 2000 | Issued |
Array
(
[id] => 1029236
[patent_doc_number] => 06882416
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-04-19
[patent_title] => 'Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis'
[patent_app_type] => utility
[patent_app_number] => 09/684856
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 42
[patent_no_of_words] => 21748
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/882/06882416.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684856
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684856 | Methods for continuous embedded process monitoring and optical inspection of substrates using specular signature analysis | Oct 5, 2000 | Issued |
Array
(
[id] => 1219368
[patent_doc_number] => 06707545
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-03-16
[patent_title] => 'Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems'
[patent_app_type] => B1
[patent_app_number] => 09/684733
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 42
[patent_no_of_words] => 21741
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 72
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/707/06707545.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684733
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684733 | Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems | Oct 5, 2000 | Issued |
Array
(
[id] => 1204290
[patent_doc_number] => 06721045
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-04-13
[patent_title] => 'Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques'
[patent_app_type] => B1
[patent_app_number] => 09/684263
[patent_app_country] => US
[patent_app_date] => 2000-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 41
[patent_figures_cnt] => 42
[patent_no_of_words] => 21733
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/721/06721045.pdf
[firstpage_image] =>[orig_patent_app_number] => 09684263
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/684263 | Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques | Oct 5, 2000 | Issued |
Array
(
[id] => 1179115
[patent_doc_number] => 06750958
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-06-15
[patent_title] => 'Automated optical measurement apparatus and method'
[patent_app_type] => B1
[patent_app_number] => 09/677679
[patent_app_country] => US
[patent_app_date] => 2000-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 27
[patent_no_of_words] => 12807
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 183
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/750/06750958.pdf
[firstpage_image] =>[orig_patent_app_number] => 09677679
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/677679 | Automated optical measurement apparatus and method | Oct 1, 2000 | Issued |
Array
(
[id] => 4315419
[patent_doc_number] => 06327031
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-12-04
[patent_title] => 'Apparatus and semi-reflective optical system for carrying out analysis of samples'
[patent_app_type] => 1
[patent_app_number] => 9/665930
[patent_app_country] => US
[patent_app_date] => 2000-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5727
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 31
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/327/06327031.pdf
[firstpage_image] =>[orig_patent_app_number] => 665930
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/665930 | Apparatus and semi-reflective optical system for carrying out analysis of samples | Sep 19, 2000 | Issued |
Array
(
[id] => 1048197
[patent_doc_number] => 06864978
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-03-08
[patent_title] => 'Method of characterizing spectrometer instruments and providing calibration models to compensate for instrument variation'
[patent_app_type] => utility
[patent_app_number] => 09/664973
[patent_app_country] => US
[patent_app_date] => 2000-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 4025
[patent_no_of_claims] => 55
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/864/06864978.pdf
[firstpage_image] =>[orig_patent_app_number] => 09664973
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/664973 | Method of characterizing spectrometer instruments and providing calibration models to compensate for instrument variation | Sep 17, 2000 | Issued |
Array
(
[id] => 1163234
[patent_doc_number] => 06762840
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-07-13
[patent_title] => 'Image information reading apparatus designed to maintain light amount to be detected at uniform level'
[patent_app_type] => B1
[patent_app_number] => 09/654169
[patent_app_country] => US
[patent_app_date] => 2000-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 6957
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 214
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/762/06762840.pdf
[firstpage_image] =>[orig_patent_app_number] => 09654169
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/654169 | Image information reading apparatus designed to maintain light amount to be detected at uniform level | Aug 31, 2000 | Issued |
Array
(
[id] => 1104055
[patent_doc_number] => 06816262
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-09
[patent_title] => 'Colorimeter having field programmable gate array'
[patent_app_type] => B1
[patent_app_number] => 09/650182
[patent_app_country] => US
[patent_app_date] => 2000-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 6584
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/816/06816262.pdf
[firstpage_image] =>[orig_patent_app_number] => 09650182
