| Application number | Title of the application | Filing Date | Status |
|---|
Array
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[patent_doc_number] => 06747734
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[patent_title] => 'Apparatus and method for processing a microelectronic workpiece using metrology'
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[patent_app_number] => 09/612176
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| 09/608347 | Photometric device | Jun 28, 2000 | Abandoned |
Array
(
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[patent_doc_number] => 06462818
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[patent_kind] => B1
[patent_issue_date] => 2002-10-08
[patent_title] => 'Overlay alignment mark design'
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[firstpage_image] =>[orig_patent_app_number] => 09603120
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/603120 | Overlay alignment mark design | Jun 21, 2000 | Issued |
| 09/591005 | Device and method for testing tissue | Jun 8, 2000 | Abandoned |
Array
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[patent_doc_number] => 06421125
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-07-16
[patent_title] => 'Device and method for determining compatible colors'
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Array
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[patent_kind] => B1
[patent_issue_date] => 2004-10-12
[patent_title] => 'Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry'
[patent_app_type] => B1
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Array
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[patent_issue_date] => 2002-11-05
[patent_title] => 'Optical member inspecting apparatus and method of inspection thereof'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/580479 | Optical member inspecting apparatus and method of inspection thereof | May 25, 2000 | Issued |
| 09/554899 | Spectrophotometer system | May 18, 2000 | Abandoned |
Array
(
[id] => 7630622
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[patent_issue_date] => 2003-10-21
[patent_title] => 'Apparatus and methods for improving fluorescence detectors'
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Array
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[patent_issue_date] => 2001-10-02
[patent_title] => 'Apparatus for analyzing multi-layer thin film stacks on semiconductors'
[patent_app_type] => 1
[patent_app_number] => 9/563152
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/563152 | Apparatus for analyzing multi-layer thin film stacks on semiconductors | May 1, 2000 | Issued |
| 09/564390 | Verification device for optical clinical assay systems | Apr 30, 2000 | Abandoned |
Array
(
[id] => 1317921
[patent_doc_number] => 06614536
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-02
[patent_title] => 'Arrangement and method for simultaneous measurement of the speed as well as the surface shape of moving objects'
[patent_app_type] => B1
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Array
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[id] => 1317888
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[patent_issue_date] => 2003-09-02
[patent_title] => 'Apparatus and method for light profile microscopy'
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Array
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[patent_kind] => B1
[patent_issue_date] => 2004-08-31
[patent_title] => 'Sheet-material foreign-matter detecting method and apparatus'
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Array
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[patent_title] => 'Multiple beam scanner for an inspection system'
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Array
(
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[patent_title] => 'Wavelength monitor for WDM systems'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/551256 | Wavelength monitor for WDM systems | Apr 17, 2000 | Issued |
| 09/485670 | DETECTOR | Apr 16, 2000 | Abandoned |
Array
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Array
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