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Case number IPR2015-00421

Linear Technology Corporation v. In-Depth Test LLC > Summary

Court Case Number IPR2015-00421

Filing Date Dec 11, 2014

Institution Decision Date Jul 21, 2015

Decision Date Jul 21, 2015

Court Patent Trial and Appeal Board

Status Terminated-Denied

Administrative JudgesBarry L. Grossman, Linda M. Gaudette, Peter P. Chen

Judge Writing the Final DecisionLinda M. Gaudette

Claims Challenged in the Petition: 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20

Related Patents

Doc No Title Issue date
06792373 Methods and apparatus for semiconductor testing Sep 14, 2004
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