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/650182 | Colorimeter having field programmable gate array | Aug 28, 2000 | Issued |
Array
(
[id] => 1472892
[patent_doc_number] => 06407814
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-06-18
[patent_title] => 'Method for correcting alignment, method for manufacturing a semiconductor device and a semiconductor device'
[patent_app_type] => B1
[patent_app_number] => 09/648751
[patent_app_country] => US
[patent_app_date] => 2000-08-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 31
[patent_no_of_words] => 8548
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 348
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/407/06407814.pdf
[firstpage_image] =>[orig_patent_app_number] => 09648751
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/648751 | Method for correcting alignment, method for manufacturing a semiconductor device and a semiconductor device | Aug 27, 2000 | Issued |
Array
(
[id] => 1567289
[patent_doc_number] => 06339473
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-01-15
[patent_title] => 'Apparatus and method for carrying out analysis of samples'
[patent_app_type] => B1
[patent_app_number] => 09/643030
[patent_app_country] => US
[patent_app_date] => 2000-08-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 5610
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 30
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/339/06339473.pdf
[firstpage_image] =>[orig_patent_app_number] => 09643030
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/643030 | Apparatus and method for carrying out analysis of samples | Aug 20, 2000 | Issued |
Array
(
[id] => 1114511
[patent_doc_number] => 06803999
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-10-12
[patent_title] => 'Analytical disc with optically trackable encoded information and related optical inspection system'
[patent_app_type] => B1
[patent_app_number] => 09/642996
[patent_app_country] => US
[patent_app_date] => 2000-08-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 5610
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 24
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/803/06803999.pdf
[firstpage_image] =>[orig_patent_app_number] => 09642996
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/642996 | Analytical disc with optically trackable encoded information and related optical inspection system | Aug 20, 2000 | Issued |
Array
(
[id] => 1492945
[patent_doc_number] => 06417923
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-09
[patent_title] => 'Vapochromic photodiode'
[patent_app_type] => B1
[patent_app_number] => 09/638281
[patent_app_country] => US
[patent_app_date] => 2000-08-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 9
[patent_no_of_words] => 2699
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/417/06417923.pdf
[firstpage_image] =>[orig_patent_app_number] => 09638281
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/638281 | Vapochromic photodiode | Aug 13, 2000 | Issued |
Array
(
[id] => 1569934
[patent_doc_number] => 06377348
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-23
[patent_title] => 'Smoke chamber for evaluating foundry sand shapes and its method of use'
[patent_app_type] => B1
[patent_app_number] => 09/633395
[patent_app_country] => US
[patent_app_date] => 2000-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 1781
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 134
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/377/06377348.pdf
[firstpage_image] =>[orig_patent_app_number] => 09633395
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/633395 | Smoke chamber for evaluating foundry sand shapes and its method of use | Aug 6, 2000 | Issued |
Array
(
[id] => 1122374
[patent_doc_number] => 06798516
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-09-28
[patent_title] => 'Projection exposure apparatus having compact substrate stage'
[patent_app_type] => B1
[patent_app_number] => 09/634328
[patent_app_country] => US
[patent_app_date] => 2000-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 17100
[patent_no_of_claims] => 143
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 33
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/798/06798516.pdf
[firstpage_image] =>[orig_patent_app_number] => 09634328
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/634328 | Projection exposure apparatus having compact substrate stage | Aug 6, 2000 | Issued |
Array
(
[id] => 1546063
[patent_doc_number] => 06373568
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-16
[patent_title] => 'Spectral imaging system'
[patent_app_type] => B1
[patent_app_number] => 09/633417
[patent_app_country] => US
[patent_app_date] => 2000-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 8796
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/373/06373568.pdf
[firstpage_image] =>[orig_patent_app_number] => 09633417
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/633417 | Spectral imaging system | Aug 6, 2000 | Issued |
Array
(
[id] => 4339854
[patent_doc_number] => 06320657
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-20
[patent_title] => 'Broadband spectroscopic rotating compensator ellipsometer'
[patent_app_type] => 1
[patent_app_number] => 9/619456
[patent_app_country] => US
[patent_app_date] => 2000-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 7340
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/320/06320657.pdf
[firstpage_image] =>[orig_patent_app_number] => 619456
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/619456 | Broadband spectroscopic rotating compensator ellipsometer | Jul 18, 2000 | Issued |