Search

Zandra V. Smith

Supervisory Patent Examiner (ID: 14247, Phone: (571)272-2429 , Office: P/2816 )

Most Active Art Unit
2877
Art Unit(s)
2816, 2899, 2505, 2822, 2877
Total Applications
656
Issued Applications
507
Pending Applications
108
Abandoned Applications
41

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1181037 [patent_doc_number] => 06747734 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-06-08 [patent_title] => 'Apparatus and method for processing a microelectronic workpiece using metrology' [patent_app_type] => B1 [patent_app_number] => 09/612176 [patent_app_country] => US [patent_app_date] => 2000-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 8464 [patent_no_of_claims] => 48 [patent_no_of_ind_claims] => 14 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/747/06747734.pdf [firstpage_image] =>[orig_patent_app_number] => 09612176 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/612176
Apparatus and method for processing a microelectronic workpiece using metrology Jul 7, 2000 Issued
09/608347 Photometric device Jun 28, 2000 Abandoned
Array ( [id] => 1457137 [patent_doc_number] => 06462818 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-08 [patent_title] => 'Overlay alignment mark design' [patent_app_type] => B1 [patent_app_number] => 09/603120 [patent_app_country] => US [patent_app_date] => 2000-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5702 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/462/06462818.pdf [firstpage_image] =>[orig_patent_app_number] => 09603120 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/603120
Overlay alignment mark design Jun 21, 2000 Issued
09/591005 Device and method for testing tissue Jun 8, 2000 Abandoned
Array ( [id] => 1517216 [patent_doc_number] => 06421125 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-16 [patent_title] => 'Device and method for determining compatible colors' [patent_app_type] => B1 [patent_app_number] => 09/589524 [patent_app_country] => US [patent_app_date] => 2000-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 3358 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/421/06421125.pdf [firstpage_image] =>[orig_patent_app_number] => 09589524 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/589524
Device and method for determining compatible colors Jun 6, 2000 Issued
Array ( [id] => 1114525 [patent_doc_number] => 06804004 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-12 [patent_title] => 'Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry' [patent_app_type] => B1 [patent_app_number] => 09/583229 [patent_app_country] => US [patent_app_date] => 2000-05-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 41 [patent_no_of_words] => 18456 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/804/06804004.pdf [firstpage_image] =>[orig_patent_app_number] => 09583229 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/583229
Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry May 29, 2000 Issued
Array ( [id] => 7646610 [patent_doc_number] => 06476909 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-05 [patent_title] => 'Optical member inspecting apparatus and method of inspection thereof' [patent_app_type] => B1 [patent_app_number] => 09/580479 [patent_app_country] => US [patent_app_date] => 2000-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 75 [patent_figures_cnt] => 110 [patent_no_of_words] => 40583 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 7 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/476/06476909.pdf [firstpage_image] =>[orig_patent_app_number] => 09580479 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/580479
Optical member inspecting apparatus and method of inspection thereof May 25, 2000 Issued
09/554899 Spectrophotometer system May 18, 2000 Abandoned
Array ( [id] => 7630622 [patent_doc_number] => 06636314 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-21 [patent_title] => 'Apparatus and methods for improving fluorescence detectors' [patent_app_type] => B1 [patent_app_number] => 09/567339 [patent_app_country] => US [patent_app_date] => 2000-05-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 51 [patent_no_of_words] => 8707 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 4 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/636/06636314.pdf [firstpage_image] =>[orig_patent_app_number] => 09567339 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/567339
Apparatus and methods for improving fluorescence detectors May 8, 2000 Issued
Array ( [id] => 4405809 [patent_doc_number] => 06297880 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-02 [patent_title] => 'Apparatus for analyzing multi-layer thin film stacks on semiconductors' [patent_app_type] => 1 [patent_app_number] => 9/563152 [patent_app_country] => US [patent_app_date] => 2000-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 7867 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/297/06297880.pdf [firstpage_image] =>[orig_patent_app_number] => 563152 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/563152
Apparatus for analyzing multi-layer thin film stacks on semiconductors May 1, 2000 Issued
09/564390 Verification device for optical clinical assay systems Apr 30, 2000 Abandoned
