Case number CBM2015-00060
Fairchild Semiconductor Corporation v. In-Depth Test LLC > Summary
Court Case Number CBM2015-00060
Filing Date Jan 13, 2015
Institution Decision Date Aug 3, 2015
Decision Date Aug 3, 2015
Court Patent Trial and Appeal Board
Status Terminated-Denied
Administrative JudgesLinda M. Gaudette, Barry L. Grossman, Peter P. Chen
Judge Writing the Final DecisionPeter P. Chen
Claims Challenged in the Petition: 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20
Defendant
Plaintiff Attorneys
3Defendant Attorneys
2In-Depth Test LLC
Attorney Name: Daniel Jay Noblitt
Noblitt & Newson, PLLC
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 06792373 | Methods and apparatus for semiconductor testing | Sep 14, 2004 |
