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Case number 1:14-cv-01090

In-Depth Test LLC v. Fairchild Semiconductor Corporation > Summary

Court Case Number 1:14-cv-01090

Filing Date Aug 22, 2014

Court Delaware District Court

Status Unknown

Cause

35:271 Patent Infringement

Related Patents

Doc No Title Issue date
06792373 Methods and apparatus for semiconductor testing Sep 14, 2004
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