Array ( [id] => 1317921 [patent_doc_number] => 06614536 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-02 [patent_title] => 'Arrangement and method for simultaneous measurement of the speed as well as the surface shape of moving objects' [patent_app_type] => B1 [patent_app_number] => 09/562373 [patent_app_country] => US [patent_app_date] => 2000-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 3714 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/614/06614536.pdf [firstpage_image] =>[orig_patent_app_number] => 09562373 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/562373
Arrangement and method for simultaneous measurement of the speed as well as the surface shape of moving objects Apr 30, 2000 Issued
Array ( [id] => 1317888 [patent_doc_number] => 06614532 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-02 [patent_title] => 'Apparatus and method for light profile microscopy' [patent_app_type] => B1 [patent_app_number] => 09/560893 [patent_app_country] => US [patent_app_date] => 2000-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7909 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/614/06614532.pdf [firstpage_image] =>[orig_patent_app_number] => 09560893 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/560893
Apparatus and method for light profile microscopy Apr 27, 2000 Issued
Array ( [id] => 1139130 [patent_doc_number] => 06784998 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-31 [patent_title] => 'Sheet-material foreign-matter detecting method and apparatus' [patent_app_type] => B1 [patent_app_number] => 09/556392 [patent_app_country] => US [patent_app_date] => 2000-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2067 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/784/06784998.pdf [firstpage_image] =>[orig_patent_app_number] => 09556392 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/556392
Sheet-material foreign-matter detecting method and apparatus Apr 23, 2000 Issued
Array ( [id] => 1255553 [patent_doc_number] => 06671042 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-12-30 [patent_title] => 'Multiple beam scanner for an inspection system' [patent_app_type] => B1 [patent_app_number] => 09/551544 [patent_app_country] => US [patent_app_date] => 2000-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3255 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/671/06671042.pdf [firstpage_image] =>[orig_patent_app_number] => 09551544 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/551544
Multiple beam scanner for an inspection system Apr 17, 2000 Issued
Array ( [id] => 1219379 [patent_doc_number] => 06707550 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-03-16 [patent_title] => 'Wavelength monitor for WDM systems' [patent_app_type] => B1 [patent_app_number] => 09/551256 [patent_app_country] => US [patent_app_date] => 2000-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 4290 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/707/06707550.pdf [firstpage_image] =>[orig_patent_app_number] => 09551256 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/551256
Wavelength monitor for WDM systems Apr 17, 2000 Issued
09/485670 DETECTOR Apr 16, 2000 Abandoned
Array ( [id] => 1290993 [patent_doc_number] => 06639673 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-28 [patent_title] => 'Surface coating measurement instrument and apparatus for determination of coating thickness' [patent_app_type] => B1 [patent_app_number] => 09/550232 [patent_app_country] => US [patent_app_date] => 2000-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 3007 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/639/06639673.pdf [firstpage_image] =>[orig_patent_app_number] => 09550232 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/550232
Surface coating measurement instrument and apparatus for determination of coating thickness Apr 13, 2000 Issued
Array ( [id] => 1331136 [patent_doc_number] => 06603563 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-08-05 [patent_title] => 'Apparatus for determining measurements of an object utilizing negative imaging' [patent_app_type] => B1 [patent_app_number] => 09/543138 [patent_app_country] => US [patent_app_date] => 2000-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4199 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/603/06603563.pdf [firstpage_image] =>[orig_patent_app_number] => 09543138 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/543138
Apparatus for determining measurements of an object utilizing negative imaging Apr 4, 2000 Issued
Array ( [id] => 1410017 [patent_doc_number] => 06532076 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-11 [patent_title] => 'Method and apparatus for multidomain data analysis' [patent_app_type] => B1 [patent_app_number] => 09/542724 [patent_app_country] => US [patent_app_date] => 2000-04-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 5026 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/532/06532076.pdf [firstpage_image] =>[orig_patent_app_number] => 09542724 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/542724
Method and apparatus for multidomain data analysis Apr 3, 2000 Issued
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