In-Depth Test LLC v. Qorvo, Inc. > Summary
Court Case Number 1:18-cv-01462
Filing Date Sep 21, 2018
Termination Date Jan 23, 2019
Court Delaware District Court
Status Dismissed - Voluntarily
JudgesColm F. Connolly
Plaintiff
Defendant
Plaintiff Attorneys
4In-Depth Test LLC
Attorney Name: Brian E. Farnan
Farnan LLP
In-Depth Test LLC
Attorney Name: Jonathan T. Suder
Friedman Suder & Cooke
In-Depth Test LLC
Attorney Name: Corby R. Vowell
Friedman Suder & Cooke
In-Depth Test LLC
Attorney Name: Dave R. Gunter
Friedman Suder & Cooke
Defendant Attorneys
2Counter Defendant
In-Depth Test LLC
Attorney Name: Brian E. Farnan
Farnan LLP
Counter Claimant
3Cause
35:271 Patent Infringement
Related Patents
Doc No | Title | Issue date |
---|---|---|
06792373 | Methods and apparatus for semiconductor testing | Sep 14, 2004 |